Workpiece storage system, method of storing workpiece, and method of transferring workpiece using the same

1. A method for storage of a workpiece used in fabrication of a semiconductor device, the method comprising:

disposing the workpiece on a workpiece carrier, wherein the workpiece is a wafer box, a wafer pod, a photomask box, a photomask pod, or a standard mechanical interface (SMIF) device;

disposing the workpiece carrier with the workpiece in a workpiece container via a workpiece storage system;

identifying a content of the workpiece container; and

adjusting a storage condition inside the workpiece container in response to the content of the workpiece container via the workpiece storage system.

2. The method of claim 1 , further comprising:

disposing a wafer in the workpiece container prior to adjusting the storage condition inside the workpiece container.

3. The method of claim 2 , further comprising:

identifying the workpiece prior to disposing the workpiece carrier with the workpiece in the workpiece container.

4. The method of claim 1 , further comprising:

determining a disposing position of the workpiece carrier in the workpiece container according to a height of the workpiece.

5. The method of claim 1 , further comprising:

acquiring width information of the workpiece prior to disposing the workpiece on the workpiece carrier.

6. The method of claim 1 , wherein identifying the content of the workpiece container comprises:

detecting the workpiece container through radio frequency identification (RFID), optical mark recognition (OMR), or a combination thereof.

7. The method of claim 1 , wherein adjusting the storage condition comprises:

injecting a gas into the workpiece container; and

controlling at least one of temperature, humidity, gas ingredient, and total organic carbon (TOC) inside the workpiece container by the gas.

8. The method of claim 1 , further comprising:

cleaning the workpiece container prior to adjusting the storage condition.

9. The method of claim 1 , further comprising:

monitoring the storage condition inside the workpiece container.

10. The method of claim 1 , further comprising:

detecting whether a gas leak issue happens to the workpiece container.

11. The method of claim 1 , further comprising:

transporting and storing the workpiece container in a semiconductor fabrication facility (FAB).

12. The method of claim 11 , wherein transporting and storing the workpiece container comprises:

moving the workpiece container by an automated material handling system (AMHS).

13. A method for transferring a workpiece used in fabrication of a semiconductor device, the method comprising:

providing a demand of using the workpiece via a workpiece storage system;

locating a workpiece container containing the workpiece;

transferring the workpiece container to a processing tool;

taking out a workpiece carrier that holds the workpiece from the workpiece container via the workpiece storage system;

processing the workpiece through the processing tool; and

transferring the workpiece container to a gas distribution module after taking out the workpiece carrier from the workpiece container.

14. The method of claim 13 , further comprising:

identifying a content of the workpiece container; and

adjusting a storage condition inside the workpiece container through the gas distribution module in response to the content of the workpiece container.

15. The method of claim 13 , further comprising:

checking if the workpiece in the workpiece container meets the demand after transferring the workpiece container to the processing tool; and

transferring the workpiece container to a stocker if the workpiece in the workpiece container does not meet the demand.

16. The method of claim 13 , further comprising:

checking if the workpiece in the workpiece container meets the demand after transferring the workpiece container to the processing tool; and

proceeding with taking out the workpiece carrier if the workpiece in the workpiece container meets the demand.

17. The method of claim 13 , further comprising:

identifying the workpiece in the workpiece container before taking out the workpiece carrier that holds the workpiece from the workpiece container.

18. The method of claim 13 , further comprising:

unloading the workpiece from the workpiece carrier after taking out the workpiece carrier.

19. A workpiece storage system, comprising:

a workpiece container having an internal space for storing at least one workpiece;

supporting structures fixed on inner sidewalls of the workpiece container and suspended over a bottom wall of the workpiece container;

a workpiece carrier comprising a platform and a plurality of pins protruding from the platform;

a transport module:

configured to transport the workpiece container in a semiconductor fabrication facility (FAB);

configured to load a workpiece on the platform of the workpiece carrier such that the workpiece touches at least one of the plurality of pins; and

configured to transport the workpiece carrier with the workpiece on the supporting structures, such that the supporting structures support the workpiece carrier with the workpiece;

an identification module configured to identify a content of the workpiece container;

a gas distribution module configured to adjust a storage condition of the internal space of the workpiece container; and

a control module connected to the transport module, the identification module, and the gas distribution module, wherein the control module is configured to coordinate functions of the transport module, the identification module, and the gas distribution module.

20. The method of claim 1 , wherein disposing the workpiece carrier with the workpiece in the workpiece container comprises disposing the workpiece carrier with the workpiece on supporting structures fixed on inner sidewalls of the workpiece container.