IP Library Granted Patent US 12,032,365
Granted Patent B2
US 12,032,365 · App. 18/357,560 · Granted Jul 9, 2024

Predictive process control for a manufacturing process

Inventors: Matthew C. Putman (Brooklyn, NY); John B. Putman (Celebration, FL); Vadim Pinskiy (Wayne, NJ); Damas Limoge (Brooklyn, NY)
Assignee: Nanotronics Imaging, Inc.
G05B19/41875G05B13/027G05B2219/32193G05B2219/32194G05B2219/32195
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Quick Facts
Patent No.
US 12,032,365
App. No.
18/357,560
Granted
Jul 9, 2024
Kind
B2
Abstract

Aspects of the disclosed technology encompass the use of a deep-learning controller for monitoring and improving a manufacturing process. In some aspects, a method of the disclosed technology includes steps for: receiving control values associated with a process station in a manufacturing process, predicting an expected value for an article of manufacture output from the process station, and determining if the deep-learning controller can control the manufacturing process based on the expected value. Systems and computer-readable media are also provided.

Claims (53)

1. A computer-implemented method for detecting unexpected activity in a manufacturing process executed in a manufacturing system comprising a plurality of process stations, the computer-implemented method comprising:

receiving a set of control values generated at a first process station of the plurality of process stations;

projecting a final output value or intermediate output value for an article of manufacture undergoing the manufacturing process based on the set of control values;

determining that the final output value of the intermediate output value is out of specification;

based on the determining, identifying a key influencer in the set of control values that impacts the final output value or the intermediate output value; and

based on the identifying, generating updated control inputs for a second process station downstream of the first process station to bring the article of manufacture within specification based on the identified key influencer.

2. The computer-implemented method of claim 1 , wherein identifying the key influencer in the set of control values that impacts the final output value or the intermediate output value comprises:

identifying one or more parameters that affect the final output value or the intermediate output value.

3. The computer-implemented method of claim 2 , further comprising:

ranking the one or more parameters based on their influence on the final output value or the intermediate output value.

4. The computer-implemented method of claim 3 , further comprising:

identifying a highest ranked parameter of the one or more parameters, wherein the highest ranked parameter is the identified key influencer.

5. The computer-implemented method of claim 3 , further comprising:

identifying a subset of the one or more parameters that exceed a threshold level of influence on the final output value or the intermediate output value, wherein the subset of the one or more parameters comprises the identified key influencer.

6. The computer-implemented method of claim 1 , further comprising:

predicting one or more control inputs for controlling the key influencer to bring the article of manufacture within specification.

7. The computer-implemented method of claim 6 , wherein the updated control inputs are based on the predicted one or more control inputs.

8. A system comprising:

a processor; and

a memory having programming instructions stored thereon, which, when executed by the processor, causes the system to perform operations comprising:

receiving a set of control values generated at a first process station of a plurality of process stations;

projecting a final output value or intermediate output value for an article of manufacture undergoing a manufacturing process based on the set of control values;

determining that the final output value of the intermediate output value is out of specification;

based on the determining, identifying a key influencer in the set of control values that impacts the final output value or the intermediate output value; and

based on the identifying, generating updated control inputs for a second process station downstream of the first process station to bring the article of manufacture within specification based on the identified key influencer.

9. The system of claim 8 , wherein identifying the key influencer in the set of control values that impacts the final output value or the intermediate output value comprises:

identifying one or more parameters that affect the final output value or the intermediate output value.

10. The system of claim 9 , further comprising:

ranking the one or more parameters based on their influence on the final output value or the intermediate output value.

11. The system of claim 10 , further comprising:

identifying a highest ranked parameter of the one or more parameters, wherein the highest ranked parameter is the identified key influencer.

12. The system of claim 10 , further comprising:

identifying a subset of the one or more parameters that exceed a threshold level of influence on the final output value or the intermediate output value, wherein the subset of the one or more parameters comprises the identified key influencer.

13. The system of claim 8 , wherein the operations further comprise:

predicting one or more control inputs for controlling the key influencer to bring the article of manufacture within specification.

14. The system of claim 13 , wherein the updated control inputs are based on the predicted one or more control inputs.

15. A non-transitory computer readable medium comprising one or more sequences of instructions, which, when executed by a processor, causes a computing system to perform operations comprising:

receiving a set of control values generated at a first process station of a plurality of process stations;

projecting a final output value or intermediate output value for an article of manufacture undergoing a manufacturing process based on the set of control values;

determining that the final output value of the intermediate output value is out of specification;

based on the determining, identifying a key influencer in the set of control values that impacts the final output value or the intermediate output value; and

based on the identifying, generating updated control inputs for a second process station downstream of the first process station to bring the article of manufacture within specification based on the identified key influencer.

16. The non-transitory computer readable medium of claim 15 , wherein

identifying the key influencer in the set of control values that impacts the final output value or the intermediate output value comprises:

identifying one or more parameters that affect the final output value or the intermediate output value.

17. The non-transitory computer readable medium of claim 16 , further comprising:

ranking the one or more parameters based on their influence on the final output value or the intermediate output value.

18. The non-transitory computer readable medium of claim 17 , further comprising:

identifying a highest ranked parameter of the one or more parameters, wherein the highest ranked parameter is the identified key influencer.

19. The non-transitory computer readable medium of claim 17 , further comprising:

identifying a subset of the one or more parameters that exceed a threshold level of influence on the final output value or the intermediate output value, wherein the subset of the one or more parameters comprises the identified key influencer.

20. The non-transitory computer readable medium of claim 15 , wherein the operations further comprise:

predicting one or more control inputs for controlling the key influencer to bring the article of manufacture within specification, wherein the updated control inputs are based on the predicted one or more control inputs.

Assignments (3)
SECURITY INTEREST Recorded Nov 30, 2023
From: NANOTRONICS IMAGING, INC.; NANOTRONICS HEALTH LLC; CUBEFABS INC.
To: ORBIMED ROYALTY & CREDIT OPPORTUNITIES IV, LP
Reel/Frame 065726/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 24, 2023
From: PUTMAN, JOHN B.; PINSKIY, VADIM; LIMOGE, DAMAS
To: NANOTRONICS IMAGING, INC.
Reel/Frame 064362/0859 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 24, 2023
From: PUTMAN, MATTHEW C.
To: NANOTRONICS IMAGING, INC.
Reel/Frame 064362/0880 →
Continuity (5)
Continuation 17304611 · Jun 23, 2021
Continuation 16663245 · Oct 24, 2019
Continuation 16519102 · Jul 23, 2019
Provisional Application 62865859 · Jun 24, 2019
Related Publication 20230367301A1 · Nov 16, 2023