IP Library Granted Patent US 11,562,978
Granted Patent B2
US 11,562,978 · App. 16/468,264 · Granted Jan 24, 2023

Decoupling capacitor mounted on an integrated circuit die, and method of manufacturing the same

Inventors: Florence R. Pon (Folsom, CA); Tyler Leuten (Orangevale, CA); John K. Yap (Folsom, CA)
Assignee: Intel Corporation
H01L24/48H01L23/50H01L23/528H01L24/49H01L25/0657H01L2224/48091H01L2224/48145H01L2224/48491H01L2224/49175H01L2224/49429H01L2225/0651H01L2225/06506H01L2225/06513H01L2225/06562H01L2225/06593H01L2924/00014H01L2924/0132H01L2924/0133H01L2924/07811H01L2924/10253H01L2924/14H01L2924/19041H01L2924/19104H01L2924/38
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Quick Facts
Patent No.
US 11,562,978
App. No.
16/468,264
Granted
Jan 24, 2023
Kind
B2
Abstract

Electronic device package technology is disclosed. In one example, an electronic device comprises a die ( 18 ) having a bond pad ( 22 ); and a decoupling capacitor ( 14 ) mounted on the die ( 18 ) and electrically coupled to the die ( 18 ). A method for making an electronic device comprises mounting a decoupling capacitor ( 14 ) on a die ( 18 ); and electrically coupling the decoupling capacitor ( 14 ) to the die ( 18 ).

Claims (53)

1. An electronic device, comprising:

a substrate;

a die mounted directly on the substrate, the die having a bond pad;

a decoupling capacitor mounted directly on the die and directly electrically coupled to the die, the decoupling capacitor having a first contact and a second contact, wherein one of the first contact or the second contact of the decoupling capacitor is in direct contact with the bond pad of the die;

a first bond wire in direct contact with the first contact of the decoupling capacitor, the first bond wire extending directly to the substrate; and

a second bond wire in direct contact with the second contact of the decoupling capacitor, the second bond wire extending directly to the substrate.

2. The electronic device of claim 1 , wherein the decoupling capacitor is mounted directly on a surface of the die.

3. The electronic device of claim 1 , wherein the decoupling capacitor is a surface mount capacitor with opposite contacts; and

wherein one of the contacts is disposed on and electrically coupled to the bond pad.

4. The electronic device of claim 1 , wherein the bond pad is located adjacent to a target wire bond pad and between the target wire bond pad and a cut edge of the die.

5. The electronic device of claim 4 , further comprising a corresponding bond pad in a scribe region of the die; and

wherein the decoupling capacitor has opposite contacts with one contact disposed on and electrically coupled to the bond pad adjacent the target wire bond pad and another contact disposed on the corresponding bond pad in the scribe region.

6. The electronic device of claim 1 , wherein the decoupling capacitor straddles a boundary between an active region of the die and a scribe region of the die.

7. The electronic device of claim 6 , wherein the decoupling capacitor has opposite contacts with one contact in the active region of the die and another contact in the scribe region of the die.

8. The electronic device of claim 1 , wherein the decoupling capacitor is disposed between a target wire bond pad and a cut edge of the die.

9. The electronic device of claim 1 , wherein the bond pad comprises a pair of adjacent bond pads; and

wherein the decoupling capacitor has opposite contacts each disposed on and electrically coupled to a different one of the pair of adjacent bond pads.

10. The electronic device of claim 9 , wherein the pair of adjacent wire bond pads is exposed beyond the decoupling capacitor.

11. The electronic device of claim 10 , further comprising a pair of bond wires each on a different one of the pair of adjacent wire bond pads with the decoupling capacitor therebetween.

12. The electronic device of claim 9 , wherein the pair of adjacent wire bond pads is substantially covered by the decoupling capacitor.

13. The electronic device of claim 12 , further comprising a pair of bond wires each on a different one of opposite contacts of the decoupling capacitor, and electrically coupled to the pair of adjacent wire bond pads through the contacts of the decoupling capacitor.

14. The electronic device of claim 1 , wherein the die is an upper die disposed on a lower die in a die stack; and wherein the decoupling capacitor has one contact disposed on and electrically coupled to the bond pad of the upper die and another contact beyond a cut edge of the upper die; and further comprising a standoff extending between a bond pad of the lower die and the another contact of the decoupling capacitor.

15. A method for making an electronic device, comprising:

mounting a die directly on a substrate, the die having a bond pad;

mounting a decoupling capacitor directly on the die, the decoupling capacitor having a first contact and a second contact, wherein one of the first contact or the second contact of the decoupling capacitor is in direct contact with the bond pad of the die;

directly electrically coupling the decoupling capacitor to the die;

connecting a first wire bond directly to the first contact of the capacitor, the first wire bond extending directly to the substrate; and

connecting a second wire bond directly to the second contact of the capacitor, the second wire bond extending directly to the substrate.

16. The method of claim 15 , further comprising mounting the decoupling capacitor directly on a surface of the die.

17. The method of claim 15 , wherein the decoupling capacitor is a surface mount capacitor with opposite contacts; and further comprising disposing and electrically coupling one of the contacts to the bond pad of the die.

18. The method of claim 15 , wherein the bond pad is located adjacent to a target wire bond pad and between the target wire bond pad and a cut edge of the die.

19. The method of claim 18 , further comprising a corresponding bond pad in a scribe region of the die; and wherein the decoupling capacitor has opposite contacts; and further comprising disposing and electrically coupling the opposite contact to the bond pad adjacent the target wire bond pad and the corresponding bond pad in the scribe region.

20. The method of claim 15 , further comprising locating the decoupling capacitor to straddle a boundary between an active region of the die and a scribe region of the die.

21. The method of claim 20 , wherein the decoupling capacitor has opposite contacts; and further comprising locating the decoupling capacitor with one contact in the active region of the die and another contact in the scribe region of the die.

22. The method of claim 15 , wherein the decoupling capacitor is disposed between a target wire bond pad and a cut edge of the die.

23. The method of claim 15 , wherein the bond pad comprises a pair of adjacent bond pads; and wherein the decoupling capacitor has opposite contacts; and further comprising disposing and electrically coupling each of the opposite contacts to a different one of the pair of adjacent bond pads.

24. The method of claim 23 , wherein the pair of adjacent wire bond pads is exposed beyond the decoupling capacitor.

25. The method of claim 24 , further comprising bonding a pair of bond wires each on a different one of the pair of adjacent wire bond pads with the decoupling capacitor therebetween.

26. The method of claim 23 , wherein the pair of adjacent wire bond pads is substantially covered by the decoupling capacitor.

27. The method of claim 26 , further comprising bonding a pair of bond wires each on a different one of opposite contacts of the decoupling capacitor, and electrically coupling the bond wires to the pair of adjacent wire bond pads through the contacts of the decoupling capacitor.

28. The method of claim 15 , wherein the die is an upper die; and further comprising:

arranging the upper die on a lower die to form a die stack;

disposing and electrically coupling one contact of the decoupling capacitor to the bond pad of the upper die;

locating another contact of the decoupling capacitor beyond a cut edge of the upper die; and

locating a standoff between a bond pad of the lower die and the another contact of the decoupling capacitor.

29. An electronic device, comprising:

a substrate;

a die mounted directly on the substrate, the die having a bond pad; and

a decoupling capacitor mounted directly on the die and directly electrically coupled to the die, wherein the decoupling capacitor straddles a boundary between an active region of the die and a scribe region of the die, and wherein an contact of the decoupling capacitor is in direct contact with the bond pad of the die.

30. An electronic device, comprising:

a substrate;

a die mounted directly on the substrate, the die having a bond pad; and

a decoupling capacitor mounted directly on the die and directly electrically coupled to the die, wherein the die is an upper die disposed on a lower die in a die stack; and wherein the decoupling capacitor has one contact in direct contact with and electrically coupled to the bond pad of the upper die and another contact beyond a cut edge of the upper die; and further comprising a standoff extending between a bond pad of the lower die and the another contact of the decoupling capacitor.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 17, 2025
From: INTEL CORPORATION
To: SK HYNIX NAND PRODUCT SOLUTIONS CORP. (DBA SOLIDIGM)
Reel/Frame 072792/0414 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 20, 2022
From: PON, FLORENCE R.; LEUTEN, TYLER; YAP, JOHN K.
To: INTEL CORPORATION
Reel/Frame 062163/0767 →
Continuity (1)
Related Publication 20190312005A1 · Oct 10, 2019
Cited By (2)
US 12,580,126 US 12,614,677