IP Library Granted Patent US 12,066,818
Granted Patent B2
US 12,066,818 · App. 17/304,349 · Granted Aug 20, 2024

Systems, methods, and media for manufacturing processes

Inventors: Andrew Sundstrom (Brooklyn, NY); Eun-Sol Kim (Cliffside Park, NJ); Damas Limoge (Brooklyn, NY); Vadim Pinskiy (Wayne, NJ); Matthew C. Putman (Brooklyn, NY)
Assignee: Nanotronics Imaging, Inc.
G05B19/41875G05B13/0265G05B19/4188G06T1/0014G06T7/001G06T7/33G06V10/764G06V20/10G05B2219/31001G05B2219/33034G06T2207/20081G06T2207/30164
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Quick Facts
Patent No.
US 12,066,818
App. No.
17/304,349
Granted
Aug 20, 2024
Kind
B2
Abstract

A manufacturing system is disclosed herein. The manufacturing system includes one or more stations, a monitoring platform, and a control module. Each station of the one or more stations is configured to perform at least one step in a multi-step manufacturing process for a component. The monitoring platform is configured to monitor progression of the component throughout the multi-step manufacturing process. The control module is configured to dynamically adjust processing parameters of each step of the multi-step manufacturing process to achieve a desired final quality metric for the component.

Claims (49)

1. A manufacturing system, comprising:

one or more stations, each station configured to perform at least one step in a multi-step manufacturing process for a component;

a monitoring platform configured to monitor progression of the component throughout the multi-step manufacturing process; and

a control module configured to dynamically adjust processing parameters of a step of the multi-step manufacturing process to achieve a desired final quality metric for the component, the control module configured to perform operations, comprising:

receiving image data of tooling of a first station of the one or more stations;

determining, by a first machine learning model, a final quality metric for the component, based on the image data;

determining that the final quality metric is outside an acceptable range of the desired final quality metric;

based on the determining, generating an updated instruction set to be performed by at least one of the first station or a downstream station to achieve the desired final quality metric;

predicting, by a second machine learning model, an updated final quality metric for the component based on the updated instruction set; and

based on the updated final quality metric, providing the updated instruction set to at least one of a first station controller associated with the first station or a second station controller associated with the downstream station.

2. The manufacturing system of claim 1 , wherein the second machine learning model is trained with a training set comprising a synthetic set of data.

3. The manufacturing system of claim 1 , wherein the final quality metric cannot be measured until processing of the component is complete.

4. The manufacturing system of claim 1 , further comprising:

determining, based on positional information of the component, that an irreversible error is not present.

5. The manufacturing system of claim 1 , further comprising:

identifying a set of keypoints from the image data, the set of keypoints corresponding to position information of the tooling during processing at the first station.

6. The manufacturing system of claim 5 , wherein the set of keypoints are used by the first machine learning model to determine the final quality metric.

7. The manufacturing system of claim 5 , further comprising:

comparing the set of keypoints corresponding to coordinates of the component to a canonical set of keypoints corresponding to a canonical component.

8. A method for dynamically adjusting processing parameters of a step of a multi-step manufacturing process to achieve a desired final quality metric for a component undergoing the multi-step manufacturing process, comprising:

receiving, by a computing system, image data of tooling of a first station of a plurality of stations involved in the multi-step manufacturing process;

determining, by a first machine learning model of the computing system, a final quality metric for the component, based on the image data, the final quality metric representing a metric associated with the component that cannot be measured until the multi-step manufacturing process is complete;

determining, by the computing system, that the final quality metric is outside an acceptable range of the desired final quality metric;

based on the determining an updated instruction set to be performed by at least one of the first station or a downstream station to achieve the desired final quality metric;

predicting, by a second machine learning model of the computing system, an updated final quality metric for the component based on the updated instruction set; and

based on the updated final quality metric, providing, by the computing system, the updated instruction set to at least one of a first station controller associated with the first station or a second station controller associated with the downstream station.

9. The method of claim 8 , wherein the second machine learning model is trained with a training set comprising a synthetic set of data.

10. The method of claim 8 , wherein the final quality metric cannot be measured until processing of the component is complete.

11. The method of claim 8 , further comprising:

determining, based on positional information of the component, that an irreversible error is not present.

12. The method of claim 8 , further comprising:

identifying a set of keypoints from the image data, the set of keypoints corresponding to position information of the tooling during processing at the first station.

13. The method of claim 12 , wherein the set of keypoints are used by the first machine learning model to determine the final quality metric.

14. The method of claim 12 , further comprising:

comparing the set of keypoints corresponding to coordinates of the component to a canonical set of keypoints corresponding to a canonical component.

15. A non-transitory computer readable medium comprising one or more sequences of instructions, which, when executed by a computing system, causes a processor to perform operations for dynamically adjusting processing parameters of a step of a multi-step manufacturing process to achieve a desired final quality metric for a component undergoing the multi-step manufacturing process, comprising:

receiving, by the computing system, image data of tooling of a first station of one or more stations involved in the multi-step manufacturing process;

determining, by a first machine learning model of the computing system, a final quality metric for the component, based on the image data;

determining, by the computing system, that the final quality metric is outside an acceptable range of the desired final quality metric;

based on the determining, generating an updated instruction set to be performed by at least one of the first station or a downstream station to achieve the desired final quality metric;

predicting, by a second machine learning model of the computing system, an updated final quality metric for the component based on the updated instruction set; and

based on the updated final quality metric, providing, by the computing system, the updated instruction set to at least one of a first station controller associated with the first station or a second station controller associated with the downstream station.

16. The non-transitory computer readable medium of claim 15 , wherein the second machine learning model is trained with a training set comprising a synthetic set of data.

17. The non-transitory computer readable medium of claim 15 , wherein the final quality metric cannot be measured until processing of the component is complete.

18. The non-transitory computer readable medium of claim 15 , further comprising:

determining, based on positional information of the component, that an irreversible error is not present.

19. The non-transitory computer readable medium of claim 15 , further comprising:

identifying a set of keypoints from the image data, the set of keypoints corresponding to position information of the tooling during processing at the first station.

20. The non-transitory computer readable medium of claim 19 , wherein the set of keypoints are used by the first machine learning model to determine the final quality metric.

Assignments (2)
SECURITY INTEREST Recorded Nov 30, 2023
From: NANOTRONICS IMAGING, INC.; NANOTRONICS HEALTH LLC; CUBEFABS INC.
To: ORBIMED ROYALTY & CREDIT OPPORTUNITIES IV, LP
Reel/Frame 065726/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 8, 2021
From: SUNDSTROM, ANDREW; KIM, EUN-SOL; LIMOGE, DAMAS; PINSKIY, VADIM; PUTMAN, MATTHEW C.
To: NANOTRONICS IMAGING, INC.
Reel/Frame 056792/0443 →
Continuity (8)
Continuation In Part 17195746 · Mar 9, 2021
Continuation In Part 17091393 · Nov 6, 2020
Provisional Application 63040792 · Jun 18, 2020
Provisional Application 62986987 · Mar 9, 2020
Provisional Application 62932063 · Nov 7, 2019
Provisional Application 62931448 · Nov 6, 2019
Provisional Application 62931453 · Nov 6, 2019
Related Publication 20210311440A1 · Oct 7, 2021