Fluorescence microscopy inspection systems, apparatus and methods with darkfield channel
A fluorescence microscopy inspection system includes light sources able to emit light that causes a specimen to fluoresce and light that does not cause a specimen to fluoresce. The emitted light is directed through one or more filters and objective channels towards a specimen. A ring of lights projects light at the specimen at an oblique angle through a darkfield channel. One of the filters may modify the light to match a predetermined bandgap energy associated with the specimen and another filter may filter wavelengths of light reflected from the specimen and to a camera. The camera may produce an image from the received light and specimen classification and feature analysis may be performed on the image.
1. A microscopy system comprising:
one or more incoherent light sources configured to emit at least a first wavelength of light that will cause a specimen positioned on a stage to fluoresce and a second wavelength of light that will not cause the specimen to fluoresce;
an excitation filter configured to filter light from the one or more incoherent light sources, wherein the filtered light is configured to match a predetermined bandgap energy associated with the specimen;
an objective comprising a brightfield channel and a darkfield channel;
a slider positioned along a lightpath between the objective and the one or more incoherent light sources, wherein the slider includes at least one configuration configured to transmit light along the lightpath to at least the darkfield channel configured to direct light to the specimen at an oblique angle; and
an emission filter configured for filtering selected wavelengths of light reflected from the specimen to a receiving camera.
2. The microscopy system of claim 1 , further comprising:
a nosepiece connected to the objective.
3. The microscopy system of claim 2 , wherein the excitation filter is positioned in the nosepiece.
4. The microscopy system of claim 1 , wherein the slider comprises:
a first bandpass filter configured to allow a first range of wavelengths to passthrough; and
a second bandpass filter configured to allow a second range of wavelengths to passthrough.
5. The microscopy system of claim 4 , further comprising:
a mechanical element configured to select and position each of the first bandpass filter and the second bandpass filter.
6. The microscopy system of claim 1 , further comprising:
a beam splitter configured to reflect light emitted from the one or more incoherent light sources through the brightfield channel of the objective.
7. The microscopy system of claim 6 , wherein the beam splitter is positioned in an optical pathway of the one or more incoherent light sources.
8. The microscopy system of claim 6 , further comprising:
a second receiving camera.
9. The microscopy system of claim 8 , wherein the beam splitter is positioned so that wavelengths in a first range are directed towards the receiving camera and wavelengths in a second range are directed towards the second receiving camera.
10. The microscopy system of claim 1 , further comprising:
a focusing mechanism coupled to the stage, the focusing mechanism configured to adjust the stage in a Z direction towards and away from the objective.
11. A microscopy system comprising:
one or more incoherent light sources configured to emit at least a first wavelength of light that will cause a specimen positioned on a stage to fluoresce and a second wavelength of light that will not cause the specimen to fluoresce;
an excitation filter configured to filter light from the one or more incoherent light sources, wherein the filtered light is configured to match a predetermined bandgap energy associated with the specimen;
an objective comprising a brightfield channel and a darkfield channel; and
a slider positioned along a lightpath between the objective and the one or more incoherent light sources, wherein the slider includes at least one configuration configured to transmit light along the lightpath to at least the darkfield channel configured to direct light to the specimen at an oblique angle.
12. The microscopy system of claim 11 , further comprising:
a nosepiece connected to the objective.
13. The microscopy system of claim 12 , wherein the excitation filter is positioned in the nosepiece.
14. The microscopy system of claim 11 , wherein the slider comprises:
a first bandpass filter configured to allow a first range of wavelengths to passthrough; and
a second bandpass filter configured to allow a second range of wavelengths to passthrough.
15. The microscopy system of claim 14 , further comprising:
a mechanical element configured to select and position each of the first bandpass filter and the second bandpass filter.
16. The microscopy system of claim 11 , further comprising:
a beam splitter configured to reflect light emitted from the one or more incoherent light sources through the brightfield channel of the objective.
17. The microscopy system of claim 16 , wherein the beam splitter is positioned in an optical pathway of the one or more incoherent light sources.
18. The microscopy system of claim 16 , further comprising:
a second receiving camera.
19. The microscopy system of claim 18 , wherein the beam splitter is positioned so that wavelengths in a first range are directed towards the receiving camera and wavelengths in a second range are directed towards the second receiving camera.
20. The microscopy system of claim 11 , further comprising:
a focusing mechanism coupled to the stage, the focusing mechanism configured to adjust the stage in a Z direction towards and away from the objective.