IP Library Granted Patent US 11,142,453
Granted Patent B2
US 11,142,453 · App. 16/434,105 · Granted Oct 12, 2021

MEMS device stress-reducing structure

Inventors: Klaus Mayer (Munich, DE); Christian Siegel (Tuntenhausen, DE); Anton Leidl (Hohenbrunn, DE); Wolfgang Pahl (Munich, DE); Stefan Stufler (Munich, DE)
Assignee: TDK CORPORATION
B81C1/00325B81B3/0072B81B7/0048B81C1/00134H01L24/48B81C2203/01H01L2224/48247H01L2224/73257
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Quick Facts
Patent No.
US 11,142,453
App. No.
16/434,105
Granted
Oct 12, 2021
Kind
B2
Abstract

A MEMS device is disclosed. In an embodiment a MEMS device includes a substrate having an active region and at least one integrated electrical and mechanical connection element configured to electrically and mechanically mount the MEMS device to a carrier, wherein the connection element comprises a stress-reducing structure.

Claims (30)

1. A micro-electromechanical systems (MEMS) device comprising:

a substrate comprising an active region;

at least one integrated electrical and mechanical connection element on a mounting side of the MEMS device, the at least one integrated electrical and mechanical connection element configured to electrically and mechanically mount the MEMS device with the mounting side to a carrier,

wherein the connection element comprises a stress-reducing structure,

wherein the connection element is at least partly formed by a part of the substrate,

wherein the connection element comprises at least one contact pad on the mounting side, and

wherein a trench on the mounting side in the substrate completely surrounds the contact pad; and

a conductor track partly arranged on a bridge element reaching over the trench.

2. The MEMS device according to claim 1 , wherein the connection element comprises at least two associated contact pads.

3. The MEMS device according to claim 2 , wherein each of the associated contact pads has an elongated cross-section.

4. The MEMS device according to claim 1 , wherein the connection element comprises a metal mixed with a filler.

5. The MEMS device according to claim 4 , wherein the metal is a solder metal.

6. The MEMS device according to claim 4 , wherein the filler comprises a gas.

7. The MEMS device according to claim 4 , wherein the filler comprises a plastic material.

8. The MEMS device according to claim 4 , wherein the filler comprises a plurality of filler elements, each of the filler elements having a filler element diameter which is equal to or less than 1/10 of a connection element diameter.

9. The MEMS device according to claim 4 , wherein the connection element has a solder-bump-like structure.

10. A micro-electromechanical systems (MEMS) device comprising:

a substrate comprising an active region;

at least two integrated electrical and mechanical connection elements on a mounting side of the MEMS device, the at least two integrated electrical and mechanical connection elements configured to electrically and mechanically mount the MEMS device with the mounting side to a carrier,

wherein each connection element comprises a stress-reducing structure,

wherein each connection element is at least partly formed by a part of the substrate,

wherein each connection element comprises at least one contact pad on the mounting side, and

wherein each contact pad is completely surrounded by a trench on the mounting side; and

a conductor track partly arranged on a bridge element reaching over the trench.

11. The MEMS device according to claim 10 , wherein each connection element comprises at least two associated contact pads.

12. The MEMS device according to claim 10 , wherein each connection element comprises a metal mixed with a filler.

13. The MEMS device according to claim 12 , wherein the metal is a solder metal.

14. The MEMS device according to claim 12 , wherein the filler comprises a gas.

15. The MEMS device according to claim 12 , wherein the filler comprises a plastic material.

16. The MEMS device according to claim 12 , wherein the filler comprises a plurality of filler elements, each of the filler elements having a filler element diameter which is equal to or less than 1/10 of a connection element diameter.

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 13, 2025
From: TDK CORPORATION
To: INVENSENSE, INC.
Reel/Frame 073080/0824 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 30, 2020
From: TDK ELECTRONICS AG
To: TDK CORPORATION
Reel/Frame 054494/0914 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 8, 2019
From: MAYER, KLAUS; SIEGEL, CHRISTIAN; LEIDL, ANTON; PAHL, WOLFGANG; STUFLER, STEFAN
To: TDK ELECTRONICS AG
Reel/Frame 050006/0156 →
Priority Claims (1)
DE 102018113498.3 · Jun 6, 2018 · national
Continuity (1)
Related Publication 20190375630A1 · Dec 12, 2019