Test device for a TO-CAN laser and test system for a TO-CAN laser
A test device for a TO-CAN laser includes a test socket, a coaxial waveguide substrate, and a test printed circuit board (PCB). The test socket comprises a coaxial waveguide tube accommodating a signal output pin of the TO-CAN laser and an electric-conducting slot accommodating a signal input pin of the TO-CAN laser. The coaxial waveguide substrate is respectively connected with a coaxial waveguide pin of the test PCB and the coaxial waveguide tube of the test socket. An electric-conducting slot pin of the test socket is connected with corresponding control pins of the test PCB.
1. A test device for a TO-CAN laser, comprising:
a test socket;
a coaxial waveguide substrate; and
a test printed circuit board (PCB);
wherein the test socket comprises a coaxial waveguide tube accommodating a signal output pin of the TO-CAN laser and an electric-conducting slot accommodating a signal input pin of the TO-CAN laser; the coaxial waveguide substrate is connected with a coaxial waveguide pin of the test PCB and the coaxial waveguide tube of the test socket; an electric-conducting slot pin of the test socket is connected with corresponding control pins of the test PCB.
2. The test device according to claim 1 , wherein the coaxial waveguide substrate is a copper substrate.
3. The test device according to claim 1 , wherein the coaxial waveguide substrate further comprises a radio frequency (RF) ground pin, the RF ground pin is connected with a first ground pin of the test PCB.
4. The test device according to claim 2 , wherein the coaxial waveguide substrate further comprises a radio frequency (RF) ground pin, the RF ground pin is connected with a first ground pin of the test PCB.
5. The test device according to claim 1 , wherein the test socket comprises a socket barrel; an end face of the socket barrel, defining a first through hole, acting as an opening of the coaxial waveguide tube, and a second through hole acting as a slot opening of the electric-conducting slot; the coaxial waveguide tube and the electric-conducting slot are arranged inside the socket barrel.
6. The test device according to claim 2 , wherein the test socket comprises a socket barrel; an end face of the socket barrel, defining a first through hole, acting as an opening of the coaxial waveguide tube, and a second through hole acting as a slot opening of the electric-conducting slot; the coaxial waveguide tube and the electric-conducting slot are arranged inside the socket barrel.
7. The test device according to claim 1 , wherein the test PCB comprises a main control processing circuit, the coaxial waveguide pin and a plurality of the control pins are connected with the main control processing circuit respectively.
8. The test device according to claim 1 , wherein the control pins comprise a laser diode (LD) control pin, a thermo electric cooler (TEC) control pin and a second ground (GND) pin; the coaxial waveguide pin is a photo-diode (PD) control pin.
9. A test system for the TO-CAN laser, comprising a test device and a test platform; wherein the test device comprises a test socket, a coaxial waveguide substrate, and a test PCB; the test socket comprises a coaxial waveguide tube accommodating a signal output pin of the TO-CAN laser and an electric-conducting slot accommodating a signal input pin of the TO-CAN laser; the coaxial waveguide substrate is connected with a coaxial waveguide pin of the test PCB and the coaxial waveguide tube of the test socket; an electric-conducting slot pin of the test socket is connected with corresponding control pins of the test PCB; the test platform acquires a text information of the TO-CAN laser from the test device and displays the test information.
10. The test system according to claim 9 , wherein the test information comprises one or more of a wavelength information of the TO-CAN laser, a threshold current information of the TO-CAN laser, an operating current information of the TO-CAN laser, and a monitoring current information of the TO-CAN laser.
11. The test system according to claim 9 , wherein the coaxial waveguide substrate is a copper substrate.
12. The test system according to claim 9 , wherein the coaxial waveguide substrate further comprises a RF ground pin, the RF ground pin is connected with a first ground pin of the test PCB.
13. The test system according to claim 11 , wherein the coaxial waveguide substrate further comprises a RF ground pin, the RF ground pin is connected with a first ground pin of the test PCB.
14. The test system according to claim 9 , wherein the test socket comprises a socket barrel; an end face of the socket barrel, defining a first through hole, acting as an opening of the coaxial waveguide tube, and a second through hole acting as a slot opening of the electric-conducting slot; the coaxial waveguide tube and the electric-conducting slot are arranged inside the socket barrel.
15. The test system according to claim 11 , wherein the test socket comprises a socket barrel; an end face of the socket barrel, defining a first through hole, acting as an opening of the coaxial waveguide tube, and a second through hole acting as a slot opening of the electric-conducting slot; the coaxial waveguide tube and the electric-conducting slot are arranged inside the socket barrel.
16. The test system according to claim 9 , wherein the test PCB comprises a main control processing circuit, the coaxial waveguide pin and a plurality of the control pins are connected with the main control processing circuit respectively.
17. The test system according to claim 9 , wherein the control pins comprise an LD control pin, a TEC control pin and a second GND pin; the coaxial waveguide pin is a photo-diode (PD) control pin.