IP Library Granted Patent US 10,886,444
Granted Patent B2
US 10,886,444 · App. 16/268,670 · Granted Jan 5, 2021

Solid state optoelectronic device with preformed metal support substrate

Inventor: Vladimir Odnoblyudov (Danville, CA)
Assignee: Micron Technology, Inc.
H01L33/62H01L27/156H01L33/0093H01L2224/48091H01L2224/73265H01L2924/12044
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Quick Facts
Patent No.
US 10,886,444
App. No.
16/268,670
Granted
Jan 5, 2021
Kind
B2
Abstract

A wafer-level process for manufacturing solid state lighting (“SSL”) devices using large-diameter preformed metal substrates is disclosed. A light emitting structure is formed on a growth substrate, and a preformed metal substrate is bonded to the light emitting structure opposite the growth substrate. The preformed metal substrate can be bonded to the light emitting structure via a metal-metal bond, such as a copper-copper bond, or with an inter-metallic compound bond.

Claims (31)

1. A method of manufacturing a solid state lighting (“SSL”) device, the method comprising:

providing a light emitting structure having a first semiconductor material, a second semiconductor material, and an active region between the first and second semiconductor materials;

forming a metal bonding structure on the light emitting structure;

bonding a preformed metal substrate to the metal bonding structure at a first temperature; and

debonding the preformed metal substrate from a temporary carrier at a second temperature, wherein the second temperature is higher than the second temperature.

2. The method of claim 1 , further comprising:

growing the light emitting structure on a growth substrate, and

removing the growth substrate from the light emitting structure by at least one of grinding, post-grinding, wet etching, or dry etching.

3. The method of claim 2 , wherein the growth substrate is removed after the metal bonding structure is formed.

4. The method of claim 1 , wherein the light emitting structure extends continuously over a surface of the preformed metal substrate.

5. The method of claim 1 , further comprising forming an inter-metallic compound (“IMC”) bond between the preformed metal substrate and the metal bonding structure.

6. The method of claim 5 , wherein the IMC bond includes a first boundary region proximate the preformed metal substrate, a second boundary region proximate the light emitting structure, and a median region between the first and second boundary regions.

7. The method of claim 1 , wherein the preformed metal substrate includes a metal blank.

8. The method of claim 1 , wherein the preformed metal substrate includes a metal plate.

9. The method of claim 1 , wherein the preformed metal substrate has a thickness sufficient to inhibit bowing of the light emitting structure.

10. The method of claim 1 , wherein the preformed metal substrate includes an elemental metal.

11. The method of claim 1 , wherein the preformed metal substrate includes an alloy of different metals.

12. The method of claim 1 , further comprising forming an electrode electrically coupled to the first semiconductor material.

13. The method of claim 1 , further comprising using a portion of the preformed metal substrate to form an electrode lead electrically coupled to the first semiconductor material.

14. The method of claim 1 , further comprising bonding the preformed metal substrate to the metal bonding structure using a metal-metal bond.

15. The method of claim 14 , wherein the metal-metal bond includes a copper-copper bond.

16. The method of claim 14 , wherein the metal-metal bond includes a temporary liquid phase (“TLP”) bond.

17. A method of manufacturing a semiconductor wafer, the method comprising:

forming a metal bonding structure on a light emitting structure having a first semiconductor material, a second semiconductor material, and an active region between the first and second semiconductor materials;

bonding a preformed metal substrate to the metal bonding structure at a first temperature, wherein the preformed metal substrate has a thickness sufficient to inhibit bowing of the light emitting structure and is attached to a temporary carrier before being bonded to the metal bonding structure; and

debonding the preformed metal substrate and the temporary carrier at a second temperature, wherein the second temperature is higher than the second temperature.

18. The method of claim 17 , wherein the light emitting structure extends continuously over a surface of the preformed metal substrate.

19. The method of claim 17 , further comprising:

growing the light emitting structure on a growth substrate, and

after forming the metal bonding structure on the light emitting structure, removing the growth structure from the light emitting structure by at least one of grinding, post-grinding, wet etching, or dry etching.

20. The method of claim 17 , further comprising attaching the preformed metal substrate to a temporary carrier with an adhesive before bonding the preformed metal substrate to the metal bonding structure.

Assignments (5)
RELEASE OF SECURITY INTEREST Recorded Nov 15, 2019
From: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 051041/0317 →
RELEASE OF SECURITY INTEREST Recorded Oct 14, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 050724/0392 →
SUPPLEMENT NO. 12 TO PATENT SECURITY AGREEMENT Recorded Apr 19, 2019
From: MICRON TECHNOLOGY, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
Reel/Frame 048948/0677 →
SUPPLEMENT NO. 3 TO PATENT SECURITY AGREEMENT Recorded Apr 19, 2019
From: MICRON TECHNOLOGY, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 048951/0902 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 6, 2019
From: ODNOBLYUDOV, VLADIMIR
To: MICRON TECHNOLOGY, INC.
Reel/Frame 048248/0711 →