IP Library Granted Patent US 11,293,863
Granted Patent B2
US 11,293,863 · App. 16/267,311 · Granted Apr 5, 2022

Robust interferometer and methods of using same

Inventors: Darryl J. Bornhop (Nashville, TN); Michael Kammer (Nashville, TN)
Assignee: Vanderbilt University
G01N21/45G01B9/02001G01N21/75G01N2021/458G01N2201/06113
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 11,293,863
App. No.
16/267,311
Granted
Apr 5, 2022
Kind
B2
Abstract

Provided are improved optical detection systems and methods for using same, which systems and methods comprise single channel interferometric detection systems and methods for determining a characteristic property of samples. Such interferometric detection systems and methods employ a light beam that impinges two or more discrete zones along a channel, thereby avoiding variations that can result in increases in detection limits and/or measurement errors.

Claims (31)

1. An interferometric detection system comprising:

(a) a microfluidic device having a channel formed therein, wherein the channel has a longitudinal direction and a transverse direction, and wherein the channel is configured for reception of two or more liquid samples by having at least two inlets positioned at opposing locations of the channel, and at least one outlet positioned at a point between the at least two inlets, thereby defining a right side of the channel on one side of the at least one outlet and a left side of the channel on another side of the at least one outlet;

(b) a light source for generating a light beam, wherein the light beam is elongated in the longitudinal direction of the channel, and wherein the light source is positioned to direct the light beam onto the channel such that the light beam is simultaneously incident on at least a portion of the right side of the channel and at least a portion of the left side of the channel, such that, during operation, scattered light is generated through reflective and refractive interaction of the light beam with a channel interface and the two or more samples, the scattered light comprising interference fringe patterns elongated in at least one direction, wherein the interference fringe patterns shift in response to changes in the refractive index of the two or more samples; and

(c) a photodetector for simultaneously receiving the scattered light and generating a plurality of intensity signals.

2. The interferometric detection system of claim 1 , further comprising at least one signal analyzer for receiving a plurality of intensity signals and determining therefrom one or more characteristic properties of the two or more samples.

3. The interferometric detection system of claim 1 , further comprising a plurality of reservoirs, wherein each of the plurality of reservoirs is in fluid communication with one of the at least two inlets.

4. The interferometric detection system of claim 1 , further comprising two or more samples, wherein at least one of the two or more samples comprises a reference.

5. The interferometric detection system of claim 1 , further comprising scattered light received by the photodetector, wherein the scattered light comprises backscattered light.

6. The interferometric detection system of claim 1 , wherein a single light beam is incident upon the channel.

7. The interferometric detection system of claim 1 , further comprising an optical element positioned between the light source and the channel, wherein the optical element is capable of at least one of spreading, splitting, rastering, or a combination thereof the light beam in a direction parallel to the length of the channel.

8. The interferometric detection system of claim 7 , wherein the optical element is capable of spreading the light beam in a direction parallel to the length of the channel.

9. The interferometric detection system of claim 1 , wherein the photodetector is capable of spatially resolving scattered light incident on a surface thereof.

10. The interferometric detection system of claim 1 , wherein a first discrete zone is disposed between a first inlet and the at least one outlet, and wherein a second discrete zone is disposed between a second inlet and the at least one outlet.

11. A method for determining a characteristic property of a sample comprising the steps of:

(a) providing a sample positioned inside the channel of the interferometric system of claim 1 ;

(b) interrogating the sample with the light beam, such that the light beam is incident on at least a portion of the channel, wherein a length of the incidence is greater than 8 mm in length along the longitudinal direction; and

(c) generating scattered light through reflective and refractive interaction of the light beam with a channel interface and the sample, the scattered light comprising interference fringe patterns elongated in at least one direction, wherein the interference fringe patterns shift in response to changes in the refractive index of the sample.

12. The method of claim 11 , further comprising the steps of receiving a plurality of intensity signals with a signal analyzer and determining therefrom one or more characteristic properties of the sample.

13. The method of claim 11 , wherein the light beam is incident on at least a portion of the channel, wherein a length of the incidence is greater than 10 mm in length along the longitudinal direction.

14. The method of claim 11 , wherein the scattered light is backscattered light.

15. A method for determining a characteristic property of a sample comprising the steps of:

(a) providing the interferometric detection system of claim 1 ;

(b) introducing a first sample into the left side of the channel;

(c) introducing a second sample into the right side of the channel;

(d) simultaneously interrogating the samples with the light beam; and

(e) generating scattered light through reflective and refractive interaction of the light beam with a channel interface and the samples, the scattered light comprising interference fringe patterns elongated in at least one direction, wherein the interference fringe patterns shift in response to changes in the refractive index of the sample.

16. The method of claim 15 , further comprising the steps of receiving a plurality of intensity signals with a signal analyzer and determining therefrom one or more characteristic properties of at least one of the samples.

17. The method of claim 15 , wherein the light beam is incident on at least a portion of the channel, wherein a length of the incidence is greater than 4 mm in length along the longitudinal direction.

18. The method of claim 15 , wherein the scattered light is backscattered light.

19. The method of claim 15 , wherein the light beam is incident on at least a portion of the channel, wherein a length of the incidence is greater than 8 mm in length along the longitudinal direction.

20. The method of claim 15 , wherein the first and second samples are introduced substantially simultaneously.

Assignments (4)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 28, 2025
From: BORNHOP, DARRYL
To: FREESRF HOLDINGS LLC
Reel/Frame 070664/0713 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 28, 2025
From: KAMER, MICHAEL, PHD
To: FREESRF HOLDINGS LLC
Reel/Frame 070667/0416 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 10, 2025
From: VANDERBILT UNIVERSITY
To: BORNHOP, DARRYL; KAMMER, MICHAEL
Reel/Frame 070168/0411 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 22, 2021
From: BORNHOP, DARRYL J.; KAMMER, MICHAEL
To: VANDERBILT UNIVERSITY
Reel/Frame 057557/0345 →
Continuity (4)
Continuation 15199417 · Jun 30, 2016
Continuation PCTUS2016014439 · Jan 22, 2016
Provisional Application 62107308 · Jan 23, 2015
Related Publication 20190178795A1 · Jun 13, 2019