IP Library Granted Patent US 11,424,320
Granted Patent B2
US 11,424,320 · App. 16/313,272 · Granted Aug 23, 2022

P-type oxide semiconductor and method for manufacturing same

Inventors: Shizuo Fujita (Kyoto, JP); Kentaro Kaneko (Kyoto, JP); Toshimi Hitora (Kyoto, JP); Tomochika Tanikawa (Kyoto, JP)
Assignees: FLOSFIA INC.; KYOTO UNIVERSITY
H01L29/06H01L29/12H01L29/24H01L29/47H01L29/739H01L29/7391H01L29/778H01L29/78H01L29/808H01L29/812H01L29/872H01L33/02H01L33/26H02M3/28
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Quick Facts
Patent No.
US 11,424,320
App. No.
16/313,272
Granted
Aug 23, 2022
Kind
B2
Abstract

A new and useful p-type oxide semiconductor with a wide band gap and an enhanced electrical conductivity and the method of manufacturing the p-type oxide semiconductor are provided. A method of manufacturing a p-type oxide semiconductor including: generating atomized droplets by atomizing a raw material solution containing at least a d-block metal in the periodic table and a metal of Group 13 of the periodic table; carrying the atomized droplets onto a surface of a base by using a carrier gas; causing a thermal reaction of the atomized droplets adjacent to the surface of the base under an atmosphere of oxygen to form the p-type oxide semiconductor on the base.

Claims (12)

1. A semiconductor device comprising:

a p-type semiconductor layer comprising, as a first major component, a metal oxide, the metal oxide being a mixed crystal of an oxide of a Group 9 metal in a periodic table and gallium oxide;

an n-type semiconductor layer provided on the p-type semiconductor layer, the n-type semiconductor layer comprising, as a second major component, a crystalline oxide semiconductor that comprises at least gallium; and

an electrode; wherein the mixed crystal has a corundum structure; wherein the crystalline oxide semiconductor has a corundum structure.

2. The semiconductor device according to claim 1 , wherein the Group 9 metal is 10% or more in atomic ratio in the metal oxide except oxygen of the metal oxide.

3. A semiconductor system comprising:

the semiconductor device according to claim 2 .

4. The semiconductor device according to claim 1 , wherein the gallium is 5% or more in atomic ratio in the metal oxide except oxygen of the metal oxide.

5. A semiconductor system comprising:

the semiconductor device according to claim 4 .

6. A semiconductor system comprising:

the semiconductor device according to claim 1 .

Assignments (2)
CHANGE OF ASSIGNEE ADDRESS Recorded Jun 6, 2019
From: FLOSFIA INC.
To: FLOSFIA INC.
Reel/Frame 049393/0558 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 26, 2018
From: FUJITA, SHIZUO; KANEKO, KENTARO; HITORA, TOSHIMI; TANIKAWA, TOMOCHIKA
To: FLOSFIA INC.; KYOTO UNIVERSITY
Reel/Frame 047852/0950 →
Priority Claims (1)
JP JP2016-131156 · Jun 30, 2016 · national
Continuity (1)
Related Publication 20190157380A1 · May 23, 2019