Microparticle measurement device and cleaning method for microparticle measurement device
Provided is a microparticle measurement device including a light emission unit that emits light to a microparticle to be analyzed and a light detection unit that detects light generated from the microparticle at a predetermined detection position. The microparticle measurement device further includes an analysis unit that is connected to the light detection unit and analyzes a detection value of the light detected by the light detection unit. The light detection unit is movable from the detection position.
1. A microparticle measurement device, comprising:
a light emission unit configured to emit first light to a microparticle;
a light detection unit configured to detect, at a specific detection position, second light generated from the microparticle;
an analysis unit connected to the light detection unit, wherein
the analysis unit is configured to analyze a detection value of the second light detected by the light detection unit, and
the light detection unit is movable from the specific detection position; and
a rotational shaft portion connected to the light detection unit, wherein
the rotational shaft portion is configured to define a specific rotational axis, and
the light detection unit is rotatable around the specific rotational axis with respect to the specific detection position, wherein the light detection unit is movable from the specific detection position to clean the microparticle measurement device.
2. The microparticle measurement device according to claim 1 , wherein the light detection unit is a forward scattered light detection unit.
3. The microparticle measurement device according to claim 1 , wherein
the specific detection position faces the light emission unit interposing the microparticle, and
the specific detection position is a preset position such that the second light generated from the microparticle is detectable.
4. The microparticle measurement device according to claim 1 , wherein
the light detection unit is movable upward with respect to the specific detection position, and
the upward movement of the light detection unit is concurrent with the rotation of the light detection unit around the specific rotational axis.
5. The microparticle measurement device according to claim 1 , wherein the light detection unit is movable in at least one of a horizontal direction or a vertical direction with respect to the specific detection position.
6. The microparticle measurement device according to claim 1 , further comprising a housing that houses the light emission unit and the analysis unit,
wherein the light detection unit is completely separable from the housing.
7. The microparticle measurement device according to claim 1 , wherein the analysis unit is electrically connected to the light detection unit.
8. The microparticle measurement device according to claim 1 , wherein the light detection unit includes a light receiving element configured to receive the second light generated from the microparticle.
9. The microparticle measurement device according to claim 8 , wherein
the light detection unit further includes a light shielding portion between the light emission unit and the light receiving element, and
the light shielding portion is configured to shield a part of the second light generated from the microparticle.
10. The microparticle measurement device according to claim 1 , further comprising:
a housing that houses the light emission unit and the analysis unit; and
a cover detachable from the housing,
wherein the light detection unit is coverable by the cover.
11. A cleaning method for a microparticle measurement device, comprising:
moving a light detection unit from a specific detection position in the microparticle measurement device; and
cleaning the microparticle measurement device based on the movement of the light detection unit,
wherein the microparticle measurement device includes:
a light emission unit configured to emit first light to a microparticle;
the light detection unit configured to detect, at the specific detection position, second light generated from the microparticle;
an analysis unit connected to the light detection unit,
wherein the analysis unit is configured to analyze a detection value of the second light detected by the light detection unit; and
a rotational shaft portion connected to the light detection unit, wherein
the rotational shaft portion is configured to define a specific rotational axis, and
the light detection unit is rotatable around the specific rotational axis with respect to the specific detection position.