IP Library Granted Patent US 11,117,328
Granted Patent B2
US 11,117,328 · App. 17/015,674 · Granted Sep 14, 2021

Systems, methods, and media for manufacturing processes

Inventors: Fabian Hough (Brooklyn, NY); John B. Putman (Celebration, FL); Matthew C. Putman (Brooklyn, NY); Vadim Pinskiy (Wayne, NJ); Damas Limoge (Brooklyn, NY); Aswin Raghav Nirmaleswaran (Brooklyn, NY); Sadegh Nouri Gooshki (Brooklyn, NY)
Assignee: Nanotronics Imaging, Inc.
B29C64/393B33Y10/00B33Y30/00B33Y50/02G05B19/4099G06N3/08G05B2219/49023
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Quick Facts
Patent No.
US 11,117,328
App. No.
17/015,674
Granted
Sep 14, 2021
Kind
B2
Abstract

A manufacturing system is disclosed herein. The manufacturing system includes one or more stations, a monitoring platform, and a control module. Each station of the one or more stations is configured to perform at least one step in a multi-step manufacturing process for a product. The monitoring platform is configured to monitor progression of the product throughout the multi-step manufacturing process. The control module is configured to dynamically adjust processing parameters of each step of the multi-step manufacturing process to achieve a desired final quality metric for the product.

Claims (50)

1. A manufacturing system, comprising:

one or more stations, each station configured to perform at least one step in a multi-step manufacturing process for a product;

a monitoring platform configured to monitor progression of the product throughout the multi-step manufacturing process; and

a computing system configured to adjust processing parameters of each step of the multi-step manufacturing process to achieve a desired final quality metric for the product, the computing system configured to perform operations, comprising:

receiving, by the computing system from the monitoring platform, an input associated with the product at a step of the multi-step manufacturing process, wherein the input comprises an image of the product at the step of the multi-step manufacturing process;

generating, by a state autoencoder of the computing system, a state encoding for the product based on the input;

determining, by a deep learning model of the computing system, based on the state encoding and the image of the product that a final quality metric for the product is not within a range of acceptable values; and

based on the determining, adjusting by the computing system, a control logic for at least a following station, wherein the adjusting comprises generating, by the deep learning model, a corrective action to be performed by the following station.

2. The manufacturing system of claim 1 , wherein the final quality metric cannot be measured until processing of the product is complete.

3. The manufacturing system of claim 1 , wherein adjusting, by the computing system, the control logic for at least the following station, comprises:

identifying the corrective action to be performed by the following station; and

projecting the final quality metric based on the corrective action and the state encoding.

4. The manufacturing system of claim 1 , wherein the operations further comprise:

determining, by the computing system, whether an irrecoverable failure is present based on the input.

5. The manufacturing system of claim 4 , wherein the input comprises an image and wherein the computing system determines that the irrecoverable failure is present using a convolutional neural network.

6. The manufacturing system of claim 1 , wherein adjusting by the computing system, the control logic for at least the following station, comprises:

adjusting a further control logic for a further following station.

7. The manufacturing system of claim 1 , wherein each of the one or more stations correspond to a layer deposition in a 3D printing process.

8. A multi-step manufacturing method, comprising:

receiving, by a computing system from a monitoring platform of a manufacturing system, an image of a product at a station of one or more stations, each station configured to perform a step of a multi-step manufacturing process;

generating, by a state autoencoder of the computing system, a state encoding for the product based on the image of the product;

determining, by a deep learning model of the computing system, based on the state encoding and the image of the product that a final quality metric of the product is not within a range of acceptable values; and

based on the determining, adjusting by the computing system, a control logic for at least a following station, wherein the adjusting comprises generating, by the deep learning model, a corrective action to be performed by the following station.

9. The multi-step manufacturing method of claim 8 , wherein the final quality metric cannot be measured until processing of the product is complete.

10. The multi-step manufacturing method of claim 8 , wherein adjusting, by the computing system, the control logic for at least the following station, comprises:

identifying the corrective action to be performed by the following station; and

projecting the final quality metric based on the corrective action and the state encoding.

11. The multi-step manufacturing method of claim 8 , further comprising:

determining, by the computing system, whether an irrecoverable failure is present based on the image.

12. The multi-step manufacturing method of claim 11 , wherein the computing system determines that an irrecoverable failure is present using a convolutional neural network.

13. The multi-step manufacturing method of claim 8 , wherein adjusting by the computing system, the control logic for at least the following station, comprises:

adjusting a further control logic for a further following station.

14. The multi-step manufacturing method of claim 8 , wherein each of the one or more stations correspond to a layer deposition in a 3D printing process.

15. A three-dimensional (3D) printing system, comprising:

a processing station configured to deposit a plurality of layers to form a product;

a monitoring platform configured to monitor progression of the product throughout a deposition process; and

a computing system configured to adjust processing parameters for each layer of the plurality of layers to achieve a desired final quality metric for the product, the computing system configured to perform operations, comprising:

receiving, by the computing system from the monitoring platform, an image of the product after a layer has been deposited;

generating, by a state autoencoder of the computing system, a state encoding for the product based on the image of the product;

determining, by a deep learning model of the computing system, based on the state encoding and the image of the product that a final quality metric for the product is not within a range of acceptable values; and

based on the determining, adjusting, by the computing system, a control logic for depositing at least a following layer of the plurality of layers, wherein the adjusting comprises generating, by the deep learning model, a corrective action to be performed during deposition of the following layer.

16. The system of claim 15 , wherein the final quality metric cannot be measured until processing of the product is complete.

17. The system of claim 15 , wherein adjusting, by the computing system, the control logic for depositing at least the following layer, comprises:

identifying the corrective action to be performed during deposition of the following layer; and

projecting the final quality metric based on the corrective action and the state encoding.

18. The system of claim 15 , further comprising:

determining, by the computing system, whether an irrecoverable failure is present based on the image.

19. The system of claim 18 , wherein the computing system determines that the irrecoverable failure is present using a convolutional neural network.

20. The system of claim 15 , wherein adjusting by the computing system, the control logic for depositing at least the following layer, comprises:

adjusting a further control logic for a further following layer.

Assignments (2)
SECURITY INTEREST Recorded Nov 30, 2023
From: NANOTRONICS IMAGING, INC.; NANOTRONICS HEALTH LLC; CUBEFABS INC.
To: ORBIMED ROYALTY & CREDIT OPPORTUNITIES IV, LP
Reel/Frame 065726/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 11, 2021
From: HOUGH, FABIAN; PUTMAN, JOHN B.; PUTMAN, MATTHEW C.; PINSKIY, VADIM; LIMOGE, DAMAS; NIRMALESWARAN, ASWIN RAGHAV; NOURI GOOSHKI, SADEGH
To: NANOTRONICS IMAGING, INC.
Reel/Frame 055566/0026 →
Continuity (2)
Provisional Application 62898535 · Sep 10, 2019
Related Publication 20210069990A1 · Mar 11, 2021
Cited By (1)
US 12,449,792