Voltage monitoring circuit with adjustable thresholds

1. A voltage monitoring circuit for monitoring an output voltage of a power supply device, which includes a voltage conversion part that converts an input voltage to the output voltage according to a difference between a feedback voltage based on the output voltage and a first reference voltage, comprising:

a threshold voltage generation circuit configured to generate a threshold voltage from the first reference voltage; and

a comparator configured to compare the threshold voltage with the feedback voltage,

wherein the threshold voltage generation circuit includes a first threshold voltage generation circuit and a second threshold voltage generation circuit,

wherein the first threshold voltage generation circuit includes a first D/A converter and a current mirror circuit, and is configured to:

generate a first threshold voltage;

change the first threshold voltage according to first digital data inputted to the first D/A converter; and

change an input current of the current mirror circuit according to the first digital data inputted to the first D/A converter,

wherein an output current of the current mirror circuit is approximately proportional to a value obtained by subtracting the first reference voltage from the first threshold voltage,

wherein the second threshold voltage generation circuit includes a second D/A converter, and is configured to:

generate a second threshold voltage smaller than the first threshold voltage; and

change the second threshold voltage according to second digital data inputted to the second D/A converter,

wherein the comparator includes a first comparator and a second comparator,

wherein the first comparator compares the first threshold voltage with the feedback voltage, and

wherein the second comparator compares the second threshold voltage with the feedback voltage.

2. The circuit of claim 1 , wherein the second threshold voltage generation circuit includes a voltage division circuit configured to generate the second threshold voltage which is a divided voltage of the first reference voltage, a voltage division ratio of the voltage division circuit being changed according to the second digital data inputted to the second D/A converter.

3. The circuit of claim 1 , wherein the threshold voltage generation circuit includes a third D/A converter and is configured to change the threshold voltage according to third digital data inputted to the third D/A converter.

4. The circuit of claim 1 , further comprising: a determination circuit configured to set a predetermined range based on a third reference voltage independent of a second reference voltage and to determine whether or not the second reference voltage falls within the predetermined range, the first reference voltage being generated from the second reference voltage.

5. The circuit of claim 4 , wherein the determination circuit includes a fourth D/A converter configured to generate an upper limit voltage corresponding to an upper limit of the predetermined range from the third reference voltage, and a fifth D/A converter configured to generate a lower limit voltage corresponding to a lower limit of the predetermined range from the third reference voltage, to change the upper limit voltage according to fourth digital data inputted to the fourth D/A converter, and to change the lower limit voltage according to fifth digital data inputted to the fifth D/A converter.

6. A semiconductor integrated circuit device, comprising: a reference voltage generation circuit configured to generate the first reference voltage; at least a part of the voltage conversion part; and the voltage monitoring circuit of claim 1 .

7. The device of claim 6 , wherein the reference voltage generation circuit includes a sixth D/A converter configured to generate the first reference voltage from a second reference voltage and to change the first reference voltage according to sixth digital data inputted to the sixth D/A converter.

8. The device of claim 6 , further comprising: a switch provided between the reference voltage generation circuit and the threshold voltage generation circuit.

9. A vehicle, comprising: the semiconductor integrated circuit device of claim 6 .

10. A voltage monitoring circuit for monitoring an output voltage of a power supply device, which includes a voltage conversion part that converts an input voltage to the output voltage according to a difference between a feedback voltage based on the output voltage and a first reference voltage, comprising:

a threshold voltage generation circuit configured to generate a threshold voltage from the first reference voltage; and

a comparator configured to compare the threshold voltage with the feedback voltage,

wherein the threshold voltage generation circuit includes a first threshold voltage generation circuit and a second threshold voltage generation circuit,

wherein the first threshold voltage generation circuit includes a first D/A converter, and is configured to:

generate a first threshold voltage; and

change the first threshold voltage according to first digital data inputted to the first D/A converter,

wherein the second threshold voltage generation circuit includes a second D/A converter and a voltage division circuit, and is configured to:

generate a second threshold voltage smaller than the first threshold voltage;

change the second threshold voltage according to second digital data inputted to the second D/A converter; and

generate the second threshold voltage which is a divided voltage of the first reference voltage, a voltage division ratio of the voltage division circuit being changed according to the second digital data inputted to the second D/A converter,

wherein the comparator includes a first comparator and a second comparator,

wherein the first comparator compares the first threshold voltage with the feedback voltage, and

wherein the second comparator compares the second threshold voltage with the feedback voltage.

11. The circuit of claim 10 , wherein the threshold voltage generation circuit includes a third D/A converter and is configured to change the threshold voltage according to third digital data inputted to the third D/A converter.

12. The circuit of claim 10 , further comprising:

a determination circuit configured to set a predetermined range based on a third reference voltage independent of a second reference voltage and to determine whether or not the second reference voltage falls within the predetermined range, the first reference voltage being generated from the second reference voltage.

13. The circuit of claim 12 , wherein the determination circuit includes a fourth D/A converter configured to generate an upper limit voltage corresponding to an upper limit of the predetermined range from the third reference voltage, and a fifth D/A converter configured to generate a lower limit voltage corresponding to a lower limit of the predetermined range from the third reference voltage, to change the upper limit voltage according to fourth digital data inputted to the fourth D/A converter, and to change the lower limit voltage according to fifth digital data inputted to the fifth D/A converter.

14. A semiconductor integrated circuit device, comprising:

a reference voltage generation circuit configured to generate the first reference voltage;

at least a part of the voltage conversion part; and

the voltage monitoring circuit of claim 10 .

15. The device of claim 14 , wherein the reference voltage generation circuit includes a sixth D/A converter configured to generate the first reference voltage from a second reference voltage and to change the first reference voltage according to sixth digital data inputted to the sixth D/A converter.

16. The device of claim 14 , further comprising:

a switch provided between the reference voltage generation circuit and the threshold voltage generation circuit.

17. A vehicle, comprising:

the semiconductor integrated circuit device of claim 14 .