Semiconductor package
A semiconductor package includes a semiconductor chip having an active surface on which a connection pad is disposed and an inactive surface opposing the active surface; a first encapsulant covering at least a portion of each of the inactive surface and side surfaces of the semiconductor chip, and having one or more recessed portions recessed towards the inactive surface of the semiconductor chip; a metal layer disposed on the first encapsulant, and filling at least a portion of each of the recessed portions; and an interconnect structure disposed on the active surface of the semiconductor chip, and including a redistribution layer electrically connected to the connection pad. A surface of the metal layer in contact with the first encapsulant has a surface roughness greater than a surface roughness of a surface of the metal layer spaced apart from the first encapsulant.
1. A semiconductor package, comprising:
a semiconductor chip having an active surface on which a connection pad is disposed and an inactive surface opposing the active surface;
a first encapsulant covering at least a portion of each of the inactive surface and side surfaces of the semiconductor chip, and having one or more recessed portions recessed towards the inactive surface of the semiconductor chip;
a metal layer disposed on the first encapsulant, and filling at least a portion of each of the recessed portions; and
an interconnect structure disposed on the active surface of the semiconductor chip, and including a redistribution layer electrically connected to the connection pad,
wherein a surface of the metal layer in contact with the first encapsulant has a surface roughness greater than a surface roughness of a surface of the metal layer spaced apart from the first encapsulant.
2. The semiconductor package of claim 1 ,
wherein the metal layer covers an upper surface of the first encapsulant,
wherein a surface of the metal layer in contact with an upper surface of the first encapsulant has a surface roughness greater than a surface roughness of a surface of the metal layer opposing the surface in contact with the upper surface of the first encapsulant.
3. The semiconductor package of claim 2 ,
wherein the metal layer covers the upper surface and side surfaces of the first encapsulant, and
wherein a surface of the metal layer in contact with the upper surface of the first encapsulant has a surface roughness greater than a surface roughness of a surface of the metal layer in contact with the side surfaces of the first encapsulant.
4. The semiconductor package of claim 1 , wherein at least one of the recessed portions includes a marking pattern for identification.
5. The semiconductor package of claim 1 ,
wherein the metal layer includes a first metal layer filling at least a portion of each of the recessed portions, and a second metal layer disposed on the first metal layer, filling at least the other portion of each of the recessed portions, and covering an upper surface and side surfaces of the first encapsulant, and
wherein a boundary between the first and second metal layers is distinct.
6. The semiconductor package of claim 5 , wherein a surface of the first metal layer in contact with the first encapsulant has a surface roughness greater than a surface roughness of a surface of the first metal layer in contact with the second metal layer.
7. The semiconductor package of claim 5 , wherein a surface of the second metal layer in contact with an upper surface of the first encapsulant has a surface roughness greater than a surface roughness of a surface of the second metal layer in contact with the first metal layer.
8. The semiconductor package of claim 1 ,
wherein the metal layer includes a first metal layer filling the recessed portions and covering an upper surface of the first encapsulant, and a second metal layer covering the first metal layer and side surfaces of the first encapsulant, and
wherein a boundary between the first and second metal layers is distinct.
9. The semiconductor package of claim 8 , wherein a surface of the first metal layer in contact with the first encapsulant has a surface roughness greater than a surface roughness of a surface of the first metal layer in contact with the second metal layer.
10. The semiconductor package of claim 1 , further comprising:
one or more component embedded structures disposed on the interconnect structure and disposed in parallel to the semiconductor chip, and including one or more passive components embedded therein,
wherein the first encapsulant covers at least a portion of each of the component embedded structures.
11. The semiconductor package of claim 10 ,
wherein the component embedded structures each include the one or more passive components, a second encapsulant encapsulating each of the passive components, and a wiring structure disposed in a lower portion of each of the passive components and including a wiring layer electrically connected to each of the passive components, and
wherein the wiring layer is electrically connected to the connection pad through the redistribution layer.
12. The semiconductor package of claim 11 , wherein a stepped portion is formed between a lower surface of each of the passive components and the active surface of the semiconductor chip.
13. The semiconductor package of claim 11 , wherein a lower surface of the wiring layer is coplanar with the active surface of the semiconductor chip.
14. The semiconductor package of claim 1 , wherein the semiconductor package is a fan-out semiconductor package.
15. The semiconductor package of claim 1 , wherein the metal layer extends from an upper surface of the first encapsulant to cover a side surface of the first encapsulant and a side surface of the interconnect structure.
16. The semiconductor package of claim 15 , wherein the metal layer is in contact with a ground pattern of the redistribution layer exposed from the side surface of the interconnect structure.