IP Library Granted Patent US 11,069,837
Granted Patent B2
US 11,069,837 · App. 16/389,510 · Granted Jul 20, 2021

Sub pixel light emitting diodes for direct view display and methods of making the same

Inventors: Fariba Danesh (Pleasanton, CA); Max Batres (Fremont, CA); Michael J. Cich (Fremont, CA); Zhen Chen (Dublin, CA)
Assignee: GLO AB
H01L33/405H01L25/0753H01L33/0093H01L33/025H01L33/06H01L33/12H01L33/24H01L33/325H01L33/44H01L33/62H01L2933/0016H01L2933/0066
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Quick Facts
Patent No.
US 11,069,837
App. No.
16/389,510
Granted
Jul 20, 2021
Kind
B2
Abstract

A light emitting diode (LED) includes a n-doped semiconductor material layer located over a substrate, an active region including an optically active compound semiconductor layer stack configured to emit light located over the n-doped semiconductor material layer, a p-doped semiconductor material layer located over the active region and containing a nickel doped surface region, a conductive layer contacting the nickel doped surface region of the p-doped semiconductor material, and a device-side bonding pad layer electrically connected to the conductive layer.

Claims (18)

1. A method of forming a light emitting diode (LED), comprising: forming a n-doped semiconductor material layer over a substrate; forming an active region including an optically active compound semiconductor layer stack configured to emit light on the n-doped semiconductor material layer; forming a p-doped semiconductor material layer on the active region; depositing a nickel layer directly on the p-doped semiconductor material layer; etching back the nickel layer to expose a nickel-doped surface region of the p-doped semiconductor layer; and forming a conductive layer on the exposed nickel-doped surface region.

2. The method of claim 1 , wherein the nickel layer is completely removed from the p-doped semiconductor material layer surface after the step of etching back the nickel layer.

3. The method of claim 1 , wherein: the conductive layer comprises a platinum layer which contacts the nickel-doped surface region of the p-doped semiconductor material layer; and the p-doped semiconductor material layer comprises p-doped gallium nitride or p-doped aluminum gallium nitride.

4. The method of claim 3 , further comprising:

forming a silver layer over the platinum layer; and

forming a device-side bonding pad layer over the silver layer.

5. The method of claim 1 , wherein: the conductive layer comprises a silver layer which contacts the nickel-doped surface region of the p-doped semiconductor material layer; and the p-doped semiconductor material layer comprises p-doped gallium nitride or p-doped aluminum gallium nitride.

6. A method of forming a light emitting diode (LED), comprising:

forming a n-doped semiconductor material layer over a substrate;

forming an active region including an optically active compound semiconductor layer stack configured to emit light on the n-doped semiconductor material layer;

forming a p-doped semiconductor material layer on the active region;

depositing a nickel layer directly on the p-doped semiconductor material layer;

etching back the nickel layer to form residual nickel layer having an effective thickness of one to three monolayers of nickel atoms, or to expose a nickel-doped surface region of the p-doped semiconductor layer; and

forming a conductive layer on the residual nickel layer or the exposed nickel-doped surface region;

wherein:

the step of etching back the nickel layer forms the residual nickel layer; and

the step of forming a conductive layer comprises depositing a transparent conductive oxide on the p-doped semiconductor layer and forming a nickel-doped conductive oxide layer between the p-doped semiconductor material layer and the conductive layer.

7. The method of claim 6 , further comprising forming a reflector on the conductive layer and forming a device-side bonding pad layer on the reflector.

Assignments (7)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 12, 2024
From: GLO TECHNOLOGIES LLC
To: SAMSUNG ELECTRONICS CO., LTD.
Reel/Frame 068297/0220 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 6, 2023
From: SYSONAN, INC.
To: GLO TECHNOLOGIES LLC
Reel/Frame 065178/0210 →
CHANGE OF NAME Recorded Oct 5, 2023
From: NANOSYS, INC.
To: SYSONAN, INC.
Reel/Frame 065156/0416 →
TERMINATION AND RELEASE OF PATENT SECURITY AGREEMENT RECORDED AT REEL 059569 / FRAME 0840 Recorded Sep 7, 2023
From: FORTRESS CREDIT CORP.,
To: NANOSYS, INC.
Reel/Frame 064836/0263 →
SECURITY INTEREST Recorded Apr 1, 2022
From: NANOSYS, INC.
To: FORTRESS CREDIT CORP., AS AGENT
Reel/Frame 059569/0840 →
NUNC PRO TUNC ASSIGNMENT Recorded Aug 13, 2021
From: GLO AB
To: NANOSYS, INC.
Reel/Frame 057184/0564 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 19, 2019
From: DANESH, FARIBA; BATRES, MAX; CICH, MICHAEL J.; CHEN, ZHEN
To: GLO AB
Reel/Frame 049519/0125 →
Continuity (2)
Provisional Application 62660696 · Apr 20, 2018
Related Publication 20190326478A1 · Oct 24, 2019
Cited By (1)
US 12,369,430