IP Library › Granted Patent US 10,862,271
Granted Patent B2
US 10,862,271 · App. 16/393,949 · Granted Dec 8, 2020

High-efficiency oxide VCSEL with improved light extraction, and manufacturing method thereof

Inventor: Hyung Joo Lee (Gwangju, KR)
Assignee: AUK CORP.
H01S5/18308H01S5/18386H01S5/18394H01S5/34353H01S5/34313H01S2304/04
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Quick Facts
Patent No.
US 10,862,271
App. No.
16/393,949
Granted
Dec 8, 2020
Kind
B2
Abstract

The present invention relates to a vertical cavity surface emitting laser (VCSEL) and a manufacturing method thereof, and more specifically, to a high-efficiency oxide VCSEL which emits laser beams having a peak wavelength of 860 nm, and a manufacturing method thereof.

Claims (14)

1. An oxide vertical cavity surface emitting laser (VCSEL) comprising a conductive current spreading layer formed between a top electrode and a top distributed Bragg reflector to pass laser beams having a peak wavelength of 860±10 nm, having a refractive index lower than that of the top distributed Bragg reflector, and having a rough top surface.

2. The VCSEL according to claim 1 , wherein the current spreading layer is a GaP layer.

3. The VCSEL according to claim 2 , wherein the GaP layer includes a metallic and/or non-metallic dopant.

4. The VCSEL according to claim 3 , wherein one or more among a group including Mg, Zn and carbon are selected as the dopant.

5. The VCSEL according to claim 1 , wherein the current spreading layer has a thickness of 1 μm or larger.

6. The VCSEL according to claim 1 , wherein the rough layer is a wet or dry-etched rough layer.

7. The VCSEL according to claim 1 , wherein roughness of the rough layer is >±1μ.

8. The VCSEL according to claim 1 , wherein the oxide vertical cavity surface emitting laser includes a bottom electrode, a substrate, a bottom distributed Bragg reflector, an active layer, a top distributed Bragg reflector, a top electrode, and an oxidized layer.

9. The VCSEL according to claim 8 , wherein the active layer is configured of a GaAs quantum well and an AlGaAs quantum barrier layer; the top and bottom DBRs are distributed Bragg reflectors having a structure repeatedly stacking two layers of an Al x Ga 1-x As layer of 0.8<x<1 and an Al y Ga 1-y As layer of 0<y<0; the oxidized layer is configured of an outer oxidized layer of a ring shape and an inner current window of a center circle shape; and the top electrode is an electrode of a ring shape.

10. The VCSEL according to claim 8 , wherein the oxidized layer is positioned between layers of top p-DBRs.

11. The VCSEL according to claim 9 , wherein the oxide VCSEL operates at a current of 10 to 40 mA.

12. The VCSEL according to claim 9 , wherein the top electrode is a multilayer electrode of a ring shape including a Pt layer.

13. The VCSEL according to claim 9 , further comprising an anti-reflection layer on a top of the current spreading layer.

14. A method of manufacturing an oxide VCSEL having a peak wavelength of 860±10 nm, wherein a GaP layer having a thickness of 1 μm or larger and a rough top surface is positioned between a top electrode and a top DBR.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 12, 2019
From: LEE, HYUNG JOO
To: AUK CORP.
Reel/Frame 050694/0262 →
Priority Claims (1)
KR 10-2018-0096731 · Aug 20, 2018 · national
Continuity (1)
Related Publication 20200059072A1 · Feb 20, 2020