Integrated lens free imaging device

1. A lens-free imaging device for imaging a sample, the lens-free imaging device comprising:

an imaging region; and

a radiation guiding structure proximate the imaging region and configured to receive an incoming radiation wave, the radiation guiding structure comprising:

first and second parallel surfaces configured to confine and propagate the incoming radiation wave in a direction parallel to the first surface and the second surface via total internal reflection of the incoming radiation wave by the first surface and the second surface; and

at least one perturbation on the first surface, wherein the at least one perturbation is configured to direct a first radiation wave towards a sample measurement region proximate the first surface, and to direct a second radiation wave towards the imaging region,

wherein when a sample is in the sample measurement region, the sample scatters and reflects the first radiation wave towards the imaging region, wherein the scattered and reflected wave is at least partly captured in the imaging region and is combinable with the second radiation wave for forming an image.

2. The lens-free imaging device according to claim 1 ,

wherein both the radiation guiding structure and the imaging region are integrated in a chip, and

wherein the radiation guiding structure is configured to direct the second radiation wave within the chip toward the imaging region.

3. The lens-free imaging device according to claim 1 , further comprising a sample holder for holding the sample in the sample measurement region, wherein the radiation guiding structure and the sample holder are positioned such that, during operation, when a sample is placed in the sample holder, the scattered first radiation wave and the second radiation wave both impinge on the imaging region.

4. The lens-free imaging device according to claim 1 , further comprising a shielding configured to shield the sample measurement region from external radiation.

5. The lens-free imaging device according to claim 1 ,

wherein the radiation guiding structure comprises a waveguide for guiding a confined radiation wave,

wherein the waveguide comprises a diffracting element, and

wherein the diffracting element is configured to redirect a portion of the confined radiation wave in a first direction resulting in the first radiation wave and redirect another portion of the confined radiation wave in a second direction resulting in the second radiation wave.

6. The lens-free imaging device according to claim 5 ,

wherein the diffracting element is a grating coupler adapted for directing the first radiation wave at a front side of the grating coupler and for directing the second radiation wave at a back side of the grating coupler, and

wherein the front side and the back side are opposite sides of the grating coupler.

7. The lens-free imaging device according to claim 1 ,

wherein the radiation guiding structure is a waveguide comprising a first diffracting element and a second diffracting element,

wherein the first diffracting element is configured to diffract a portion of a confined radiation wave in a first direction resulting in the first radiation wave, and

wherein the second diffracting element is configured to diffract another portion of the confined radiation wave in a second direction resulting in the second radiation wave.

8. The lens-free imaging device according to claim 1 , further comprising a radiation source providing a coherent incoming radiation wave, for coupling radiation into the radiation guiding structure.

9. The lens-free imaging device according to claim 1 , wherein the direction in which the first radiation wave is directed and the direction in which the second radiation wave is directed are substantially opposite with respect to the direction of a confined radiation wave.

10. The lens-free imaging device according to claim 1 , further comprising a pass-through waveguide or a slab waveguide, wherein the pass-through waveguide or the slab waveguide is configured to guide the first radiation wave toward the imaging region.

11. The lens-free imaging device according to claim 1 , further comprising a processing device for processing data obtainable from the imaging region.

12. A method for imaging a sample, the method comprising:

positioning the sample in front of a lens-free imaging device,

receiving an incoming radiation wave in a radiation guiding structure, thereby obtaining a confined radiation wave in the radiation guiding structure by total internal reflection at a first surface and a second parallel surface of the radiation guiding structure resulting in an overall propagation of the confined radiation wave in a direction parallel with both the first surface and the second surface;

generating, via at least one perturbation on the first surface and from the confined radiation wave, a first radiation wave and a second radiation wave such that the first radiation wave propagates toward the first surface and the second radiation wave propagates toward the second surface,

wherein the first radiation wave is directed out of the radiation guiding structure to a sample measurement region that allows interaction between the first radiation wave and the sample when positioned in the sample measurement region, and

wherein the second radiation wave is directed toward an imaging region;

capturing, at least partly, the first radiation wave in the imaging region; and

combining the first radiation wave and the second radiation wave in the imaging region an image.

13. The lens-free imaging device according to claim 1 ,

wherein the lens-free imaging device is a component of a diagnostic device for diagnosing a status of an object or a patient,

wherein the lens-free imaging device is configured to determine a quality or quantity of particles in a flow of a sample of the object or the patient, and

wherein the diagnostic device comprises an output device configured to provide an output of the lens-free imaging device on which a diagnosis can be based.

14. An industrial inspection device for inspecting objects, the industrial inspection device comprising:

a lens-free imaging device configured to inspect an object or a flow of objects; and

an output device for providing an output of the lens-free imaging device for characterizing the object or the flow of objects,

wherein the lens-free imaging device comprises:

an imaging region; and

a radiation guiding structure proximate the imaging region and configured to receive an incoming radiation wave, the radiation guiding structure comprising

first and second parallel surfaces configured to confine and propagate the incoming radiation wave in a direction parallel to the first surface and the second surface via total internal reflection of the incoming radiation wave by the first surface and the second surface; and

at least one perturbation on the first surface, wherein the at least one perturbation is configured to direct a first radiation wave towards a sample measurement region proximate the first surface, and to direct a second radiation wave towards the imaging region,

wherein when a sample is in the sample measurement region, the sample scatters and reflects the first radiation wave towards the imaging region, wherein the scattered and reflected wave is at least partly captured in the imaging region and is combinable with the second radiation wave for forming an image.

15. The industrial inspection device according to claim 14 , wherein the industrial inspection device is configured to characterize one or more of: air quality, pollutants, air pollen, or particles.

16. The industrial inspection device according to claim 14 ,

wherein both the radiation guiding structure and the imaging region are integrated in a chip, and

wherein the radiation guiding structure is configured to direct the second radiation wave within the chip toward the imaging region.

17. The industrial inspection device according to claim 14 , wherein the lens-free imaging device further comprises a shielding configured to shield the sample measurement region from external radiation.

18. The industrial inspection device according to claim 14 ,

wherein the radiation guiding structure comprises a waveguide for guiding a confined radiation wave,

wherein the waveguide comprises a diffracting element, and

wherein the diffracting element is configured to redirect a first portion of the confined radiation wave in a first direction resulting in the first radiation wave and redirect another portion of the confined radiation wave in a second direction resulting in the second radiation wave.

19. The industrial inspection device according to claim 18 ,

wherein the diffracting element is a grating coupler configured to direct the first radiation wave at a front side of the grating coupler and to direct the second radiation wave at a back side of the grating coupler, and

wherein the front side and the back side are opposite sides of the grating coupler.

20. The industrial inspection device according to claim 14 , wherein the lens-free imaging device further comprises a radiation source providing a coherent incoming radiation wave, for coupling radiation into the radiation guiding structure.