Radiation-emitting semiconductor arrangement and device having a radiation-emitting semiconductor arrangement

1. A radiation-emitting semiconductor arrangement comprising at least one semiconductor body having an active region that generates a primary radiation, wherein the active region emits coherent or partially coherent primary radiation in an infrared spectral range during operation of the semiconductor arrangement, and a radiation conversion element, wherein the radiation conversion element converts the primary radiation at least partially into a secondary radiation during operation of the semiconductor arrangement, the radiation conversion element emits the secondary radiation at a narrow angle, the radiation conversion element emits the secondary radiation into a projected spatial angle of not more than π/5, the primary radiation causes a radiation conversion into secondary radiation in the radiation conversion element based on a non-linear optical process, the secondary radiation has a full half-width of at least 100 nm, and the secondary radiation comprises wavelengths which are smaller than the wavelengths of the primary radiation, and an optical deflector movable during operation of the semiconductor arrangement.

2. The radiation-emitting semiconductor arrangement according to claim 1 , wherein a full half-width of the secondary radiation is at least 100 nm.

3. The radiation-emitting semiconductor arrangement according to claim 1 , wherein the semiconductor arrangement comprises a first optical element arranged between the active region and the radiation conversion element.

4. The radiation-emitting semiconductor arrangement according to claim 1 , wherein the semiconductor arrangement comprises a second optical element, the radiation conversion element arranged in a beam path between the active region and the second optical element.

5. The radiation-emitting semiconductor arrangement according to claim 1 , wherein the secondary radiation comprises wavelengths smaller than the wavelengths of the primary radiation.

6. The radiation-emitting semiconductor arrangement according to claim 1 , wherein the semiconductor arrangement comprises a plurality of active regions that generate radiation and whose radiation impinges on each radiation conversion element.

7. The radiation-emitting semiconductor arrangement according to claim 6 , wherein at least two of the active regions are integrated in a semiconductor component.

8. The radiation-emitting semiconductor arrangement according to claim 6 , wherein at least two of the active regions are formed in separate semiconductor components and the primary radiation emitted by each semiconductor components is superimposed on the radiation conversion element.

9. The radiation-emitting semiconductor arrangement according to claim 1 , wherein a filter element that at least partially blocks the primary radiation is arranged downstream of the radiation conversion element in the radiation direction.

10. The radiation-emitting semiconductor arrangement according to claim 1 , wherein the movable optical deflector is arranged in a beam path between the active region and the radiation conversion element.

11. The radiation-emitting semiconductor arrangement according to claim 1 , wherein the radiation conversion element is arranged in a beam path between the active region and the movable optical deflector.

12. A device comprising the semiconductor arrangement according to claim 1 and a spectrometer on which at least part of the secondary radiation impinges during operation of the device.

13. A device comprising:

the semiconductor component according to claim 1 ;

a first radiation receiver having a plurality of first pixels; and

a second radiation receiver having a plurality of second pixels.

14. The device according to claim 13 , wherein the first radiation receiver is sensitive in the visible spectral range and the second radiation receiver is sensitive in the infrared spectral range.

15. The device according to claim 14 , wherein the semiconductor arrangement has a specifically reduced intensity in a sensitivity range of a human eye and the device has an evaluation unit that compensates for a signal reduced by the first radiation receiver in the sensitivity range by a signal from the second radiation receiver.

16. The device according to claim 13 , wherein the second radiation receiver measures a propagation time of at least one of the primary radiation and secondary radiation emitted by the semiconductor arrangement.