Particle beam monitoring systems and methods
View Patent ↗Presented systems and methods facilitate efficient and effective monitoring of particle beams. In some embodiments, a system comprises a primary particle beam generator that generates a primary particle beam, and a monitoring component that monitors the primary particle beam. The monitoring component comprises: a reaction component that is impacted by the primary particle beam, wherein results of an impact include creation of secondary photons; a detection component that detects a characteristic of the secondary photons; and a primary particle beam characteristic determination component that determines a characteristic of the primary particle beam based upon the characteristic of the secondary photons. The characteristic of the primary particle beam can include a radiation dose measurement and dose rate. The reaction component can include a foil component. A resolution time of less than a nano second can be associated with detecting the secondary photon characteristic.
1. A particle beam monitoring device comprising:
a reaction component configured to allow a primary particle beam to pass through the reaction component while creating secondary photons, wherein structural characteristics of the reaction component are balanced with energy loss characteristics of the reaction component, including selecting a thickness of the reaction component, wherein energy loss characteristics are based upon a comparison of energy of the primary particle beam before penetrating the reaction component and after penetrating the reaction component;
a detection component that detects a characteristic of a portion of the plurality of secondary photons; and
a primary particle beam characteristic determination component that correlates a characteristic of the secondary photons with a characteristic of the primary particle beam.
2. The particle beam monitoring device of claim 1 wherein a dimension of the reaction component is selected based upon low energy loss characteristics associated with thin dimensions balanced with thick dimension structural integrity characteristics.
3. The particle beam monitoring device of claim 1 wherein the thickness of the reaction component is reduced down to be as thin as possible while still maintaining thickness sufficient enough to maintain structural integrity.
4. The particle beam monitoring device of claim 3 wherein a thin reaction component is one in which there is a small percentage energy loss associated with penetrating the reaction component as compared to the energy of the primary particle beam received by the particle beam monitoring device.
5. The particle beam monitoring device of claim 1 wherein the thickness of the reaction component is in the range of tenths of millimeters and below.
6. The particle beam monitoring device of claim 1 wherein the amount of energy loss is in the range of 0.5 percent to 5 percent.
7. The particle beam monitoring device of claim 1 wherein the reaction component is configured with substantially constant thickness so that there is relatively constant reaction cross-sections.
8. The particle beam monitoring device of claim 1 wherein particle beams impinging on a reaction component of a first material create characteristic x-rays associated with material composites in the reaction component by Coulomb interactions and electron rearrangement.
9. The particle beam monitoring device of claim 1 wherein particle beams impinging on a reaction component of a second material create gamma rays that are emitted isotropically from interaction points in the reaction component.
10. A particle beam monitoring device comprising:
an analysis component that analyzes a primary particle beam compliance with a treatment plan, including correlating a characteristic of secondary photons with a characteristic of the primary particle beam;
a detection component that detects the characteristic of the secondary photons; and
a reaction component configured to emit the secondary photons and permit a primary particle beam to penetrate the reaction component towards target tissue associated with the treatment plan.
11. The particle beam monitoring device of claim 10 wherein the analysis component generates particle beam current and particle beam charge information based upon input from the detection component, wherein the particle beam current and particle beam charge information are used to draw a correlation with a dose rate and dose amount.
12. The particle beam monitoring device of claim 10 wherein the detection component includes spatial resolution features that are position sensitive.
13. The particle beam monitoring device of claim 10 wherein the detection component is used to determine an interaction point on the reaction component.
14. The particle beam monitoring device of claim 10 wherein a detected emission point of radiation is a measured beam position that is converted to the beam position at the isocenter of the device.
15. The particle beam monitoring device of claim 10 wherein the detection component includes a gamma camera.
16. The particle beam monitoring device of claim 10 wherein the detection component includes a slit camera.
17. The particle beam monitoring device of claim 10 wherein the detection component is position sensitive and senses an indication of the location of the primary particle beam impingement of interaction on foil of the reaction component.
18. The particle beam monitoring device of claim 10 wherein the detection component has an established geometry to the reaction component and is able to resolve locations of interaction points on the reaction component.
19. The particle beam monitoring device of claim 10 wherein the primary particle beam moves to different interaction points on a reaction component that correspond to locations where the primary particle beam moves to or hits.
20. The particle beam monitoring device of claim 19 wherein a sequence of images or patterns is created based on indications of the primary particle beam locations.
21. The particle beam monitoring device of claim 10 wherein confirming compliance that primary particle beam locations or patterns correspond to treatment plans is used for quality assurance and safety compliance.