IP Library Granted Patent US 11,196,231
Granted Patent B2
US 11,196,231 · App. 16/500,078 · Granted Dec 7, 2021

Semiconductor laser diode and method for manufacturing a semiconductor laser diode

Inventors: Alfred Lell (Maxhütte-Haidhof, DE); Sebastian Taeger (Bad Abbach, DE)
Assignee: OSRAM OLED GMBH
H01S5/221H01S5/0287H01S5/222H01S5/2227H01S5/34333H01S2301/176
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Quick Facts
Patent No.
US 11,196,231
App. No.
16/500,078
Granted
Dec 7, 2021
Kind
B2
Abstract

A semiconductor laser diode and a method for manufacturing a semiconductor laser diode are disclosed. In an embodiment a semiconductor laser diode includes an epitaxially produced semiconductor layer sequence comprising at least one active layer and a gallium-containing passivation layer on at least one surface region of the semiconductor layer sequence.

Claims (33)

1. A semiconductor laser diode comprising:

an epitaxially produced semiconductor layer sequence comprising at least one active layer; and

a gallium-containing passivation layer on at least one surface region of the semiconductor layer sequence,

wherein the passivation layer comprises at least one layer with AlGaN, and

wherein a composition of the AlGaN varies over a thickness of the passivation layer.

2. The semiconductor laser diode according to claim 1 , wherein the passivation layer comprises a layer stack with at least one layer with GaN and at least one layer with AlN.

3. The semiconductor laser diode according to claim 1 , wherein the passivation layer comprises at least two layers with the same material having different thicknesses.

4. The semiconductor laser diode according to claim 1 , wherein the semiconductor layer sequence has a ridge waveguide structure with a ridge having ridge side surfaces, and wherein the surface region comprises at least one ridge side surface.

5. The semiconductor laser diode according to claim 4 , wherein the passivation layer at least partially planarizes the ridge waveguide structure.

6. The semiconductor laser diode according to claim 4 , wherein the passivation layer comprises at least a first layer formed laterally beside the ridge waveguide structure and spaced apart from the ridge waveguide structure, and wherein the first layer, a trench between the first layer and the ridge waveguide structure, and a side surface of the ridge waveguide structure is covered with a second layer.

7. The semiconductor laser diode according to claim 1 , wherein the passivation layer has a varying layer composition and/or a varying material composition along an emission direction of the semiconductor laser diode.

8. The semiconductor laser diode according to claim 1 , wherein the passivation layer is transparent and electrically insulating.

9. The semiconductor laser diode according to claim 1 , wherein the passivation layer has a lower crystallinity than all semiconductor layers of the semiconductor layer sequence.

10. The semiconductor laser diode according to claim 1 , wherein the passivation layer has a partially crystalline or amorphous crystal structure.

11. The semiconductor laser diode according to claim 1 , wherein the passivation layer and the semiconductor layer sequence comprise materials selected from the same III-V compound semiconductor material system.

12. The semiconductor laser diode according to claim 1 , wherein the passivation layer comprises a nitride.

13. The semiconductor laser diode according to claim 1 , wherein the passivation layer comprises at least one layer with GaN.

14. The semiconductor laser diode according to claim 1 , wherein the passivation layer comprises at least one layer with AlN.

15. The semiconductor laser diode according to claim 1 , further comprising an electrode layer arranged on the passivation layer.

16. The semiconductor laser diode according to claim 15 , wherein the passivation layer has a layer comprising GaN or AlGaN adjacent to the electrode layer.

17. A method for manufacturing the semiconductor laser diode according to claim 1 , the method comprising:

providing the semiconductor layer sequence; and

depositing the gallium-containing passivation layer on the at least one surface region of the semiconductor layer sequence by an atomic layer deposition.

18. A semiconductor laser diode comprising:

an epitaxially produced semiconductor layer sequence comprising at least one active layer; and

a gallium-containing passivation layer disposed on at least one surface region of the semiconductor layer sequence,

wherein the passivation layer has a lower crystallinity than all semiconductor layers of the semiconductor layer sequence.

19. A semiconductor laser diode comprising:

an epitaxially produced semiconductor layer sequence comprising at least one active layer; and

a gallium-containing passivation layer on at least one surface region of the semiconductor layer sequence,

wherein the passivation layer has a partial crystalline structure or amorphous crystal structure.

20. The semiconductor laser diode according to claim 19 , wherein the passivation layer is transparent and electrically insulating.

21. The semiconductor laser diode according to claim 19 , further comprising an electrode layer arranged on the passivation layer.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 3, 2020
From: OSRAM OPTO SEMICONDUCTORS GMBH
To: OSRAM OLED GMBH
Reel/Frame 051464/0504 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 29, 2019
From: LELL, ALFRED; TAEGER, SEBASTIAN
To: OSRAM OPTO SEMICONDUCTORS GMBH
Reel/Frame 050871/0920 →
Priority Claims (1)
DE 102017108435.5 · Apr 20, 2017 · national
Continuity (1)
Related Publication 20200112142A1 · Apr 9, 2020
Cited By (1)
US 12,362,535