IP Library › Granted Patent US 11,138,767
Granted Patent B2
US 11,138,767 · App. 16/361,875 · Granted Oct 5, 2021

System and method for the proscriptive determination of parameters for iterative reconstruction

Inventors: Matthew Andrew (Pleasanton, CA); William Thompson (Pleasanton, CA)
Assignee: Carl Zeiss X-Ray Microscopy, Inc.
G06T11/006G01N23/046G06T5/002G06T5/20G01N2223/304G01N2223/42G06T2207/10081G06T2207/20192G06T2211/421G06T2211/424
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Quick Facts
Patent No.
US 11,138,767
App. No.
16/361,875
Granted
Oct 5, 2021
Kind
B2
Abstract

A x-ray micro tomography system provides the ability to proscriptively determine regularization parameters for iterative reconstruction of a sample, from projection data of the sample. This allows a less experienced operator to determine the regularization parameters with adequate precision.

Claims (29)

1. An x-ray micro tomography system, comprising:

an x-ray microscopy system including an x-ray source system for generating an x-ray beam, and a detector system for detecting the x-ray beam after transmission through a sample to generate projection data; and

a computer system for executing iterative reconstruction using the projection data by first determining regularization parameters and then executing iterative reconstruction using the projection data;

wherein the computer system estimates image noise from a reconstructed portion of the sample and sets an edge preserving cutoff regularization parameter based on the noise estimate, the edge preserving cutoff regularization parameter being used in the iterative reconstruction using the projection data.

2. The system as claimed in claim 1 , wherein the reconstructed portion of the sample is reconstructed using back projection.

3. The system as claimed in claim 1 , wherein the noise is estimated within different phases of the sample.

4. The system as claimed in claim 3 , wherein the noise is estimated by measuring a standard deviations of pixel greyscales within each of the phases.

5. The system as claimed in claim 1 , wherein the computer system reconstructs at least a portion of the sample using iterative reconstruction using different smoothing regularization parameters until a target signal to noise ratio is obtained, the smoothing regularization parameter yielding the target signal to noise ratio being used in the iterative reconstruction using the projection data.

6. The system as claimed in claim 1 , wherein the computer system determines a center offset regularization parameter based on a reconstruction of at least a portion of the sample using back projection.

7. The system as claimed in claim 1 , wherein the computer system determines a beam hardening correction constant regularization parameter based on a reconstruction of at least a portion of the sample using back projection.

8. The system as claimed in claim 1 , wherein the computer system executes iterative reconstruction using the projection data and the determined regularization parameters to generate a volume dataset of the sample.

9. An x-ray micro tomography system, comprising:

an x-ray microscopy system including an x-ray source system for generating an x-ray beam, and a detector system for detecting the x-ray beam after transmission through a sample to generate projection data; and

a computer system for executing iterative reconstruction using the projection data by first determining regularization parameters and performing a setup method to determine a corrected beam hardening correction constant and a corrected center offset based on a reconstruction of at least a portion of the sample using Filtered Back Projection (FBP).

10. The system as claimed in claim 9 , wherein the FBP reconstruction is executed on only a portion of the sample.

11. A method for an x-ray micro tomography system, comprising:

generating an x-ray beam;

detecting the x-ray beam after transmission through a sample to generate projection data; and

a computer system executing iterative reconstruction using the projection data by first determining regularization parameters and estimating image noise from a reconstructed portion of the sample and setting an edge preserving cutoff regularization parameter based on the noise estimate, the edge preserving cutoff regularization parameter being used in the iterative reconstruction using the projection data.

12. The method as claimed in claim 11 , further comprising reconstructing the reconstructed portion of the sample using back projection.

13. The method as claimed in claim 11 , further comprising estimating the noise within different phases of the sample.

14. The method as claimed in claim 11 , further comprising reconstructing at least a portion of the sample using iterative reconstruction using different smoothing regularization parameters until a target signal to noise ratio is obtained, and applying the smoothing regularization parameter yielding the target signal to noise ratio for use in the iterative reconstruction using the projection data.

15. The method as claimed in claim 11 , further comprising determining a center offset regularization parameter based on a reconstruction of at least a portion of the sample using back projection.

16. The method as claimed in claim 11 , further comprising determining a beam hardening correction constant regularization parameter based on a reconstruction of at least a portion of the sample using back projection.

17. The method as claimed in claim 11 , further comprising executing iterative reconstruction using the projection data and the determined regularization parameters to generate a volume dataset of the sample.

18. A method for an x-ray micro tomography system, comprising:

generating an x-ray beam;

detecting the x-ray beam after transmission through a sample to generate projection data; and

a computer system executing iterative reconstruction using the projection data by first determining regularization parameters and performing a setup method to determine a corrected beam hardening correction constant and a corrected center offset based on a reconstruction of at least a portion of the sample using Filtered Back Projection (FBP).

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 15, 2020
From: ANDREW, MATTHEW; THOMPSON, WILLIAM
To: CARL ZEISS X-RAY MICROSCOPY, INC.
Reel/Frame 051523/0971 →
Continuity (2)
Provisional Application 62646790 · Mar 22, 2018
Related Publication 20190311504A1 · Oct 10, 2019