Virtual metrology system and method
A virtual metrology system at least includes a process apparatus including a set of process data, the process apparatus producing a workpiece according to the set of process data. A virtual metrology server is configured to gather the set of process data, cluster the set of process data to obtain data clusters, and compare the data clusters with patterns. If the data clusters meet the patterns corresponding to the data clusters, performing a corresponding maintenance, repair, and overhaul step on the process apparatus.
1. A virtual metrology system at least comprising:
a process apparatus comprising a set of process data, the process apparatus producing a workpiece according to the set of process data; and
a virtual metrology server configured to gather the set of process data, cluster the set of process data to obtain data clusters, and compare the data clusters with patterns, wherein
if the data clusters meet the patterns corresponding to the data clusters, performing a corresponding maintenance, repair, and overhaul step on the process apparatus.
2. The virtual metrology system as recited in claim 1 , wherein one of the patterns is a maintenance pattern, and if the maintenance pattern is met, the corresponding maintenance, repair, and overhaul step is a maintenance step performed on the process apparatus.
3. The virtual metrology system as recited in claim 1 , wherein one of the patterns is a parts-replacing pattern, and if the parts-replacing pattern is met, the corresponding maintenance, repair, and overhaul step is a parts-replacing step performed on the process apparatus.
4. The virtual metrology system as recited in claim 1 , wherein each of the data clusters is defined by a set of coefficients comprising of mean coefficients, each mean coefficients of the set of coefficients is respectively multiplied by a corresponding value of the set of process data to obtain individual values and the individual values are summed together to calculate a conjectured value, and each of the patterns corresponds respectively to the set of coefficients and a predetermined value,
wherein the data clusters meet the patterns corresponding to the data clusters is determined by comparing the conjectured value of the data clusters with the predetermined value corresponding respectively to the patterns.