IP Library Granted Patent US 10,651,115
Granted Patent B2
US 10,651,115 · App. 16/389,492 · Granted May 12, 2020

Cascode semiconductor package and related methods

Inventors: Phuong Trong Le (Goodyear, AZ); Alexander Young (Scottsdale, AZ)
Assignee: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
H01L23/49575H01L23/3121H01L23/49562H01L24/97H01L29/2003H01L29/7787H01L29/7816H01L29/7817H01L21/561H01L23/49524H01L24/06H01L24/29H01L24/32H01L24/48H01L24/73H01L24/83H01L2224/04026H01L2224/04042H01L2224/0603H01L2224/06181H01L2224/291H01L2224/2919H01L2224/32245H01L2224/45015H01L2224/48137H01L2224/48247H01L2224/48257H01L2224/73265H01L2224/83H01L2224/83851H01L2224/97H01L2924/00014H01L2924/1033H01L2924/10253H01L2924/1306H01L2924/13064
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Quick Facts
Patent No.
US 10,651,115
App. No.
16/389,492
Granted
May 12, 2020
Kind
B2
Abstract

A semiconductor package includes an electrically conductive base (base) having a source connector. A drain connector and a gate connector are electrically coupled with the base. A depletion mode gallium nitride field-effect transistor (GaN FET) and an enhancement mode laterally diffused metal-oxide-semiconductor field-effect transistor (LDMOS FET) are also coupled with the base. The gate connector and a gate contact of the LDMOS FET are both included in a first electrical node, the source connector and a source contact of the LDMOS FET are both included in a second electrical node, and the drain connector and a drain contact of the GaN FET are both included in a third electrical node. The GaN FET and LDMOS FET together form a cascode that operates as an enhancement mode amplifier. The semiconductor package does not include an interposer between the GaN FET and the base or between the LDMOS FET and the base.

Claims (35)

1. A semiconductor package, comprising:

a cascode comprising:

a first field-effect transistor (FET) coupled to a common base;

a second FET coupled to the common base;

a gate connector coupled to the second FET;

a source connector coupled to the common base; and

a drain connector coupled to the first FET;

wherein the first FET and the second FET are within a perimeter of the common base.

2. The semiconductor package of claim 1 , wherein the first FET is directly coupled to a common base.

3. The semiconductor package of claim 1 , wherein the second FET is directly coupled to a common base.

4. The semiconductor package of claim 1 , wherein the gate connector and a gate contact of the second FET are both comprised in a first electrical node, the source connector and a source contact of the second FET are both comprised in a second electrical node, and the drain connector and a drain contact of the first FET are both comprised in a third electrical node.

5. The semiconductor package of claim 1 , wherein the first FET is a planar GaN FET comprising a source contact, a gate contact, and a drain contact on a first side of the first FET.

6. The semiconductor package of claim 1 , wherein the first FET is a depletion mode GaN FET.

7. The semiconductor package of claim 1 , wherein the second FET is an enhancement mode FET.

8. The semiconductor package of claim 1 , wherein the second FET is configured as a source-down FET.

9. A semiconductor package, comprising:

a gallium nitride field-effect transistor (GaN FET) coupled to a common base; and

a field-effect transistor (FET) coupled to the common base;

wherein the semiconductor package does not comprise an interposer coupled between one of the GaN FET and the common base of the semiconductor package or the FET and the common base of the semiconductor package.

10. The semiconductor package of claim 9 , further comprising an encapsulant encapsulating the GaN FET and the FET and exposing a gate connector, a source connector, and a drain connector of the semiconductor package through the encapsulant.

11. The semiconductor package of claim 9 , wherein the GaN FET is a depletion mode GaN FET.

12. The semiconductor package of claim 9 , wherein the FET is an enhancement mode FET.

13. The semiconductor package of claim 9 , wherein the GaN FET is a high electron mobility transistor (HEMT).

14. The semiconductor package of claim 9 , wherein the GaN FET and the FET together form a cascode.

15. The semiconductor package of claim 14 , wherein the cascode operates as an enhancement mode amplifier.

16. The semiconductor package of claim 9 , wherein the FET comprises a first side comprising a source of the FET and a second side comprising a gate of the FET and a drain of the FET.

17. The semiconductor package of claim 9 , wherein the GaN FET comprises a first side coupled with the common base of the semiconductor package and a second side comprising a gate of the GaN FET, a drain of the GaN FET and a source of the GaN FET.

18. The semiconductor package of claim 9 , wherein the FET is configured as a source-down FET.

19. A semiconductor package, comprising:

an enhancement mode cascode comprising:

a high electron mobility transistor (HEMT) comprising a first side coupled to a common base and a second side comprising a source contact, a drain contact, and a gate contact;

a field-effect transistor (FET) comprising a first side comprising a source contact coupled to the common base and a second side comprising a gate contact and a drain contact;

a gate connector coupled to the FET;

a source connector coupled to the common base; and

a drain connector coupled to the HEMT.

Assignments (3)
RELEASE OF SECURITY INTEREST IN PATENTS PREVIOUSLY RECORDED AT REEL 050156, FRAME 0421 Recorded Aug 16, 2023
From: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 064615/0639 →
SECURITY INTEREST Recorded Aug 23, 2019
From: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 050156/0421 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 19, 2019
From: LE, PHUONG TRONG; YOUNG, ALEXANDER
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 048941/0076 →
Continuity (4)
Continuation 15866248 · Jan 9, 2018
Continuation 15341735 · Nov 2, 2016
Continuation 14744743 · Jun 19, 2015
Related Publication 20190252303A1 · Aug 15, 2019