IP Library Granted Patent US 11,656,429
Granted Patent B2
US 11,656,429 · App. 17/657,815 · Granted May 23, 2023

Systems, devices, and methods for automatic microscopic focus

Inventors: John B. Putman (Celebration, FL); Matthew C. Putman (Brooklyn, NY); Julie Orlando (Akron, OH); Dylan Fashbaugh (Monmouth Junction, NJ)
Assignee: Nanotronics Imaging, Inc.
G02B7/285G02B21/02G02B21/06G02B21/244G06T7/80G02B21/26G02B21/365
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Quick Facts
Patent No.
US 11,656,429
App. No.
17/657,815
Granted
May 23, 2023
Kind
B2
Abstract

An automatic focus system for an optical microscope that facilitates faster focusing by using at least two cameras. The first camera can be positioned in a first image forming conjugate plane and receives light from a first illumination source that transmits light in a first wavelength range. The second camera can be positioned at an offset distance from the first image forming conjugate plane and receives light from a second illumination source that transmits light in a second wavelength range.

Claims (59)

1. A system for automatically focusing a microscope, comprising:

an imaging camera configured to capture an image of a specimen positioned on a stage;

an illumination unit comprising a focusing pattern configured to cause a target image to be projected on the specimen by light passing through the focusing pattern; and

an automatic focus system, the automatic focus system configured to automatically identify an in-focus plane of the specimen to be imaged, the automatic focus system comprising:

a first camera, configured for focusing, positioned on an image forming conjugate plane; and

a second camera set at an offset distance from the image forming conjugate plane.

2. The system of claim 1 , wherein the illumination unit comprises:

a primary illumination source that emits light in a first wavelength range, wherein the emitted light is received by the first camera; and

a secondary illumination source that emits light in a second wavelength range which is different from the first wavelength range, wherein the emitted light is received by the second camera.

3. The system of claim 1 , wherein the automatic focus system comprises:

a beam splitter configured to send a first portion of a focusing light beam to the first camera and a second portion of the focusing light beam to the second camera.

4. The system of claim 3 , wherein the automatic focus system comprises:

a mirror positioned at a distance directly above the beam splitter, the mirror configured to direct the focusing light beam from the beam splitter to the second camera.

5. The system of claim 3 , wherein the automatic focus system comprises:

a dichroic comprising a specific cut-off wavelength configured to reflect wavelengths of light emitted by the illumination unit.

6. The system of claim 1 , wherein the automatic focus system comprises:

a field diaphragm located in the illumination unit, the field diaphragm configured to control a diameter of light emitted by the illumination unit.

7. The system of claim 1 , wherein the automatic focus system comprises:

an objective.

8. The system of claim 7 , further comprising:

a fine focus actuator configured to fine focus the objective.

9. The system of claim 1 , wherein the automatic focus system comprises:

a cut-off filter configured to filter light emitted from the illumination unit.

10. A system for automatically focusing a microscope, comprising:

an imaging camera configured to capture an image of a specimen positioned on a stage;

an automatic focus system, the automatic focus system configured to automatically identify an in-focus plane of the specimen to be imaged, the automatic focus system comprising:

a first camera, configured for focusing, positioned on an image forming conjugate plane; and

a second camera positioned at an offset distance from the image forming conjugate plane; and

an illumination unit comprising:

a primary illumination source that emits light in a first wavelength range, wherein the emitted light is received by the first camera; and

a secondary illumination source that emits light in a second wavelength range which is different from the first wavelength range, wherein the emitted light is received by the second camera.

11. The system of claim 10 , wherein the automatic focus system comprises:

a beam splitter configured to send a first portion of a focusing light beam to the first camera and a second portion of the focusing light beam to the second camera.

12. The system of claim 11 , wherein the automatic focus system comprises:

a mirror positioned at a distance directly above the beam splitter, the mirror configured to direct the focusing light beam from the beam splitter to the second camera.

13. The system of claim 11 , wherein the automatic focus system comprises:

a dichroic comprising a specific cut-off wavelength configured to reflect wavelengths of light emitted by the illumination unit.

14. The system of claim 10 , wherein the illumination unit comprises:

a focusing pattern configured to cause a target image to be projected on the specimen by light passing through the focusing pattern.

15. The system of claim 10 , wherein the automatic focus system comprises:

a field diaphragm located in the illumination unit, the field diaphragm configured to control a diameter of light emitted by the illumination unit.

16. The system of claim 10 , wherein the automatic focus system comprises:

an objective.

17. The system of claim 16 , further comprising:

a fine focus actuator configured to fine focus the objective.

18. The system of claim 10 , wherein the automatic focus system comprises:

a cut-off filter configured to filter light emitted from the illumination unit.

19. The system of claim 10 , further comprising:

a control system configured to determine when the specimen is in focus.

20. A system for automatically focusing a microscope, comprising:

an imaging camera configured to capture an image of a specimen positioned on a stage;

an illumination unit; and

an automatic focus system, the automatic focus system configured to automatically identify an in-focus plane of the specimen to be imaged, the automatic focus system comprising:

a first camera, configured for focusing, positioned on an image forming conjugate plane,

a second camera set at an offset distance from the image forming conjugate plane,

a beam splitter configured to send a first portion of a focusing light beam to the first camera and a second portion of the focusing light beam to the second camera, and

at least one of:

a mirror positioned at a distance directly above the beam splitter, the mirror configured to direct the focusing light beam from the beam splitter to the second camera, or

a dichroic comprising a specific cut-off wavelength configured to reflect wavelengths of light emitted by the illumination unit.

Assignments (2)
SECURITY INTEREST Recorded Nov 30, 2023
From: NANOTRONICS IMAGING, INC.; NANOTRONICS HEALTH LLC; CUBEFABS INC.
To: ORBIMED ROYALTY & CREDIT OPPORTUNITIES IV, LP
Reel/Frame 065726/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 4, 2022
From: PUTMAN, JOHN B.; PUTMAN, MATTHEW C.; ORLANDO, JULIE; FASHBAUGH, DYLAN
To: NANOTRONICS IMAGING, INC.
Reel/Frame 059492/0662 →
Continuity (4)
Continuation 16715571 · Dec 16, 2019
Continuation 16275177 · Feb 13, 2019
Continuation 15920850 · Mar 14, 2018
Related Publication 20220229267A1 · Jul 21, 2022