Circuit arrangement region failure prediction apparatus and method based on sensor output score

1. A failure prediction apparatus comprising: a memory; and

a processor coupled to the memory and configured to:

acquire a score based on an output of each of a plurality of sensors associated with each of a plurality of circuit arrangement regions, in each of the plurality of circuit arrangement regions a logic circuit constructed by programming is arrangeable;

tabulate the scores from the plurality of circuit arrangement regions;

determine a possibility of an occurrence of a failure with respect to each of the plurality of circuit arrangement regions based on the tabulating; and

reconstruct the logic circuit arranged in a circuit arrangement region which is determined to have the possibility of the occurrence of the failure.

2. The failure prediction apparatus according to claim 1 , wherein the processor is configured to perform the process of reconstructing the logic circuit arranged in the circuit arrangement region having the score exceeding a threshold value among the plurality of circuit arrangement regions in a circuit arrangement region having the score less than the threshold value among the plurality of circuit arrangement regions.

3. The failure prediction apparatus according to claim 2 , wherein, in a case where there are a plurality of circuit arrangement regions having the score exceeding a threshold value among the plurality of circuit arrangement regions, the processor is configured to reconstruct the logic circuit in an order of a priority determined with respect to each of the plurality of circuit arrangement regions.

4. The failure prediction apparatus according to claim 1 , wherein each of the sensors includes a temperature sensor.

5. The failure prediction apparatus according to claim 1 , wherein each of the sensors includes a sensor group including a plurality of different kinds of sensors.

6. The failure prediction apparatus according to claim 1 , wherein the processor is configured to acquire, as the score, a first score which is determined according to a magnitude of the output of each of the sensors and a second score which is determined according to an amount of change in the output of each of the sensors within a predetermined period.

7. The failure prediction apparatus according to claim 6 ,

wherein the processor is further configured to

acquire a third score which is determined according to an error generating in a signal pattern corresponding to each of the circuit arrangement regions, and

make a determination on a possibility of an occurrence of a failure with respect to each of the plurality of circuit arrangement regions based on a tabulation value of the first score, the second score, and the third score for each of the circuit arrangement regions.

8. A failure prediction method executed by a processor included in a failure prediction apparatus, the method comprising:

acquiring a score based on an output of each of a plurality of sensors associated with each of a plurality of circuit arrangement regions, in each of the plurality of circuit arrangement regions a logic circuit constructed by programming is arrangeable;

tabulating the scores from the plurality of circuit arrangement regions;

determining a possibility of an occurrence of a failure with respect to each of the plurality of circuit arrangement regions based on the tabulating; and

reconstructing the logic circuit arranged in a circuit arrangement region which is determined to have the possibility of the occurrence of the failure.

9. A non-transitory computer-readable recording medium storing a program that causes a processor included in a failure prediction apparatus to execute a process, the process comprising:

acquiring a score based on an output of each of a plurality of sensors associated with each of a plurality of circuit arrangement regions, in each of the plurality of circuit arrangement regions a logic circuit constructed by programming is arrangeable;

tabulating the scores from the plurality of circuit arrangement regions;

determining a possibility of an occurrence of a failure with respect to each of the plurality of circuit arrangement regions based on the tabulating; and

reconstructing the logic circuit arranged in a circuit arrangement region which is determined to have the possibility of the occurrence of the failure.

10. A circuit failure predicting method comprising:

acquiring data regarding each of a plurality of circuits from a plurality of sensors;

determining failure scores for each of the plurality of circuits based on the data;

storing the failure scores respectively in each of the plurality of circuits;

acquiring the failure scores from the plurality of circuits;

tabulating the failure scores from the plurality of circuits;

determining whether a failure is possible for at least one of the plurality of circuits based on the tabulating; and

reconstructing a logic circuit when a determination is made that the failure is possible.

11. The circuit failure predicting method of claim 10 , wherein the determining comprises comparing the failure scores tabulated with a threshold value.

12. The circuit failure predicting method of claim 11 , wherein the determining determines that the failure is possible when a failure score is equal to or greater than the threshold value.

13. The circuit failure predicting method of claim 11 , wherein the determining determines that the failure is not possible when a failure score is less than the threshold value.

14. The circuit failure predicting method of claim 11 , wherein the reconstructing comprises stopping a circuit having a failure score equal to or greater than the threshold.

15. The circuit failure predicting method of claim 11 , wherein the reconstructing comprises erasing a logic circuit having a failure score equal to or greater than the threshold.

16. The circuit failure predicting method of claim 10 further comprising identifying a reconstruction priority based on the tabulating.