Component inter-digitated VIAS and leads
Aspects of the present disclosure are directed to systems and methods to reduce inductance on an integrated circuit package of a memory sub-system. A memory sub-system is also hereinafter referred to as a “memory device.” An example of a memory sub-system is a storage system, such as a SSD, and can be embodied as an integrated circuit package, including but not limited to a pin grid array (PGA), and ball grid array (BGA).
1. A system comprising:
a substrate material; and
a plurality of memory components positioned upon the substrate material, each of the plurality of memory components comprising:
a package that supports an arrangement of a plurality of electrical contacts;
the plurality of electrical contacts comprising a set of power leads and a set of ground leads, the set of power-leads inter-digitated among the set of ground leads; and
the arrangement of the plurality of electrical contacts comprising paired groupings of electrical contacts that include at least a first paired grouping and a second paired grouping, each paired grouping including a power lead and a ground lead situated a first distance from one another, and wherein the first paired grouping is a second distance from the second paired grouping, the second distance being greater than the first distance.
2. The system of claim 1 , wherein the substrate material comprises a plurality of vias that correspond with each of the plurality of electrical contacts of the package, the plurality of vias including a set of power vias and a set of ground vias.
3. The system of claim 2 , wherein the arrangement of the plurality of electrical contacts is a first arrangement, the substrate material comprises a second arrangement of the plurality of vias, and the second arrangement of the plurality of vias comprises the set of power vias inter-digitated among the set of ground vias.
4. The system of claim 2 , wherein the arrangement of the plurality of electrical contacts is a first arrangement, the substrate material comprises a second arrangement of the plurality of vias, and the second arrangement of the plurality of vias includes pairs that comprise a power via and a ground via situated a threshold distance from one another, the threshold distance calculated to minimize an inductance value between the power lead and the ground lead.
5. The system of claim 1 , wherein the arrangement of the plurality of electrical contacts comprises:
a plurality of electrical contacts that comprise pairs of power leads and ground leads, the pairs of power leads and ground leads comprising at least a first pair; and
the first pair of electrical contacts comprising a power lead and a ground lead situated a threshold distance from one another upon the package, the threshold distance calculated to minimize an inductance value between the power lead and the ground lead.
6. The system of claim 1 , wherein the arrangement of the plurality of electrical contacts further comprises:
an alternating pattern that comprises a power lead from among the set of power leads and a ground lead from among the set of ground leads.
7. The system of claim 1 , wherein the package comprises a ball grid array.
8. The system of claim 1 , wherein the plurality of electrical contacts include a ball-grid array.
9. The system of claim 1 , wherein the plurality of electrical contacts include a pin-grid array.