IP Library Granted Patent US 10,910,226
Granted Patent B2
US 10,910,226 · App. 16/335,968 · Granted Feb 2, 2021

Method of producing a semiconductor laser and semiconductor laser

Inventors: Alfred Lell (Maxhütte-Haidhof, DE); Georg Brüderl (Burglengenfeld, DE); John Brückner (Regensburg, DE); Sven Gerhard (Alteglofsheim, DE); Muhammad Ali (Regensburg, DE); Thomas Adlhoch (Brennberg, DE)
Assignee: OSRAM OLED GmbH
H01L21/28575H01L21/268H01L33/005H01S5/04252H01S5/04254H01L21/28587H01L2933/0016H01S5/04256
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Quick Facts
Patent No.
US 10,910,226
App. No.
16/335,968
Granted
Feb 2, 2021
Kind
B2
Abstract

A method of manufacturing a semiconductor laser including providing a substrate having a semiconductor layer sequence with an active layer that generates light during operation of the semiconductor laser, applying a continuous contact layer having at least one first partial region and at least one second partial region on a bottom side of the substrate opposite the semiconductor layer sequence, and locally annealing the contact layer only in the at least one first partial region.

Claims (20)

1. A method of manufacturing a semiconductor laser comprising:

providing a substrate having a semiconductor layer sequence with an active layer that generates light during operation of the semiconductor laser,

applying a continuous contact layer having at least one first partial region and at least one second partial region on a bottom side of the substrate opposite the semiconductor layer sequence, wherein the bottom side of the substrate has a surface structure comprising a depression in the at least one first partial region, and

locally annealing the continuous contact layer only in the at least one first partial region.

2. The method according to claim 1 , wherein the local annealing is performed by a laser-based irradiation process.

3. The method according to claim 2 , wherein the laser-based irradiation process uses laser light that is at least partially absorbed by the substrate.

4. The method according to claim 1 , wherein the continuous contact layer is applied to the bottom side of the substrate over the whole surface.

5. The method according to claim 1 , wherein the continuous contact layer covers the bottom side of the substrate over the whole surface except for an edge region.

6. The method according to claim 1 , wherein the continuous contact layer comprises a plurality of layers.

7. The method according to claim 6 , wherein a further layer of the continuous contact layer is applied after annealing.

8. The method according to claim 7 , wherein the further layer is applied at least to the first partial region.

9. The method according to claim 1 , wherein the continuous contact layer has a plurality of first partial regions separated from one another by one or more second partial regions and that are locally annealed.

10. The method according to claim 1 , wherein the at least one first partial region is arranged in an edge region of the continuous contact layer.

11. The method according to claim 1 , wherein the semiconductor layer sequence comprises a ridge waveguide structure and the at least one first partial region extends parallel to the ridge waveguide structure.

12. The method according to claim 11 , wherein the at least one first partial region overlaps with the ridge waveguide structure when viewed from the bottom side of the substrate.

13. The method according to claim 1 , wherein the at least one first partial region has one or more geometric shapes selected from the group consisting of line, cross, circle, ellipse, spiral, grid, square, wavy line, meander.

14. A method of manufacturing a semiconductor laser comprising:

providing an electrically conductive substrate having a semiconductor layer sequence with an active layer that generates light during operation of the semiconductor laser,

applying a continuous contact layer having at least one first partial region and at least one second partial region on a bottom side of the electrically conductive substrate opposite the semiconductor layer sequence, and

locally annealing the continuous contact layer only in the at least one first partial region, wherein the at least one second partial region remains unannealed in the finished semiconductor laser.

Assignments (3)
MERGER Recorded Feb 17, 2026
From: OSRAM OLED GMBH
To: AMS-OSRAM INTERNATIONAL GMBH
Reel/Frame 074881/0104 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 3, 2020
From: OSRAM OPTO SEMICONDUCTORS GMBH
To: OSRAM OLED GMBH
Reel/Frame 051464/0504 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 6, 2019
From: LELL, ALFRED; BRÜDERL, GEORG; BRÜCKNER, JOHN; GERHARD, SVEN; ALI, MUHAMMAD; ADLHOCH, THOMAS
To: OSRAM OPTO SEMICONDUCTORS GMBH
Reel/Frame 049089/0498 →