IP Library Granted Patent US 10,790,412
Granted Patent B2
US 10,790,412 · App. 16/259,410 · Granted Sep 29, 2020

Light-emitting device and manufacturing method thereof

Inventors: Yen-Tai Chao (Hsinchu, TW); Sen-Jung Hsu (Hsinchu, TW); Tao-Chi Chang (Hsinchu, TW); Wei-Chih Wen (Hsinchu, TW); Ou Chen (Hsinchu, TW); Chun-Hsiang Tu (Hsinchu, TW); Yu-Shou Wang (Hsinchu, TW); Jing-Feng Huang (Hsinchu, TW)
Assignee: EPISTAR CORPORATION
H01L33/22H01L33/005H01L33/007H01L33/0095H01L33/12H01L33/20H01L33/10H01L33/16H01L2933/0091
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Quick Facts
Patent No.
US 10,790,412
App. No.
16/259,410
Granted
Sep 29, 2020
Kind
B2
Abstract

A manufacturing method of a light-emitting device includes steps of: providing a substrate with a top surface, wherein the top surface comprises a plurality of concavo-convex structures; forming a semiconductor stack on the top surface; forming a trench in the semiconductor stack to define a plurality of second semiconductor stacks and expose a first upper surface; forming a scribing region which extends from the first upper surface into the semiconductor stack and exposes a side surface of the semiconductor stack to define a plurality of first semiconductor stacks; removing a portion of the plurality of first semiconductor stacks and a portion of the concavo-convex structures trough the region to form a first side wall of each of the first semiconductor stack; and dividing the substrate along the region; wherein the first side wall and the top surface form an acute angle α between thereof, 30°≤α≤80°.

Claims (35)

1. A manufacturing method of a light-emitting device, comprising:

providing a substrate with a top surface, wherein the top surface comprises a plurality of concavo-convex structures;

forming a semiconductor stack on the top surface;

forming a trench in the semiconductor stack to define a plurality of second semiconductor stacks and expose a first upper surface;

forming a region which extends from the first upper surface into the semiconductor stack and exposes a side surface of the semiconductor stack to define a plurality of first semiconductor stacks;

removing a portion of the plurality of first semiconductor stacks and a portion of the concavo-convex structures trough the region to form a first side wall of each of the first semiconductor stack; and

dividing the substrate along the region;

wherein the first side wall and the top surface form an acute angle α between thereof, 30°≤α≤80°.

2. The manufacturing method according to claim 1 , wherein the region is a scribing region.

3. The manufacturing method according to claim 2 , wherein forming the scribing region comprises laser dicing.

4. The manufacturing method according to claim 1 , further comprising forming a protective layer covering the plurality of second semiconductor stacks and the first upper surface.

5. The manufacturing method according to claim 4 , wherein the protective layer comprises SiO x , SiN x or a combination thereof.

6. The manufacturing method according to claim 1 , wherein the method of forming the trench comprises dry etching.

7. The manufacturing method according to claim 1 , wherein removing the portion of the plurality of first semiconductor stacks and the portion of the concavo-convex structures comprises wet etching.

8. The manufacturing method according to claim 1 , wherein the region exposes the concavo-convex structures.

9. The manufacturing method according to claim 1 , wherein dividing the substrate comprises providing a laser beam focusing in the substrate to form a damage region in the substrate.

10. The manufacturing method according to claim 1 , wherein the second semiconductor stack has a second side wall connecting the first upper surface, and an obtuse angle β is formed between the second side wall and the first upper surface, wherein 100°≤β≤170°.

11. The manufacturing method according to claim 1 , further comprising forming a buffer layer on the substrate by physical vapor deposition process before forming the semiconductor stack on the substrate.

12. The manufacturing method according to claim 11 , wherein the buffer layer comprises AlN.

13. The manufacturing method according to claim 1 , further comprises forming a first electrode on the first semiconductor stack and a second electrode on the second semiconductor stack.

14. The manufacturing method according to claim 7 , wherein the portion of the concavo-convex structures after being etched has smaller size than the concavo-convex structures under the first semiconductor stack.

15. The manufacturing method according to claim 3 , wherein the scribing region further extends into the substrate.

16. A manufacturing method of a light-emitting device, comprising:

providing a substrate with a top surface, wherein the top surface comprises a plurality of concavo-convex structures;

forming a semiconductor stack on the top surface;

forming a trench in the semiconductor stack to define a plurality of second semiconductor stacks and expose a first upper surface;

forming a scribing region by a first laser dicing from the first upper surface to define a plurality of first semiconductor stacks;

etching a portion of the plurality of first semiconductor stacks trough the scribing region to form a first side wall of each of the first semiconductor stack; and

dividing the substrate by a second laser dicing along the scribing region,

wherein a second laser beam of the second laser dicing focuses in the substrate; and

wherein the first side wall and the top surface form an acute angle α.

17. The manufacturing method according to claim 16 , wherein the scribing region further extends into the substrate to expose a side surface of the substrate.

18. The manufacturing method according to claim 17 , further comprising etching the side surface of the substrate.

19. The manufacturing method according to claim 16 , wherein the second laser beam forms a damage region in the substrate.

20. The manufacturing method according to claim 16 , wherein 30°≤α≤80°.

Assignments (3)
CHANGE OF NAME Recorded Apr 22, 2026
From: EPISTAR CORPORATION
To: ENNOSTAR CORPORATION
Reel/Frame 075513/0783 →
CORRECTIVE ASSIGNMENT TO CORRECT THE NATURE OF CONVEYANCE TO EMPLOYMENT CONTRACT PREVIOUSLY RECORDED AT REEL: 053536 FRAME: 0754. ASSIGNOR(S) HEREBY CONFIRMS THE EMPLOYMENT CONTRACT. Recorded Aug 28, 2020
From: HUANG, JING-FENG; WANG, YU-SHOU
To: EPISTAR CORPORATION
Reel/Frame 053636/0621 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 19, 2020
From: HUANG, JING-FENG; WANG, YU-SHOU
To: EPISTAR CORPORATION
Reel/Frame 053536/0754 →
Continuity (4)
Division 15412759 · Jan 23, 2017
Continuation In Part 15299754 · Oct 21, 2016
Continuation In Part 14691221 · Apr 20, 2015
Related Publication 20190157507A1 · May 23, 2019