Patent Assignment
Reel/Frame 065726/0001
Security Interest
Recorded: 2023-11-30
Pages: 80
Assignors
NANOTRONICS IMAGING, INC.
Executed: 2023-11-30
NANOTRONICS HEALTH LLC
Executed: 2023-11-30
CUBEFABS INC.
Executed: 2023-11-30
Assignee
ORBIMED ROYALTY & CREDIT OPPORTUNITIES IV, LP
601 LEXINGTON AVENUE 54TH FLOOR, NEW YORK, NEW YORK, 10022
Covered Properties
(125)
Method and System for Bi-Level Treatment of Sleep Apnea
PCT:
PCT/US2022/025611 ↗
Respiratory Pattern Analysis During Variable Positive Air Pressure Delivery for Spontaneously Breathing Patients
PCT:
PCT/US2022/029147 ↗
System, Method and Apparatus for Macroscopic Inspection of Reflective Specimens
PCT:
PCT/US2022/037152 ↗
Method, Systems and Apparatus for Intelligently Emulating Factory Control Systems and Simulating Response Data
PCT:
PCT/US2022/042223 ↗
Fault Protected Signal Splitter Apparatus
PCT:
PCT/US2022/042230 ↗
Artificial Intelligence Process Control for Assembly Processes
PCT:
PCT/US2023/028052 ↗
System and Method for Generating Training Data Sets for Specimen Defect Detection
PCT:
PCT/US2023/066833 ↗
Dynamic Monitoring and Securing of Factory Processes, Equipment and Automated Systems
PCT:
PCT/US2023/068606 ↗
Autofocus System and Method
PCT:
PCT/US2023/068608 ↗
Threshold Determination for Predictive Process Control of Factory Processes, Equipment and Automated Systems
PCT:
PCT/US2023/072403 ↗
Non-Invasive Respiratory Device with a Vertical Connection Interface
PCT:
PCT/US2023/072496 ↗
Increasing Image Resolution Method Employing Known Background and Specimen
Automatic Microscopic Focus System and Method for Analysis of Transparent or Low Contrast Specimens
Continuously Scanning Xy Translation Stage
Apparatus and Method for Manipulating Objects with Gesture Controls
Unique Oblique Lighting Technique Using a Brightfield Darkfield Objective and Imaging Method Relating Thereto
Camera and Specimen Alignment to Facilitate Large Area Imaging in Microscopy
Apparatus and Method to Reduce Vignetting in Microscopic Imaging
Systems, Devices, and Methods for Combined Wafer and Photomask Inspection
Patent:
10,254,214 →
Application:
15/899,456 →
Systems, Devices and Methods for Automatic Microscopic Focus
Patent:
10,247,910 →
Application:
15/920,850 →
Systems, Methods, and Media for Artificial Intelligence Feedback Control in Additive Manufacturing
Systems, Devices and Methods for Automatic Microscope Focus
Patent:
10,146,041 →
Application:
15/967,802 →
Systems, Apparatus, and Methods for Sorting Components Using Illumination
Patent:
10,173,246 →
Application:
15/992,985 →
Camera and Specimen Alignment to Facilitate Large Area Imaging in Microscopy
Camera and Specimen Alignment to Facilitate Large Area Imaging in Microscopy
Systems, Devices, and Methods for Providing Feedback on and Improving the Accuracy of Super-Resolution Imaging
Patent:
10,169,852 →
Application:
16/027,056 →
Method and System for Automatically Mapping Fluid Objects on a Substrate
Patent:
10,481,379 →
Application:
16/164,990 →
Systems, Devices and Methods for Automatic Microscope Focus
Systems, Devices, and Methods for Providing Feedback on and Improving the Accuracy of Super-Resolution Imaging
Patent:
10,467,740 →
Application:
16/233,258 →
Macro Inspection Systems, Apparatus and Methods
Patent:
10,545,096 →
Application:
16/262,017 →
Systems, Devices and Methods for Automatic Microscopic Focus
Dynamic Training for Assembly Lines
Patent:
10,481,579 →
Application:
16/289,422 →
Systems, Devices, and Methods for Combined Wafer and Photomask Inspection
Fluorescence Microscopy Inspection Systems, Apparatus and Methods
Patent:
10,578,850 →
Application:
16/399,058 →
Predictive Process Control for a Manufacturing Process
Unique Oblique Lighting Technique Using a Brightfield Darkfield Objective and Imaging Method Relating Thereto
Systems, Devices, and Methods for Providing Feedback on and Improving the Accuracy of Super-Resolution Imaging
Method and System for Automatically Mapping Fluid Objects on a Substrate
Dynamic Training for Assembly Lines
Predictive Process Control for a Manufacturing Process
Apparatus and Method to Reduce Vignetting in Microscopic Imaging
System, Method and Apparatus for Macroscopic Inspection of Reflective Specimens
Systems, Devices, and Methods for Automatic Microscopic Focus
Systems, Methods, and Media for Artificial Intelligence Feedback Control in Additive Manufacturing
Macro Inspection Systems, Apparatus and Methods
Fluorescence Microscopy Inspection Systems, Apparatus and Methods with Darkfield Channel
Dynamic Monitoring and Securing of Factory Processes, Equipment and Automated Systems
Assembly Error Correction for Assembly Lines
Systems, Methods, and Media for Artificial Intelligence Process Control in Additive Manufacturing
Systems, Devices and Methods for Automatic Microscope Focus
Method, Systems and Apparatus for Intelligently Emulating Factory Control Systems and Simulating Response Data
Apparatus and Method for Manipulating Objects with Gesture Controls
Dynamic Monitoring and Securing of Factory Processes, Equipment and Automated Systems
Camera and Specimen Alignment to Facilitate Large Area Imaging in Microscopy
Securing Industrial Production from Sophisticated Attacks
Systems, Methods, and Media for Manufacturing Processes
Systems, Devices, and Methods for Providing Feedback on and Improving the Accuracy of Super-Resolution Imaging
Method and System for Mapping Objects on Unknown Specimens
Systems, Methods, and Media for Manufacturing Processes
Application:
17/091,209 →
Publication:
US 2021/0138735
Systems, Methods, and Media for Manufacturing Processes
Apparatus and Method for Manipulating Objects with Gesture Controls
Deep Photometric Learning (DPL) Systems, Apparatus and Methods
System, Method and Apparatus for Macroscopic Inspection of Reflective Specimens
Macro Inspection Systems, Apparatus and Methods
Systems, Methods, and Media for Manufacturing Processes
Systems, Methods, and Media for Manufacturing Processes
Defect Detection System
Unique Oblique Lighting Technique Using a Brightfield Darkfield Objective and Imaging Method Relating Thereto
Systems, Devices, and Methods for Providing Feedback on and Improving the Accuracy of Super-Resolution Imaging
Controlled Growth System for Biologicals
Systems, Methods, and Media for Manufacturing Processes
Predictive Process Control for a Manufacturing Process
Predictive Process Control for a Manufacturing Process
Dynamic Monitoring and Securing of Factory Processes, Equipment and Automated Systems
System, Method and Apparatus for Macroscopic Inspection of Reflective Specimens
Deep Learning Model for Noise Reduction in Low SNR Imaging Conditions
Deep Learning Model for Auto-Focusing Microscope Systems
Systems, Methods, and Media for Artificial Intelligence Process Control in Additive Manufacturing
Method, Systems and Apparatus for Intelligently Emulating Factory Control Systems and Simulating Response Data
Dynamic Monitoring and Securing of Factory Processes, Equipment and Automated Systems
Systems, Methods, and Media for Artificial Intelligence Feedback Control in Manufacturing
Application:
17/445,660 →
Publication:
US 2021/0387421
Systems, Methods, and Media for Manufacturing Processes
Application:
17/447,144 →
Publication:
US 2021/0394456
Method, Systems and Apparatus for Intelligently Emulating Factory Control Systems and Simulating Response Data
Sysytem and Method for Improving Assembly Line Processes
Assembly Error Correction for Assembly Lines
Fault Protected Signal Splitter Apparatus
Patent:
11,411,293 →
Application:
17/646,247 →
Imitation Learning in a Manufacturing Environment
Systems, Devices, and Methods for Automatic Microscopic Focus
Fluorescence Microscopy Inspection Systems, Apparatus and Methods with Darkfield Channel
Method and System for Bi-Level Treatment of Sleep Apnea
Respiratory Pattern Analysis During Variable Positive Air Pressure Delivery For Spontaneously Breathing Patients
Method and System for Mapping Objects on Unknown Specimens
System, Method and Apparatus for Macroscopic Inspection of Reflective Specimens
Dynamic Monitoring and Securing of Factory Processes, Equipment and Automated Systems
Patent:
11,669,058 →
Application:
17/812,879 →
Apparatus and Method for Manipulating Objects with Gesture Controls
Macro Inspection Systems, Apparatus and Methods
Fault Protected Signal Splitter Apparatus
Defect Detection System
Threshold Determination for Predictive Process Control of Factory Processes, Equipment and Automated Systems
Patent:
11,747,772 →
Application:
17/931,442 →
Non-Invasive Respiratory Device with a Vertical Connection Interface
Patent:
11,712,530 →
Application:
17/934,775 →
System and Method for Generating Training Data Sets for Specimen Defect Detection
Patent:
11,727,672 →
Application:
17/938,885 →
Autofocus System and Method
Systems, Devices and Methods for Automatic Microscope Focus
Unique Oblique Lighting Technique Using a Brightfield Darkfield Objective and Imaging Method Relating Thereto
Deep Photometric Learning (DPL) Systems, Apparatus and Methods
System, Method and Apparatus for Macroscopic Inspection of Reflective Specimens
Threshold Determination for Predictive Process Control of Factory Processes, Equipment and Automated Systems
Systems, Devices, and Methods for Providing Feedback on and Improving the Accuracy of Super-Resolution Imaging
Fluorescence Microscopy Inspection Systems, Apparatus and Methods with Darkfield Channel
System, Method and Apparatus for Macroscopic Inspection of Reflective Specimens
Method, Systems and Apparatus for Intelligently Emulating Factory Control Systems and Simulating Response Data
Predictive Process Control for a Manufacturing Process
Method, Systems and Apparatus for Intelligently Emulating Factory Control Systems and Simulating Response Data
Dynamic Monitoring and Securing of Factory Processes, Equipment and Automated Systems
System and Method for Improving Assembly Line Processes
Application:
18/333,016 →
Publication:
US 2023/0324874
Method and System for Bi-Level Treatment of Sleep Apnea
Fault Protected Signal Splitter Apparatus
Dynamic Monitoring and Securing of Factory Processes, Equipment and Automated Systems
Assembly Error Correction for Assembly Lines
Artificial Intelligence Process Control for Assembly Processes
Predictive Process Control for a Manufacturing Process
Fault Protected Signal Splitter Apparatus
System and Method for Generating Training Data Sets for Specimen Defect Detection
Systems, Methods, and Media for Artificial Intelligence Process Control in Additive Manufacturing
Positive Airway Pressure Device
Patent:
1,041,027 →
Application:
29/866,537 →
Related Assignments
(19)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
Jan 6, 2012
From: PUTMAN, MATTHEW C; PUTMAN, JOHN B
To: NANOTRONICS IMAGING, LLC
Reel/Frame 027494/0609 →
Assignment of Assignor's Interest
Aug 31, 2012
From: PUTMAN, MATTHEW C; PUTMAN, JOHN B; ARCHER, JEFFREY S; ORLANDO, JULIE A
To: NANOTRONICS IMAGING, LLC
Reel/Frame 028882/0830 →
Assignment of Assignor's Interest
Aug 14, 2013
From: PUTMAN, MATTHEW C; PUTMAN, JOHN B
To: NANOTRONICS IMAGING, LLC
Reel/Frame 031013/0941 →
Assignment of Assignor's Interest
Jul 22, 2016
From: PUTMAN, MATTHEW C.; PUTMAN, JOHN B.; ROOSSIN, PAUL
To: NANOTRONICS IMAGING, INC.
Reel/Frame 039224/0255 →
Assignment of Assignor's Interest
Jan 31, 2017
From: PUTMAN, MATTHEW C.
To: NANOTRONICS IMAGING, INC.
Reel/Frame 041132/0963 →
Assignment of Assignor's Interest
May 16, 2017
From: PUTMAN, MATTHEW; PUTMAN, JOHN; SCOTT, BRANDON; FASHBAUGH, DYLAN
To: NANOTRONICS IMAGING, INC.
Reel/Frame 042392/0807 →
Assignment of Assignor's Interest
May 24, 2017
From: PUTMAN, MATTHEW C.; PUTMAN, JOHN B.; ORLANDO, JULIE A.; BULMAN, JOSEPH G.
To: NANOTRONICS IMAGING, INC.
Reel/Frame 042550/0931 →
Assignment of Assignor's Interest
Feb 14, 2018
From: PUTMAN, MATTHEW C.; PUTMAN, JOHN B.; HORSTMEYER, ROARKE; FASHBAUGH, DYLAN
To: NANOTRONICS IMAGING, INC.
Reel/Frame 044930/0270 →
Assignment of Assignor's Interest
Apr 5, 2018
From: PUTMAN, MATTHEW C.; PINSKIY, VADIM; WILLIAMS, JAMES, III; LIMOGE, DAMAS
To: NANOTRONICS IMAGING, INC.
Reel/Frame 045449/0423 →
Assignment of Assignor's Interest
Jun 14, 2018
From: PUTMAN, JOHN B.; PUTMAN, MATTHEW C.; ORLANDO, JULIE; FASHBAUGH, DYLAN
To: NANOTRONICS IMAGING, INC.
Reel/Frame 046089/0972 →
Assignment of Assignor's Interest
Jun 14, 2018
From: PUTMAN, JOHN B.; PUTMAN, MATTHEW C.; PINSKIY, VADIM; SHAROUKHOV, DENIS Y.
To: NANOTRONICS IMAGING, INC.
Reel/Frame 046089/0638 →
Assignment of Assignor's Interest
Jun 14, 2018
From: PUTMAN, MATTHEW C.; PINSKIY, VADIM; WILLIAMS, JAMES; LIMOGE, DAMAS
To: NANOTRONICS IMAGING, INC.
Reel/Frame 046090/0013 →
Assignment of Assignor's Interest
Jun 14, 2018
From: GRIFFITH, RANDOLPH E.; ANDRESEN, JEFF; POZZI-LOYOLA, SCOTT; MOSKIE, MICHAEL
To: NANOTRONICS IMAGING, INC.
Reel/Frame 046089/0813 →
Assignment of Assignor's Interest
Jun 29, 2018
From: PUTMAN, MATTHEW C; PUTMAN, JOHN B; SCOTT, BRANDON; FASHBAUGH, DYLAN
To: NANOTRONICS IMAGING, INC.
Reel/Frame 046237/0942 →
Assignment of Assignor's Interest
Jun 29, 2018
From: PUTMAN, JOHN B; STANWIX, JUSTIN; YANCEY, JONATHAN
To: NANOTRONICS IMAGING, INC.
Reel/Frame 046237/0563 →
Assignment of Assignor's Interest
Jun 29, 2018
From: PUTMAN, MATTHEW C.; PUTMAN, JOHN B.; SCOTT, BRANDON; FASHBAUGH, DYLAN
To: NANOTRONICS IMAGING, INC.
Reel/Frame 046238/0344 →
Assignment of Assignor's Interest
Jul 9, 2018
From: PUTMAN, MATTHEW C.; PUTMAN, JOHN B.; PINSKIY, VADIM; SUCCAR, JOSEPH R.
To: NANOTRONICS IMAGING, INC.
Reel/Frame 046290/0736 →
Assignment of Assignor's Interest
Feb 8, 2019
From: JAIME, ALEJANDRO S.; PUTMAN, JOHN B.
To: NANOTRONICS IMAGING, INC.
Reel/Frame 048280/0171 →
Assignment of Assignor's Interest
Jul 19, 2023
From: LEE, JONATHAN; DOSHI, ANUJ
To: NANOTRONICS IMAGING, INC.
Reel/Frame 064308/0938 →