Thin film encapsulation structure of AMOLED and manufacturing method thereof
View Patent ↗A thin-film encapsulation structure of an active-matrix organic light-emitting, diode (AMOLED) is provided, and a touch electrode layer is disposed thereon. The thin-film encapsulation structure includes a first ceramic layer, an organic layer, and a second ceramic layer. The second ceramic layer has a first film layer and a second film layer; a side end of the second film layer is contracted inward so that a recessed first step portion is defined at the side end of the second film layer and a side end of the first film layer. The second ceramic layer is changed into a design of a multi-layer stacked structure, and a recessed step portion is formed at the side ends of the upper and lower layers. Therefore, the traces can be placed in a larger space and resistant to line breakage, thereby ensuring the yield and product performance.
1. A thin-film encapsulation structure of an active-matrix organic light-emitting diode (AMOLED), for disposing a touch electrode layer thereon, comprising:
a first ceramic layer, an organic layer, and a second ceramic layer, wherein the second ceramic layer has a first film layer and a second film layer;
wherein the second film layer is disposed on the first film layer, and a side end of the second film layer is contracted inward so that a recessed first step portion is defined at the side end of the second film layer and a side end of the first film layer,
wherein a third film layer is further disposed on the second film layer, and a recessed second step portion is defined at a side end of the third film layer and the side end of the second film layer
wherein the first step portion is extended outward the recessed second step portion by 30 μm to 80 μm.
2. The thin-film encapsulation structure of the AMOLED according to claim 1 , wherein a thickness of the first film layer is equal to a thickness of the second film layer.
3. The thin-film encapsulation structure of the AMOLED according to claim 1 , wherein a fourth film layer is further disposed on the third film layer, and a recessed third step portion is defined at a side end of the fourth film layer and the side end of the third film layer.
4. The thin-film encapsulation structure of the AMOLED according to claim 3 , wherein the recessed second step portion is extended outward the recessed third step portion by 30 μm to 80 μm.
5. The thin-film encapsulation structure of the AMOLED according to claim 3 , wherein a fifth film layer is further disposed on the fourth film layer, and a recessed fourth step portion is defined at a side end of the fifth film layer and the side end of the fourth film layer.
6. The thin-film encapsulation structure of the AMOLED according to claim 5 , wherein the recessed third step portion is extended outward the fourth step portion by 30 μm to 80 μm.
7. The thin-film encapsulation structure of the AMOLED according to claim 5 , wherein the first film layer, the second film layer, the third film layer, the fourth film layer and the fifth film layer have a same thickness; and wherein the thickness of the first film layer is less than a thickness of the touch electrode layer by 200 nm to 400 nm.
8. A thin-film encapsulation structure of an active-matrix organic light-emitting diode (AMOLED), for disposing a touch electrode layer thereon, comprising:
a first ceramic layer, an organic layer, and a second ceramic layer, wherein the second ceramic layer has a first film layer and a second film layer;
wherein the second film layer is disposed on the first film layer, and a side end of the second film layer is contracted inward so that a recessed first step portion is defined at the side end of the second film layer and a side end of the first film layer,
wherein a third film layer is further disposed on the second film layer, and a recessed second step portion is defined at a side end of the third film layer and the side end of the second film layer,
wherein a fourth film layer is further disposed on the third film layer, and a recessed third step portion is defined at a side end of the fourth film layer and the side end of the third film layer, and
wherein the recessed third step portion is extended outward the fourth step portion by 30 μm to 80 μm.
9. The thin-film encapsulation structure of the AMOLED according to claim 8 , wherein a thickness of the first film layer is equal to a thickness of the second film layer.
10. The thin-film encapsulation structure of the AMOLED according to claim 8 , wherein a fifth film layer is further disposed on the fourth film layer, and a recessed fourth step portion is defined at a side end of the fifth film layer and the side end of the fourth film layer.
11. The thin-film encapsulation structure of the AMOLED according to claim 10 , wherein the recessed third step portion is extended outward the fourth step portion by 30 μm to 80 μm.
12. The thin-film encapsulation structure of the AMOLED according to claim 10 , wherein the first film layer, the second film layer, the third film layer, the fourth film layer and the fifth film layer have a same thickness; and wherein the thickness of the first film layer is less than a thickness of the touch electrode layer by 200 nm to 400 nm.