Stage apparatus, and charged particle beam apparatus
Provided is a stage apparatus that reduces thermal deformation and temperature rise in an upper table on which a sample is mounted and a charged particle beam apparatus including the stage apparatus. The stage apparatus includes: an upper stage that moves an upper table on which a sample is mounted in a first direction; a middle stage that moves a middle table on which the upper stage is mounted in a second direction orthogonal to the first direction; and a lower stage that moves a lower table on which the middle stage is mounted in a third direction orthogonal to the first direction and the second direction. The upper table and the middle table use a material having a smaller thermal expansion coefficient than in a material of the lower table, and the lower table uses a material having higher thermal conductivity than in the material of the upper table and the middle table.
1. A stage apparatus comprising:
an upper stage arranged to move an upper table on which a sample is mounted in a first direction;
a middle stage arranged to move a middle table on which the upper stage is mounted in a second direction orthogonal to the first direction; and
a lower stage arranged to move a lower table on which the middle stage is mounted in a third direction orthogonal to the first direction and the second direction,
wherein the upper table and the middle table use a material having a smaller thermal expansion coefficient than in a material of the lower table, the material of the upper table and the middle table being a same material, and
the lower table uses a material having a higher thermal conductivity than in the material of the upper table and the middle table.
2. The stage apparatus according to claim 1 ,
wherein the upper stage includes:
a mirror having a reflecting surface in the second direction; and
a mirror having a reflecting surface in the third direction, and arranged to provide a distance measurement of the reflecting surfaces of the mirrors to obtain a position of a sample mounted on the upper table.
3. The stage apparatus according to claim 1 ,
wherein the middle stage includes:
a guide part arranged to guide the middle table in the second direction; and
a connecting part arranged to connect the middle table and the guide part with each other, and
the connecting part is configured such that rigidity against deformation of the connecting part with the guide part with a rotational axis in the second direction is lower than the rigidity against deformation of the connecting part with the rotational axis in the other directions.
4. The stage apparatus according to claim 3 ,
wherein a surface of the connecting part coming in contact with the guide part has a shape longer in the second direction than in the third direction.
5. The stage apparatus according to claim 1 ,
wherein the upper table and the middle table use a ceramic composite material, and
the lower table uses a material of aluminum or an aluminum alloy.
6. The stage apparatus according to claim 5 ,
wherein the ceramic composite material contains aluminum as a matrix material.
7. The stage apparatus according to claim 1 ,
wherein the upper stage includes a driving unit configured to exert a driving force for moving the upper table in the first direction and that is fixed to the middle table,
the middle stage includes a guide part configured to guide the middle table in the second direction, and
the guide part is disposed within a range of a predetermined distance from the driving unit.
8. The stage apparatus according to claim 7 ,
wherein the guide part and the driving unit are arranged to be aligned in the first direction.
9. A charged particle beam apparatus comprising the stage apparatus according to claim 1 .
10. The stage apparatus according to claim 5 , further comprising a base portion supporting the lower table, the base portion formed of a same material as the lower table.