IP Library › Granted Patent US 10,763,073
Granted Patent B2
US 10,763,073 · App. 16/256,124 · Granted Sep 1, 2020

Ion source, ion beam irradiation apparatus, and operating method for ion source

Inventor: Tetsuro Yamamoto (Koka, JP)
Assignee: NISSIN ION EQUIPMENT CO., LTD.
H01J37/08H01J37/05
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 10,763,073
App. No.
16/256,124
Granted
Sep 1, 2020
Kind
B2
Abstract

An ion source is provided. The ion source includes a plasma generation container, an electron supply, an electromagnet and a shift means. The plasma generation container generates an ion beam to be extracted therefrom in an ion beam extraction direction. The electron supply supplies electrons into the plasma generation container. The electromagnet generates a magnetic field for capturing the electrons from the electron supply. The shift means shifts a center of the magnetic field in the ion beam extraction direction to change a rate of a desired type of ion to be contained in the ion beam.

Claims (24)

1. An ion source comprising:

a plasma generation container that generates a plasma from which an ion beam is extracted in an ion beam extraction direction;

an electron supply that supplies electrons into the plasma generation container to generate the plasma;

an electromagnet that generates a magnetic field for capturing the electrons from the electron supply; and

shift means for shifting a center of the magnetic field in the ion beam extraction direction to change a rate of a desired type of ion to be contained in the ion beam.

2. The ion source as recited in claim 1 , wherein the shift means displaces a center of the electromagnet in the ion beam extraction direction.

3. The ion source as recited in claim 1 , wherein the shift means comprises a plurality of electromagnets arranged at different positions in the ion beam extraction direction.

4. The ion source as recited in claim 3 , wherein the shift means shifts a center of the magnetic field in the ion beam extraction direction by adjusting a magnetic density of a magnetic field generated by each of the plurality of electromagnets.

5. The ion source as recited in claim 1 , wherein the shift means comprises a detachable magnetic shield that shields the magnetic field of the electromagnet.

6. The ion source as recited in claim 5 , wherein the magnetic shield is disposed on one side or on each of opposite sides of the electromagnet in the ion beam extraction direction.

7. The ion source as recited in claim 5 , wherein a distance between the electromagnet and the detachable magnetic shield is variably set in the ion beam extraction direction.

8. An ion beam irradiation apparatus comprising the ion source as recited in claim 1 .

9. A method of operating an ion source that includes a plasma generation container that generates a plasma from which an ion beam is extracted in an ion beam extraction direction; an electron supply that supplies electrons into the plasma generation container to generate the plasma; and an electromagnet that generates a magnetic field for capturing the electrons from the electron supply, the method comprising:

shifting a center of the magnetic field in the ion beam extraction direction to change a rate of a desired type of ion to be contained in the ion beam.

10. An ion source comprising:

a plasma generation container that generates a plasma from which an ion beam is extracted in an ion beam extraction direction;

an electron supply that supplies electrons into the plasma generation container to generate the plasma;

two electromagnets, disposed at opposite sides of the plasma generation container in a first direction that is orthogonal to an ion beam extraction direction, that generate a magnetic field for capturing the electrons from the electron supply; and

a detachable magnetic shield attached to at least one of the two electromagnets.

11. The ion source as recited in claim 10 , wherein the detachable magnetic shield is attached to the two electromagnets.

12. The ion source as recited in claim 10 , further comprising a spacer provided between the magnetic shield and the at least one of the two electromagnets.

13. The ion source as recited in claim 10 , wherein the detachable magnetic shield is disposed on one side or on each of opposite sides of the at least one of the two electromagnets in the ion beam extraction direction.

14. The ion source as recited in claim 10 , wherein the detachable magnetic shield comprises a plurality of detachable magnetic shields, one detachable magnetic shield attached to each end in the ion extraction direction of the at least one of the two electromagnets.

15. The ion source as recited in claim 10 , wherein a distance between the at least one of the two electromagnets and the detachable magnetic shield is variably set in the ion beam extraction direction.

Assignments (2)
CORRECTIVE ASSIGNMENT TO CORRECT THE TYPO IN ASSIGNEE'S NAME AND TO UPDATE ASSIGNEE'S ADDRESS AS IN THE SUPPLEMENTAL ADS FILED IN THE USPTO ON MARCH 12, 2020 PREVIOUSLY RECORDED ON REEL 048122 FRAME 0795. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT OF ASSIGNORS INTEREST. Recorded Jul 16, 2020
From: YAMAMOTO, TETSURO
To: NISSIN ION EQUIPMENT CO., LTD.
Reel/Frame 053231/0240 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 24, 2019
From: YAMAMOTO, TETSURO
To: NISSIN ION EUQIPMENT CO., LTD.
Reel/Frame 048122/0795 →
Priority Claims (1)
JP 2018-077176 · Apr 12, 2018 · national
Continuity (1)
Related Publication 20190318904A1 · Oct 17, 2019
Cited By (1)
US 12,658,400