IP Library Granted Patent US 10,634,621
Granted Patent B2
US 10,634,621 · App. 16/418,179 · Granted Apr 28, 2020

Information processing method, information processing apparatus, and program

Inventors: Masaaki Kano (Obu, JP); Akiyoshi Nakase (Kashiba, JP)
Assignee: JTEKT CORPORATION
G01N21/8851G06N3/08G06T7/0002G01N2021/8854G01N2021/8883
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 10,634,621
App. No.
16/418,179
Granted
Apr 28, 2020
Kind
B2
Abstract

A learning procedure involves generating a non-defective product learning model by conducting machine learning using non-defective product data as teacher data, and generating a defective product learning model for each defect type by conducting machine learning for each defect type using defective product data as teacher data. A calculating procedure involves calculating the likelihood of a non-defective product from output data calculated using the non-defective product learning model to which target product data is input, and calculating the likelihood of a defective product for each defect type from output data calculated using the defective product learning model to which the target product data is input. A determining procedure involves determining that the target product data is data on a defective product having an unknown defect when the likelihood of a non-defective product and the likelihood of a defective product for each defect type satisfy a predetermined requirement.

Claims (21)

1. An information processing method comprising:

a learning procedure involving generating a non-defective product learning model by conducting machine learning using non-defective product data as teacher data, and generating a defective product learning model for a plurality of defect types by conducting machine learning for each defect type using defective product data as teacher data;

a calculating procedure involving calculating a probability of a non-defective product from output data calculated using the non-defective product learning model to which target product data is input, and calculating a probability of a defective product for each defect type from output data calculated using the defective product learning model to which the target product data is input; and

a determining procedure involving determining that the target product data is data on a defective product having an unknown defect when the likclihoodprobability of a non-defective product and the probability of a defective product for each defect type calculated by the calculating procedure satisfy a probability-related standard.

2. The information processing method according to claim 1 , wherein the determining procedure involves making a comparison between the probability of a non-defective product and a non-defective product threshold value, and making a comparison between the probability of a defective product and a defective product threshold value for each defect type, and

the determining procedure involves determining that the target product data is data on a defective product having an unknown defect when the probabilities of a defective product for all defects are each lower than the associated defective product threshold value as a result of the comparison for each defect type and the probability of a non-defective product is lower than the non-defective product threshold value.

3. The information processing method according to claim 2 , wherein the determining procedure involves, when the probabilities of a defective product are equal to or greater than the defective product threshold values for the plurality of the defect types as a result of the comparison for each defect type, determining that one of the defect types that maximizes a difference between the probability and the defective product threshold value is the defect type for the target product data.

4. The information processing method according to claim 2 , wherein the determining procedure involves, when the probability of a defective product is equal to or greater than the associated defective product threshold value for one of the defect types as a result of the comparison for each defect type, determining that the target product data is data on a defective product having the one of the defect types.

5. The information processing method according to claim 2 , wherein the determining procedure involves determining that the target product data is non-defective product data when the probabilities of a defective product for all defects are each lower than the associated defective product threshold value as a result of the comparison for each defect type and the probability of a non-defective product is equal to or greater than the non-defective product threshold value.

6. The information processing method according to claim 1 , wherein the determining procedure involves determining whether the probability of a defective product calculated for each defect type satisfies the probability-related standard, and then determining whether the probability of a non-defective product satisfies the probability-related standard.

7. An information processing apparatus comprising:

a learner configured to generate a non-defective product learning model by conducting machine learning using non-defective product data as teacher data, and configured to generate a defective product learning model for a plurality of defect types by conducting machine learning for each defect type using defective product data as teacher data;

a calculator configured to calculate a probability of a non-defective product from output data calculated using the non-defective product learning model to which target product data is input, and configured to calculate a probability of a defective product for each defect type from output data calculated using the defective product learning model to which the target product data is input; and

a determiner configured to determine that the target product data is data on a defective product having an unknown defect when the probability of a non-defective product and the probability of a defective product for each defect type calculated by the calculator satisfy a probability-related standard.

8. A non-transitory computer readable medium that stores a program that when executed, causes a computer to function as:

a learner configured to generate a non-defective product learning model by conducting machine learning using non-defective product data as teacher data, and configured to generate a defective product learning model for a plurality of defect types by conducting machine learning for each defect type using defective product data as teacher data;

a calculator configured to calculate a probability of a non-defective product from output data calculated using the non-defective product learning model to which target product data is input, and configured to calculate a probability of a defective product for each defect type from output data calculated using the defective product learning model to which the target product data is input; and

a determiner configured to determine that the target product data is data on a defective product having an unknown defect when the probability of a non-defective product and the probability of a defective product for each defect type calculated by the calculator satisfy a probability-related standard.

9. The information processing method according to claim 1 , wherein the machine learning used for generating the non-defective product learning model and generating the defective product learning model is implemented with a variational auto-encoder learning model.

10. The information processing apparatus according to claim 7 , wherein the machine learning used for generating the non-defective product learning model and generating the defective product learning model is implemented with a variational auto-encoder learning model.

11. The non-transitory computer readable medium according to claim 8 , wherein the machine learning used for generating the non-defective product learning model and generating the defective product learning model is implemented with a variational auto-encoder learning model.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 21, 2019
From: KANO, MASAAKI; NAKASE, AKIYOSHI
To: JTEKT CORPORATION
Reel/Frame 049241/0945 →
Priority Claims (1)
JP 2018-099519 · May 24, 2018 · national
Continuity (1)
Related Publication 20190360942A1 · Nov 28, 2019
Cited By (2)
US 12,330,329 US 12,533,827