IP Library › Granted Patent US 10,794,688
Granted Patent B2
US 10,794,688 · App. 16/293,027 · Granted Oct 6, 2020

Optical interference measuring device

Inventors: Ken Motohashi (Eindhoven, NL); Johannes Anna Quaedackers (Veldhoven, NL); Adriaan Tiemen Zuiderweg (Breda, NL)
Assignee: MITUTOYO CORPORATION
G01B11/2441G01B9/0209G01B9/02083
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Quick Facts
Patent No.
US 10,794,688
App. No.
16/293,027
Granted
Oct 6, 2020
Kind
B2
Abstract

An interferometric optical device that measures the curved wall shape of a cylindrical object and includes: an interferometric optical system that emits measurement light at the curved wall of the object, collects the light reflected by the object, and creates a composite wave that combines the reflected light and a reference light; a rotation drive assembly that is connected to the interferometric optical system and rotationally displaces the interferometric optical system centered about a rotation axis that coincides with a center axis of the cylindrical shape of the object; a sensor that acquires a two-dimensional distribution of the intensity of the composite wave using a plurality of photoreceptor elements arrayed two-dimensionally; and a computation device that computes the internal wall shape of the object based on the plurality of two-dimensional distributions acquired in a state where a rotation angle for the rotation drive mechanism varies.

Claims (31)

1. An interferometric optical device for measuring a curved wall shape of a cylindrical object and comprising:

an interferometric optical system that emits measurement light at an interior wall of the object, collects the light reflected by the object, and creates a composite wave that combines the reflected light and a reference light beam from a reference mirror, wherein the interferometric optical system includes:

a beam splitter that splits incident light into the reference light and the measurement light, and that outputs a composite wave that includes the recombined light beams that have separately traversed a reference light path or have been reflected from the object; and

a reference mirror provided on the reference light path and that reflects the reference light beam, wherein the reference mirror is tilted with respect to an optical axis of the reference light, with a direction parallel to the optical axis of the measurement light as an axis of inclination;

a rotation drive assembly that is connected to the interferometric optical system and that rotationally displaces the interferometric optical system centered about a rotation axis that coincides with a center axis of the cylindrical object;

a sensor that acquires a two-dimensional distribution of the intensity of the composite wave using a plurality of photoreceptor elements arrayed two-dimensionally; and

a computer comprising a processor and one or more memories that store a set of executable instructions such that the processor, when executing the set of executable instructions, causes the computer to compute the internal wall shape of the object based on the plurality of two-dimensional distributions acquired in a state where a rotation angle for the rotation drive assembly varies.

2. The interferometric optical device according to claim 1 , wherein the interferometric optical device rotationally displaces the interferometric optical system by a predetermined rotation angle unit each time using the rotation drive assembly while keeping a distance of the interferometric optical system from the rotation axis constant, and acquires the two-dimensional distribution for each rotation angle using the sensor.

3. The interferometric optical device according to claim 1 , wherein the reference mirror has a reflecting surface of either a concave or convex partial cylindrical shape.

4. The interferometric optical device according to claim 3 , wherein the reflecting surface of the reference mirror has a variable curvature.

5. The interferometric optical device according to claim 1 , wherein the interferometric optical system is arranged such that a straight line extending along the optical axis of the measurement light emitted at the interior wall of the object does not pass through the rotation axis.

6. The interferometric optical device according to claim 1 , further comprising an axis direction drive assembly that displaces the interferometric optical system in a direction along the rotation axis, wherein:

the interferometric optical system is displaceable in a spiral shape, and

the two-dimensional distribution is acquired at each position along the spiral while using a position sensor.

7. The interferometric optical device according to claim 1 , wherein the device is equipped with a plurality of the interferometric optical systems each having a mutually different position in a direction about the rotation axis.

8. The interferometric optical device according to claim 1 , further comprising a radial direction drive assembly operably connected to the interferometric optical system and which displaces the interferometric optical system in a radial direction orthogonal to the rotation axis.

9. The interferometric optical device according to claim 1 , further comprising a radial direction drive assembly operably connected to the interferometric optical system, wherein the radial direction drive assembly does not displace the interferometric optical system in a radial direction orthogonal to the rotation axis.

10. An interferometric optical device for measuring a curved wall shape of a cylindrical object and comprising:

an interferometric optical system that emits measurement light at an interior wall of the object, collects the light reflected by the object, and creates a composite wave that combines the reflected light and a reference light beam from a reference mirror;

a rotation drive assembly that is connected to the interferometric optical system and that rotationally displaces the interferometric optical system centered about a rotation axis that coincides with a center axis of the cylindrical object;

a sensor that acquires a two-dimensional distribution of the intensity of the composite wave using a plurality of photoreceptor elements arrayed two-dimensionally; and

a computer comprising a processor and one or more memories that store a set of executable instructions such that the processor, when executing the set of executable instructions, causes the computer to compute the internal wall shape of the object based on the plurality of two-dimensional distributions acquired in a state where a rotation angle for the rotation drive assembly varies,

wherein the interferometric optical system is arranged such that a straight line extending along the optical axis of the measurement light emitted at the interior wall of the object does not pass through the rotation axis.

11. An interferometric optical device for measuring a curved wall shape of a cylindrical object and comprising:

an interferometric optical system that emits measurement light at an interior wall of the object, collects the light reflected by the object, and creates a composite wave that combines the reflected light and a reference light beam from a reference mirror;

a rotation drive assembly that is connected to the interferometric optical system and that rotationally displaces the interferometric optical system centered about a rotation axis that coincides with a center axis of the cylindrical object;

an axis direction drive assembly that displaces the interferometric optical system in a direction along the rotation axis;

a sensor that acquires a two-dimensional distribution of the intensity of the composite wave using a plurality of photoreceptor elements arrayed two-dimensionally; and

a computer comprising a processor and one or more memories that store a set of executable instructions such that the processor, when executing the set of executable instructions, causes the computer to compute the internal wall shape of the object based on the plurality of two-dimensional distributions acquired in a state where a rotation angle for the rotation drive assembly varies, wherein:

the interferometric optical system is displaceable in a spiral shape, and

the two-dimensional distribution is acquired at each position along the spiral while using a position sensor.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 5, 2019
From: MOTOHASHI, KEN; QUAEDACKERS, JOHANNES ANNA; ZUIDERWEG, ADRIAAN TIEMEN
To: MITUTOYO CORPORATION
Reel/Frame 049383/0458 →
Priority Claims (1)
JP 2018-040375 · Mar 7, 2018 · national
Continuity (1)
Related Publication 20190277628A1 · Sep 12, 2019