Marco inspection systems, apparatus and methods
The disclosed technology relates to an inspection apparatus that includes a stage configured to retain a specimen for inspection, an imaging device having a field of view encompassing at least a portion of the stage to view a specimen retained on the stage, a lens having a view encompassing the specimen retained on the stage, and a plurality of lights disposed on a moveable platform. The inspection apparatus can further include a control module configured to control a position of the stage, an elevation of the moveable platform, and a focus of the lens. In some implementations, the inspection apparatus includes an image processing system configured for receiving image data from the imaging device, analyzing the image data to determine a specimen classification, and automatically selecting an illumination profile based on the specimen classification. Methods and machine-readable media are also contemplated.
1. An inspection apparatus comprising:
a stage configured to retain a specimen for inspection;
an imaging device having a field of view encompassing at least a portion of the stage;
a lens having a field of view encompassing at least a portion of the stage;
a plurality of lights disposed on a moveable platform;
a control module coupled to each of the imaging device, the stage, the moveable platform, and the lens, wherein the control module is configured to control a position of the stage, an elevation of the moveable platform, and a focus of the lens; and
an image processing system coupled to the control module, wherein the image processing system comprises one or more processors and a non-transitory media comprising instructions that are configured to cause the processors to perform operations for:
receiving image data from the imaging device, wherein the image data corresponds with at least a partial view of the specimen retained on the stage;
analyzing the image data to determine a specimen classification corresponding with the specimen retained on the stage; and
automatically selecting an illumination profile based on the specimen classification by:
referencing a profile database using the specimen classification; and
receiving the illumination profile, wherein the illumination profile is associated with the specimen classification in the profile database.
2. The inspection apparatus of claim 1 , wherein the instructions are further configured to cause the processors to perform operations for:
automatically adjusting the position of the stage, using the control module, based on the selected illumination profile.
3. The inspection apparatus of claim 1 , wherein the instructions are further configured to cause the processors to perform operations for:
automatically adjusting the elevation of the moveable platform, using the control module, based on the selected illumination profile.
4. The inspection apparatus of claim 1 , wherein the instructions are further configured to cause the processors to perform operations for:
automatically adjusting the focus of the lens, using the control module, based on the selected illumination profile.
5. The inspection apparatus of claim 1 , wherein the instructions are further configured to cause the processors to perform operations for:
automatically adjusting a pivot of at least one of the plurality of lights disposed on the moveable platform based on the selected illumination profile.
6. The inspection apparatus of claim 1 , wherein the imaging device is configured to view the at least a portion of the stage via the lens.