X-ray inspection device and method for determining degree of consumption of target of X-ray tube in X-ray inspection device
An X-ray inspection device comprises: an X-ray tube configured to cause an electron beam to collide with a target, thereby generating an X-ray; an X-ray detector configured to detect the X-ray having been output from the X-ray tube and having been transmitted through an inspection target object; a measurement section configured to detect the X-ray output from the X-ray tube for a predetermined period by the X-ray detector to detect an X-ray amount in the predetermined period, thereby measuring a maximum value Imax and a minimum value Imin of the X-ray amount in the predetermined period; and a calculation section configured to calculate an X-ray amount fluctuation rate by using the maximum value Imax and the minimum value Imin of the X-ray amount measured by the measurement section.
1. An X-ray inspection device comprising:
an X-ray tube configured to cause an electron beam to collide with a target, thereby generating an X-ray;
an X-ray detector configured to detect the X-ray having been output from the X-ray tube and having been transmitted through an inspection target object;
a measurement section configured to detect the X-ray output from the X-ray tube for a predetermined period by the X-ray detector to detect an X-ray amount in the predetermined period, thereby measuring a maximum value Imax and a minimum value Imin of the X-ray amount in the predetermined period; and
a calculation section configured to calculate an X-ray amount fluctuation rate by using the maximum value Imax and the minimum value Imin of the X-ray amount measured by the measurement section.
2. The X-ray inspection device according to claim 1 , further comprising:
a fluctuation rate display section configured to display the X-ray amount fluctuation rate calculated by the calculation section.
3. The X-ray inspection device according to claim 1 , further comprising:
a determination section configured to determine that the target is consumed when the X-ray amount fluctuation rate calculated by the calculation section exceeds a preset threshold.
4. The X-ray inspection device according to claim 1 , wherein
the calculation section calculates the X-ray amount fluctuation rate based on [(Imax−Imin)/Imax].
5. The X-ray inspection device according to claim 1 , wherein
the calculation section calculates the X-ray amount fluctuation rate based on [Imin/Imax].
6. The X-ray inspection device according to claim 1 , wherein
the measurement section measures the maximum value Imax and the minimum value Imin of the X-ray amount as an average of detection values obtained in a certain area of the X-ray detector.
7. The X-ray inspection device according to claim 1 , wherein
the measurement section measures the maximum value Imax and the minimum value Imin of the X-ray amount as a peak value in distribution of detection values obtained in a certain area of the X-ray detector.
8. A method for determining a degree of consumption of a target of an X-ray tube in an X-ray inspection device for determining the degree of consumption of the target, the X-ray inspection device including the X-ray tube configured to cause an electron beam to collide with the target to generate an X-ray and an X-ray detector configured to detect the X-ray having been output from the X-ray tube and having been transmitted through an inspection target object, including the step of:
detecting the X-ray output from the X-ray tube for a predetermined period by the X-ray detector to detect an X-ray amount in the predetermined period, thereby measuring a maximum value Imax and a minimum value Imin of the X-ray amount in the predetermined period;
calculating an X-ray amount fluctuation rate by using the maximum value Imax and the minimum value Imin of the X-ray amount; and
determining the degree of consumption of the target from the X-ray amount fluctuation rate.
9. The method according to claim 8 , further including the step of:
displaying the X-ray amount fluctuation rate calculated.
10. The method according to claim 8 , wherein
the step of determining determines that the target is consumed when the X-ray amount fluctuation rate calculated exceeds a preset threshold.
11. The method according to claim 8 , wherein
the step of calculating calculates the X-ray amount fluctuation rate based on [(Imax−Imin)/Imax].
12. The method according to claim 8 , wherein
the step of calculating calculates the X-ray amount fluctuation rate based on [Imin/Imax].
13. The method according to claim 8 , wherein
the step of detecting measures the maximum value Imax and the minimum value Imin of the X-ray amount as an average of detection values obtained in a certain area of the X-ray detector.
14. The method according to claim 8 , wherein
the step of detecting measures the maximum value Imax and the minimum value Imin of the X-ray amount as a peak value in distribution of detection values obtained in a certain area of the X-ray detector.