Systems, devices, and methods for providing feedback on and improving the accuracy of super-resolution imaging
Systems, methods, and computer-readable media for feedback on and improving the accuracy of super-resolution imaging. In some embodiments, a low resolution image of a specimen can be obtained using a low resolution objective of a microscopy inspection system. A super-resolution image of at least a portion of the specimen can be generated from the low resolution image of the specimen using a super-resolution image simulation. Subsequently, an accuracy assessment of the super-resolution image can be identified based on one or more degrees of equivalence between the super-resolution image and one or more actually scanned high resolution images of at least a portion of one or more related specimens identified using a simulated image classifier. Based on the accuracy assessment of the super-resolution image, it can be determined whether to further process the super-resolution image. The super-resolution image can be further processed if it is determined to further process the super-resolution image.
1. A method, comprising:
obtaining, by a computing system, a low resolution image of a specimen using a low resolution objective of a microscopy inspection system;
detecting, by the computing system, a plurality of artifacts in the low resolution image;
determining, by the computing system, that a first artifact of the plurality of artifacts is suitable for super-resolution imaging;
determining, by the computing system, that a second artifact of the plurality of artifacts is not suitable for super-resolution imaging; and
based on the determining,
generating, by the computing system, a super-resolution image of a first portion of the specimen that includes the first artifact,
generating, by the computing system, a high resolution image of a second portion of the specimen that includes the second artifact, and
generating, by the computing system, a single coherent image of the specimen by combining the super-resolution image and the high resolution image.
2. The method of claim 1 , wherein determining, by the computing system, that the first artifact of the plurality of artifacts is suitable for super-resolution imaging comprises:
cross-correlating the first artifact to known artifacts that have been assessed as suitable for super-resolution imaging.
3. The method of claim 2 , wherein cross-correlating the first artifact to the known artifacts that have been assessed as suitable for super-resolution imaging comprises:
measuring a similarity of the first artifact to each known artifact as a function of a displacement of the first artifact relative to each known artifact.
4. The method of claim 2 , wherein the known artifacts that have been assessed as suitable for super-resolution imaging comprises artifacts where super-resolution images were generated and determined to be high-confidence super-resolution images.
5. The method of claim 1 , wherein determining, by the computing system, that the second artifact of the plurality of artifacts is not suitable for super-resolution imaging comprises:
cross-correlating the second artifact to known artifacts that have been assessed as not being suitable for super-resolution imaging.
6. The method of claim 5 , wherein cross-correlating the second artifact to the known artifacts that have been assessed as not being suitable for super-resolution imaging comprises:
measuring a similarity of the second artifact to each known artifact as a function of a displacement of the second artifact relative to each known artifact.
7. The method of claim 1 , further comprising:
determining, by the computing system, a total number of artifacts on the specimen based on the single coherent image.
8. A non-transitory computer readable medium comprising one or more sequences of instructions, which, when executed by one or more processors, causes a computing system to perform operations comprising:
obtaining, by the computing system, a low resolution image of a specimen using a low resolution objective of a microscopy inspection system;
detecting, by the computing system, a plurality of artifacts in the low resolution image;
determining, by the computing system, that a first artifact of the plurality of artifacts is suitable for super-resolution imaging;
determining, by the computing system, that a second artifact of the plurality of artifacts is not suitable for super-resolution imaging; and
based on the determining,
generating, by the computing system, a super-resolution image of a first portion of the specimen that includes the first artifact,
generating, by the computing system, a high resolution image of a second portion of the specimen that includes the second artifact, and
generating, by the computing system, a single coherent image of the specimen by combining the super-resolution image and the high resolution image.
9. The non-transitory computer readable medium of claim 8 , wherein determining, by the computing system, that the first artifact of the plurality of artifacts is suitable for super-resolution imaging comprises:
cross-correlating the first artifact to known artifacts that have been assessed as suitable for super-resolution imaging.
10. The non-transitory computer readable medium of claim 9 , wherein cross-correlating the first artifact to the known artifacts that have been assessed as suitable for super-resolution imaging comprises:
measuring a similarity of the first artifact to each known artifact as a function of a displacement of the first artifact relative to each known artifact.
11. The non-transitory computer readable medium of claim 9 , wherein the known artifacts that have been assessed as suitable for super-resolution imaging comprises artifacts where super-resolution images were generated and determined to be high-confidence super-resolution images.
12. The non-transitory computer readable medium of claim 8 , wherein determining, by the computing system, that the second artifact of the plurality of artifacts is not suitable for super-resolution imaging comprises:
cross-correlating the second artifact to known artifacts that have been assessed as not being suitable for super-resolution imaging.
13. The non-transitory computer readable medium of claim 12 , wherein cross-correlating the second artifact to the known artifacts that have been assessed as not being suitable for super-resolution imaging comprises:
measuring a similarity of the second artifact to each known artifact as a function of a displacement of the second artifact relative to each known artifact.
14. The non-transitory computer readable medium of claim 8 , further comprising:
determining, by the computing system, a total number of artifacts on the specimen based on the single coherent image.
15. A system comprising:
a processor; and
a memory having programming instructions stored thereon, which when executed by the processor, causes the system to perform operations comprising:
obtaining a low resolution image of a specimen using a low resolution objective of a microscopy inspection system;
detecting a plurality of artifacts in the low resolution image;
determining that a first artifact of the plurality of artifacts is suitable for super-resolution imaging;
determining that a second artifact of the plurality of artifacts is not suitable for super-resolution imaging; and
based on the determining,
generating a super-resolution image of a first portion of the specimen that includes the first artifact,
generating a high resolution image of a second portion of the specimen that includes the second artifact, and
generating a single coherent image of the specimen by combining the super-resolution image and the high resolution image.
16. The system of claim 15 , wherein determining that the first artifact of the plurality of artifacts is suitable for super-resolution imaging comprises:
cross-correlating the first artifact to known artifacts that have been assessed as suitable for super-resolution imaging.
17. The system of claim 16 , wherein cross-correlating the first artifact to the known artifacts that have been assessed as suitable for super-resolution imaging comprises:
measuring a similarity of the first artifact to each known artifact as a function of a displacement of the first artifact relative to each known artifact.
18. The system of claim 15 , wherein determining that the second artifact of the plurality of artifacts is not suitable for super-resolution imaging comprises:
cross-correlating the second artifact to known artifacts that have been assessed as not being suitable for super-resolution imaging.
19. The system of claim 18 , wherein cross-correlating the second artifact to the known artifacts that have been assessed as not being suitable for super-resolution imaging comprises:
measuring a similarity of the second artifact to each known artifact as a function of a displacement of the second artifact relative to each known artifact.
20. The system of claim 15 , wherein the operations further comprise:
determining a total number of artifacts on the specimen based on the single coherent image.