Systems and methods for fixing X-pessimism from uninitialized latches in gate-level simulation
A computer executable processing component analyzes unknown (X) propagation from uninitialized latches in gate-level simulation and determines if the Xs cause false Xs to be generated due to X-pessimism. For Xs generated due to X-pessimism, simulation results are corrected and fixes are generated. Corrected simulation results match real hardware behavior and greatly reduces engineers' analysis effort on debugging X issues. A computer executable processing component analyzes unknown (X) propagation from sequential cells in gate-level logic simulation and determines if the Xs cause false Xs to be generated due to X-pessimism. For Xs generated due to X-pessimism, simulation results are corrected and fixes are generated. Corrected simulation results match real hardware behavior and greatly reduces engineers' analysis effort on debugging X issues.
1. A method of identifying false Xs due to sequential cell modeling inaccuracy, comprising:
monitoring at least one input and at least one output of a sequential element;
if the at least one output changes from non-X to X, then:
replacing the Xs at the at least one input with 0 and 1 values;
replacing the Xs in states of the sequential element with 0 and 1 values; and
performing exhaustive logic combinations to simulate all combinations of 0 and 1 values for the Xs; and
if the exhaustive logic simulations produce a consistent value of non-X, then identifying the X as false and restore the output to the non-X value.
2. The method of claim 1 , wherein the monitoring of the at least one input comprises monitoring a clock input.
3. The method of claim 1 , further comprising:
monitoring all downstream flip-flop inputs and outputs.
4. The method of claim 1 , wherein monitoring at least one output of the sequential element comprises monitoring the output of a latch if the output of the latch is X at an initial circuit state time.
5. The method of claim 1 , wherein the sequential element comprises at least one of a flip-flop (FF) or a clock gater.
6. The method of claim 1 , wherein the exhaustive logic simulation is aborted early.
7. The method of claim 1 , wherein monitoring is performed during simulation.
8. A method of identifying false Xs due to sequential cell modeling inaccuracy, comprising:
monitoring at least one output of a sequential element;
if the at least one output changes from non-X to X, then:
replacing the Xs at the at least one input with 0 and 1 values;
replacing the Xs in states of the sequential element with 0 and 1 values; and
performing exhaustive logic combinations to simulate all combinations of 0 and 1 values for the Xs; and
if the exhaustive logic simulations produce a consistent value of non-X, then identifying the X as false and restore the output to the non-X value.
9. A system for identifying false Xs due to sequential cell modeling inaccuracy comprising:
a processor; and
a memory having executable instructions stored there on such that, when executed by the processor, result in the processor being configured to:
monitor at least one input and at least one output of a sequential element;
if the at least one output changes from non-X to X, then:
replace the Xs at the at least one input with 0 and 1 values;
replace the Xs in states of the sequential element with 0 and 1 values; and
perform exhaustive logic combinations to simulate all combinations of 0 and 1 values for the Xs; and
if the exhaustive logic simulations produce a consistent value of non-X, then identify the X as false and restore the output to the non-X value.
10. The system of claim 9 , wherein the processor being configured to monitor the at least one input comprises being configured to monitor a clock input.
11. The system of claim 9 , the processor being further configured to:
monitor all downstream flip-flop inputs and outputs.
12. The system of claim 9 , wherein the processor being configured to monitor at least one output of the sequential element comprises being configured to monitor the output of a latch if the output of the latch is X at an initial circuit state time.
13. The system of claim 9 , wherein the sequential element comprises at least one of a flip-flop (FF) or a clock gater.
14. The system of claim 9 , wherein the exhaustive logic simulation is aborted early.
15. The system of claim 9 , wherein the monitor the at least one input and the at least one output of the sequential element is configured to be performed during simulation.