IP Library Patent Application 16388113
Patent Application
App. No. 16/388,113

CHIP-ON-CHIP STRUCTURE AND METHODS OF MANUFACTURE

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Quick Facts
Patent No.
US None
App. No.
16/388,113
Abstract

Sintered connection structures and methods of manufacture are disclosed. The method includes placing a powder on a substrate and sintering the powder to form a plurality of pillars. The method further includes repeating the placing and sintering steps until the plurality of pillars reach a predetermined height. The method further includes forming a solder cap on the plurality of pillars. The method further includes joining the substrate to a board using the solder cap.

Claims (37)

1 . A method, comprising:

placing a semiconductor substrate wafer in a chuck;

coating the semiconductor substrate wafer with a plurality of layers of powder, followed by the laser sintering after each coating to form pillars directly in contact with the semiconductor substrate wafer;

joining a chip to the semiconductor substrate wafer between the pillars;

dicing the semiconductor substrate wafer to form a plurality chips with the pillars;

bonding a chip without the pillars to a substrate of another chip of a plurality of chips between the pillars;

the chip without the pillars including plating of micro-bumps; and

bonding an organic laminate to the another chip by the pillars by a reflow of a solder cap.

2 . The method of claim 1 , wherein the reflow is at a reflow temperature of about 250° C. to about 260° C.

3 . The method of claim 1 , wherein:

the powder is a copper powder;

the solder cap is formed by a powder deposition followed by a sintering process; and

the sintering is a laser sintering process.

4 . The method of claim 3 , wherein the solder cap is reflowed, prior to the joining.

5 . The method of claim 1 , further comprising removing any non-sintered powder from the semiconductor substrate wafer, prior to the joining.

6 . The method of claim 1 , wherein a height of the plurality of pillars is greater than 75 μm.

7 . The method of claim 6 , wherein the height of the plurality of pillars is about 500 μm.

8 . The method of claim 1 , wherein the plurality of pillars are tapered.

9 . The method of claim 1 , wherein the plurality of pillars are shaped as an hourglass.

10 . The method of claim 1 , wherein the powder is an insulator material.

11 . A method, comprising:

coating a wafer with a plurality of layers of conductive powder, followed by a laser sintering after each coating to form conductive pillars of a predetermined height directly in contact with the wafer;

forming a solder cap on the conductive pillars;

joining a chip to the wafer between the conductive pillars;

joining a wafer to an organic laminate board by a bonding process of the solder cap of the conductive pillars;

dicing the wafer to form a plurality chips with the conductive pillars;

bonding the chip without the conductive pillars to a substrate of another chip of the plurality of chips between the conductive pillars by a reflow of the solder cap;

the chip without the conductive pillars including plating of micro-bumps; and

the chip without the conductive pillars being bonded to the substrate by a reflow process;

12 . The method of claim 11 , wherein the conductive powder is copper and the solder cap is formed by: deposited solder powder, sintering the solder powder and reflowing the sintered solder powder.

13 . The method of claim 11 , wherein the joining of the chip to the wafer is by reflow or thermocompression bonding.

14 . The method of claim 11 , wherein the predetermined height is greater than 75 μm.

15 . The method of claim 14 , wherein the predetermined height is approximately 500 um.

16 . The method of claim 11 , further comprising underfilling spaces between the chip, wafer and board.

17 . The method of claim 11 , wherein the conductive pillars are shaped as one of (i) cones with its bases being wider in diameter than its end at the solder cap, and (ii) hourglasses.

18 . The method of claim 11 , wherein the joining the wafer to the board is provided by a reflow process.

19 . The method of claim 11 , wherein the reflow is at a reflow temperature of about 250° C. to about 260° C.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 4, 2020
From: INTERNATIONAL BUSINESS MACHINES CORPORATION
To: ELPIS TECHNOLOGIES INC.
Reel/Frame 052557/0327 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 18, 2019
From: GRAF, RICHARD S.; LEONARD, JAY F.; WEST, DAVID J.; WILSON, CHARLES H.
To: INTERNATIONAL BUSINESS MACHINES CORPORATION
Reel/Frame 048929/0540 →