IP Library Granted Patent US 10,964,596
Granted Patent B2
US 10,964,596 · App. 16/505,878 · Granted Mar 30, 2021

Backside metal patterning die singulation system and related methods

Inventor: Michael J. Seddon (Gilbert, AZ)
Assignee: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
H01L21/78H01L21/0274H01L21/268H01L21/32H01L21/32051H01L21/32131H01L22/20H01L23/544H01L2223/5446
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Quick Facts
Patent No.
US 10,964,596
App. No.
16/505,878
Granted
Mar 30, 2021
Kind
B2
Abstract

Implementations of methods of singulating a plurality of die included in a substrate may include forming a plurality of die on a first side of a substrate, forming a backside metal layer on a second side of a substrate, applying a photoresist layer over the backside metal layer, patterning the photoresist layer along a die street of the substrate, and etching through the backside metal layer located in the die street of the substrate. The substrate may be exposed through the etch. The method may also include singulating the plurality of die included in the substrate through removing a substrate material in the die street.

Claims (15)

1. A method of singulating a plurality of die comprised in a substrate, the method comprising:

forming a plurality of die on a first side of a substrate;

forming a seed layer on a second side of the substrate opposite the first side of the substrate;

applying a photoresist layer over the seed layer;

exposing the photoresist layer with a mask comprising a plurality of parallel slits thereon;

rotating the mask 90 degrees and exposing the photoresist layer with the mask;

forming a backside metal layer over the seed layer;

removing the photoresist layer; and

singulating the plurality of die comprised in the substrate through removing substrate material in a die street and through removing the seed layer material in the die street.

2. The method of claim 1 , wherein the seed layer comprises titanium.

3. The method of claim 1 , wherein the backside metal layer comprises copper.

4. The method of claim 1 , wherein removing substrate material in the die street further comprises plasma etching.

5. The method of claim 1 , wherein removing substrate material in the die street and removing seed layer material in the die street further comprises using one of a laser beam or a saw blade.

6. The method of claim 1 , further comprising thinning the second side of the substrate to a thickness less than 30 micrometers.

7. The method of claim 1 , further comprising aligning the substrate from a backside of the substrate.

Assignments (4)
RELEASE OF SECURITY INTEREST IN PATENTS RECORDED AT REEL 051145, FRAME 0062 Recorded Jun 23, 2023
From: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC; FAIRCHILD SEMICONDUCTOR CORPORATION
Reel/Frame 064079/0474 →
CORRECTIVE ASSIGNMENT TO CORRECT THE EXCLUSION OF FAIRCHILD SEMICONDUCTOR CORPORATION OF CONVEYING PARTY PREVIOUSLY RECORDED ON REEL 051145 FRAME 0062. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY INTEREST. Recorded Dec 3, 2019
From: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC; FAIRCHILD SEMICONDUCTOR CORPORATION
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 051170/0781 →
SECURITY INTEREST Recorded Nov 26, 2019
From: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 051145/0062 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 9, 2019
From: SEDDON, MICHAEL J.
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 049697/0169 →