Method for transferring semiconductor bodies and semiconductor chip

1. A method comprising:

providing a semiconductor structure on a growth substrate;

arranging a cover layer on a side of the semiconductor structure facing away from the growth substrate, wherein the cover layer is mechanically fixedly connected to the semiconductor structure;

arranging a transfer structure on a side of the cover layer facing away from the semiconductor structure, wherein the transfer structure is mechanically fixedly connected to the cover layer via at least one contact structure, and wherein the contact structure forms the only contact point between the transfer structure and the cover layer;

removing the growth substrate from the semiconductor structure;

subdividing the semiconductor structure into a plurality of semiconductor bodies;

arranging a carrier on a side of the semiconductor body facing away from the transfer structure; and

removing the transfer structure from the semiconductor bodies,

wherein a mechanical connection between the transfer structure and the cover layer in a region of the contact structure is dissolved, and

wherein the contact structure comprises an inorganic dielectric.

2. A method comprising:

providing a semiconductor structure on a growth substrate;

arranging a cover layer on a side of the semiconductor structure facing away from the growth substrate, wherein the cover layer is mechanically fixedly connected to the semiconductor structure;

arranging a transfer structure on a side of the cover layer facing away from the semiconductor structure, wherein the transfer structure is mechanically fixedly connected to the cover layer via at least one contact structure, wherein a sacrificial layer is arranged between the cover layer and the transfer structure, and wherein the sacrificial layer does not cover any of the at least one contact structure;

removing the growth substrate from the semiconductor structure;

subdividing the semiconductor structure into a plurality of semiconductor bodies;

arranging a carrier on a side of the semiconductor body facing away from the transfer structure;

selectively removing the sacrificial layer; and

removing the transfer structure from the semiconductor bodies, wherein a mechanical connection between the transfer structure and the cover layer in a region of the contact structure is dissolved,

wherein the contact structure comprises an inorganic dielectric.

3. The method according to claim 2 , wherein removing the transfer structure comprises lifting off the semiconductor bodies in a direction perpendicular to a main extension plane of the transfer structure, and wherein the mechanical connection in the region of the contact structure is released when lifting off.

4. The method according to claim 2 , wherein a surface of the contact structure, which is exposed to the outside before arranging the transfer structure, is conditioned with a monolayer of a material different from the cover layer and/or the transfer structure.

5. The method according claim 2 , wherein the at least one contact structure is arranged in each case on an anchor structure, and wherein the anchor structure does not project beyond any semiconductor body in a lateral direction.

6. The method according to claim 2 , wherein a surface of the contact structure, which is exposed to the outside before arranging the transfer structure, is conditioned with a bonding agent.

7. The method according to claim 2 , wherein a surface of the contact structure, which is exposed to the outside before arranging the transfer structure, is selectively conditioned.

8. The method according to claim 2 , wherein a surface of the contact structure, which is exposed to the outside before arranging the transfer structure, is conditioned by a plasma.

9. The method according to claim 2 , wherein each semiconductor body is arranged to overlap in a vertical direction with a plurality of contact structures.