IP Library › Granted Patent US 10,903,010
Granted Patent B2
US 10,903,010 · App. 16/387,984 · Granted Jan 26, 2021

Multilayer ceramic capacitor

Inventors: Kun Hoi Koo (Suwon-si, KR); Soung Jin Kim (Suwon-si, KR); Bon Seok Koo (Suwon-si, KR)
Assignee: SAMSUNG ELECTRO-MECHANICS CO., LTD.
H01G4/2325H01G4/30
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Quick Facts
Patent No.
US 10,903,010
App. No.
16/387,984
Granted
Jan 26, 2021
Kind
B2
Abstract

A multilayer ceramic capacitor includes a body including a dielectric layer and an internal electrode and an external electrode disposed on one surface of the body. The external electrode includes an electrode layer, in contact with the internal electrode, a first intermetallic compound layer disposed on the electrode layer and made of Cu 3 Sn, a first intermetallic compound, a second intermetallic compound layer disposed on the first intermetallic compound layer and made of Cu 6 Sn 5 , a second intermetallic compound, and a conductive resin layer disposed on the second intermetallic compound layer and including a plurality of metal particles, a base resin and a conductive metal having a melting point lower than a curing temperature of the base resin.

Claims (35)

1. A multilayer ceramic capacitor, comprising:

a body including a dielectric layer and an internal electrode; and

an external electrode disposed on one surface of the body,

wherein the external electrode comprises:

an electrode layer, in contact with the internal electrode;

a first intermetallic compound layer disposed on the electrode layer and made of Cu 3 Sn, a first intermetallic compound;

a second intermetallic compound layer disposed on the first intermetallic compound layer and made of Cu 6 Sn 5 , a second intermetallic compound; and

a conductive resin layer disposed on the second intermetallic compound layer and including a plurality of metal particles, abase resin and a conductive metal having a melting point lower than a curing temperature of the base resin.

2. The multilayer ceramic capacitor of claim 1 , wherein the plurality of metal particles are silver (Ag), and the conductive metal having a melting point lower than the curing temperature of the base resin is tin (Sn).

3. The multilayer ceramic capacitor of claim 2 , wherein the conductive resin layer does not contain Cu particles.

4. The multilayer ceramic capacitor of claim 2 , wherein the conductive resin layer contains Cu particles, and

in the conducive region layer, a content of the Cu particles is less than a content of the Ag particles.

5. The multilayer ceramic capacitor of claim 1 , wherein a ratio of a thickness of the first intermetallic compound layer to a thickness of the second intermetallic compound layer is 0.1 to 1.0.

6. The multilayer ceramic capacitor of claim 1 , wherein a size of the plurality of metal particles is 0.5 to 3.0 μm.

7. The multilayer ceramic capacitor of claim 1 , wherein a content of the conductive metal having the melting point lower than the curing temperature of the base resin is 10 wt % or more and less than 33 wt %.

8. The multilayer ceramic capacitor of claim 1 , wherein a ratio of the number of voids in the second intermetallic compound layer to the number of voids in the first intermetallic compound layer is less than 1.0.

9. A multilayer ceramic capacitor, comprising:

a body including a dielectric layer and an internal electrode; and

an external electrode disposed on one surface of the body,

wherein the external electrode comprises:

an electrode layer, in contact with the internal electrode;

a first intermetallic compound layer disposed on the electrode layer and made of a first intermetallic compound;

a second intermetallic compound layer disposed on the first intermetallic compound layer and made of a second intermetallic compound; and

a conductive resin layer disposed on the second intermetallic compound layer and including a plurality of metal particles, a base resin and a conductive metal having a melting point lower than a curing temperature of the base resin,

wherein the number of voids in the second intermetallic compound layer is less than the number of voids in the first intermetallic compound layer.

10. The multilayer ceramic capacitor of claim 9 , wherein the plurality of metal particles are silver (Ag), and the conductive metal having a melting point lower than the curing temperature of the base resin is tin (Sn).

11. The multilayer ceramic capacitor of claim 10 , wherein the conductive resin layer does not contain Cu particles.

12. The multilayer ceramic capacitor of claim 10 , wherein the conductive resin layer contains Cu particles, and

in the conducive region layer, a content of the Cu particles is less than a content of the Ag particles.

13. The multilayer ceramic capacitor of claim 9 , wherein the first intermetallic compound is Cu 3 Sn.

14. The multilayer ceramic capacitor of claim 9 , wherein the second intermetallic compound is Cu 6 Sn 5 .

15. The multilayer ceramic capacitor of claim 9 , wherein the ratio of a thickness of the first intermetallic compound layer to a thickness of the second intermetallic compound layer is 0.1 to 1.0.

16. The multilayer ceramic capacitor of claim 9 , wherein the size of the plurality of metal particles is 0.5 to 3.0 μm.

17. The multilayer ceramic capacitor of claim 9 , wherein the content of the conductive metal having a melting point lower than the curing temperature of the base resin is 10 wt % or more and less than 33 wt %.

18. The multilayer ceramic capacitor of claim 9 , wherein a ratio of moisture permeability of the second intermetallic compound layer to moisture permeability of the first intermetallic compound layer is 0.5 or less.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 14, 2019
From: KOO, KUN HOI; KIM, SOUNG JIN; KOO, BON SEOK
To: SAMSUNG ELECTRO-MECHANICS CO., LTD.
Reel/Frame 050048/0966 →
Priority Claims (2)
KR 10-2018-0150773 · Nov 29, 2018 · national
KR 10-2019-0018478 · Feb 18, 2019 · national
Continuity (1)
Related Publication 20200176189A1 · Jun 4, 2020