IP Library Granted Patent US 11,302,383
Granted Patent B2
US 11,302,383 · App. 16/354,187 · Granted Apr 12, 2022

Dynamic memory with sustainable storage architecture

Inventors: Chao-Chun Lu (Taipei, TW); Bor-Doou Rong (Hsinchu County, TW); Chun Shiah (Hsinchu, TW)
Assignees: Etron Technology, Inc.; Invention And Collaboration Laboratory Pte. Ltd.
G11C11/4091G11C11/4074G11C11/4085
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Quick Facts
Patent No.
US 11,302,383
App. No.
16/354,187
Filed
Mar 15, 2019
Granted
Apr 12, 2022
Kind
B2
Examiner
TRAN, ANTHAN
Art Unit
2825
USPC
365/189.11
Abstract

The invention relates to DRAM with sustainable storage architecture. The DRAM comprises a DRAM cell with an access transistor and a storage capacitor, and a word-line coupled to a gate terminal of the access transistor. During the period between the word-line being selected to turn on the access transistor and the word line being unselected to turn off the access transistor, either a first voltage level or a second voltage level is stored in the DRAM cell, wherein the first voltage level is higher than a voltage level of a signal ONE utilized in the DRAM, and the second voltage level is lower than a voltage level of a signal ZERO utilized in the DRAM.

Claims (7)

1. A DRAM chip, comprising:

a first supplying voltage generator generating a voltage level corresponding to a signal ONE utilized in the DRAM chip;

a first sustaining voltage generator generating a first voltage level which is higher than the voltage level of the signal ONE utilized in the DRAM chip;

a DRAM cell comprising an access transistor and a storage capacitor; and

a sense amplifier coupled to the DRAM cell through a bit line;

wherein the first supplying voltage generator is selectively coupled to the sense amplifier through a first switch, and the first sustaining voltage generator is selectively coupled to the sense amplifier through a second switch;

wherein during a turning-off period of the access transistor of the DRAM cell, the first switch is turned off and the second switch is turned on, the first sustaining voltage generator is coupled to the bit line and coupled to the storage capacitor of the DRAM cell, and the voltage of the bit line is higher than the voltage level of the first supplying voltage generator corresponding to a signal ONE.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 29, 2021
From: ETRON TECHNOLOGY, INC.
To: ETRON TECHNOLOGY, INC.; INVENTION AND COLLABORATION LABORATORY PTE. LTD.
Reel/Frame 058218/0376 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 15, 2019
From: LU, CHAO-CHUN; RONG, BOR-DOOU; SHIAH, CHUN
To: ETRON TECHNOLOGY, INC.
Reel/Frame 048604/0936 →
Continuity (2)
Provisional Application 62777727 · Dec 10, 2018
Related Publication 20200185022A1 · Jun 11, 2020