IP Library Granted Patent US 10,825,725
Granted Patent B2
US 10,825,725 · App. 16/505,902 · Granted Nov 3, 2020

Backside metal patterning die singulation systems and related methods

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Quick Facts
Patent No.
US 10,825,725
App. No.
16/505,902
Granted
Nov 3, 2020
Kind
B2
Abstract

Implementations of die singulation systems and related methods may include forming a plurality of die on a first side of a substrate, forming a seed layer on a second side of a substrate opposite the first side of the substrate, using a shadow mask, applying a mask layer over the seed layer, forming a backside metal layer over the seed layer, removing the mask layer, and singulating the plurality of die included in the substrate through removing substrate material in the die street and through removing seed layer material in the die street.

Claims (39)

1. A method of singulating a plurality of die comprised in a substrate, the method comprising:

forming a plurality of die on a first side of a substrate;

forming a seed layer on a second side of the substrate opposite the first side of the substrate;

using a shadow mask, applying a mask layer over the seed layer;

forming a backside metal layer over the seed layer;

removing the mask layer; and

singulating the plurality of die comprised in the substrate through removing substrate material in the die street and through removing seed layer material in the die street.

2. The method of claim 1 , wherein the mask layer comprises a polymer material.

3. The method of claim 1 , wherein the mask layer comprises a photoresist material.

4. The method of claim 1 , wherein the seed layer comprises titanium.

5. The method of claim 1 , wherein the backside metal layer comprises copper.

6. The method of claim 1 , wherein removing substrate material in the die street further comprises plasma etching.

7. The method of claim 1 , wherein removing substrate material in the die street and removing seed layer material in the die street further comprises using one of a laser beam or a saw blade.

8. The method of claim 1 , further comprising thinning the second side of the substrate to a thickness less than 30 micrometers.

9. The method of claim 1 , further comprising aligning the substrate from a backside of the substrate.

10. A method of singulating a plurality of die comprised in a substrate, the method comprising:

forming a plurality of die on a first side of a substrate;

forming a seed layer on a second side of the substrate opposite the first side of the substrate;

using a shadow mask, applying a mask layer over the seed layer;

removing the shadow mask;

forming a backside metal layer over the seed layer;

removing the mask layer;

singulating the plurality of die comprised in the substrate through removing substrate material in the die street and through removing seed layer material in the die street using one of a laser beam or a saw blade.

11. The method of claim 10 , wherein the mask layer comprises a resin material.

12. The method of claim 10 , wherein the mask layer comprises a photoresist material.

13. The method of claim 10 , further comprising remote plasma healing a sidewall of the die street.

14. The method of claim 10 , further comprising thinning the second side of the substrate to a thickness less than 30 micrometers.

15. The method of claim 10 , further comprising aligning the substrate from a backside of the substrate.

16. A method of singulating a plurality of die comprised in a substrate, the method comprising:

forming a plurality of die on a first side of a substrate;

forming a seed layer on a second side of the substrate opposite the first side of the substrate;

using a shadow mask corresponding to die streets of the substrate, forming a mask layer over the die streets of the substrate;

forming a backside metal layer over the seed layer between the mask layer;

removing the mask layer from the die streets;

singulating the plurality of die comprised in the substrate through removing substrate material in the die street and through removing seed layer material in the die street using one of a laser beam or a saw blade.

17. The method of claim 16 , wherein the mask layer comprises a photoresist material.

18. The method of claim 16 , further comprising remote plasma healing a sidewall of the plurality of die.

19. The method of claim 16 , wherein the backside metal layer is 10 micrometers thick.

20. The method of claim 16 , wherein the mask layer comprises a resin.

Assignments (4)
RELEASE OF SECURITY INTEREST IN PATENTS RECORDED AT REEL 051145, FRAME 0062 Recorded Jun 23, 2023
From: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC; FAIRCHILD SEMICONDUCTOR CORPORATION
Reel/Frame 064079/0474 →
CORRECTIVE ASSIGNMENT TO CORRECT THE EXCLUSION OF FAIRCHILD SEMICONDUCTOR CORPORATION OF CONVEYING PARTY PREVIOUSLY RECORDED ON REEL 051145 FRAME 0062. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY INTEREST. Recorded Dec 3, 2019
From: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC; FAIRCHILD SEMICONDUCTOR CORPORATION
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 051170/0781 →
SECURITY INTEREST Recorded Nov 26, 2019
From: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 051145/0062 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 9, 2019
From: SEDDON, MICHAEL J.
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 049697/0528 →