IP Library Granted Patent US 10,930,517
Granted Patent B2
US 10,930,517 · App. 16/532,477 · Granted Feb 23, 2021

Method of forming fin-shaped structure

Inventors: Wen-Jiun Shen (Yunlin County, TW); Ssu-I Fu (Kaohsiung, TW); Yen-Liang Wu (Taipei, TW); Chia-Jong Liu (Ping-Tung County, TW); Yu-Hsiang Hung (Tainan, TW); Chung-Fu Chang (Tainan, TW); Man-Ling Lu (Taoyuan, TW); Yi-Wei Chen (Taichung, TW)
Assignee: UNITED MICROELECTRONICS CORP.
H01L21/308H01L21/30604H01L21/823431H01L27/0886H01L29/66818H01L21/02238
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Quick Facts
Patent No.
US 10,930,517
App. No.
16/532,477
Granted
Feb 23, 2021
Kind
B2
Abstract

A fin-shaped structure includes a substrate having a first fin-shaped structure located in a first area and a second fin-shaped structure located in a second area, wherein the second fin-shaped structure includes a ladder-shaped cross-sectional profile part. The present invention also provides two methods of forming this fin-shaped structure. In one case, a substrate having a first fin-shaped structure and a second fin-shaped structure is provided. A treatment process is performed to modify an external surface of the top of the second fin-shaped structure, thereby forming a modified part. A removing process is performed to remove the modified part through a high removing selectivity to the first fin-shaped structure and the second fin-shaped structure, and the modified part, thereby the second fin-shaped structure having a ladder-shaped cross-sectional profile part is formed.

Claims (17)

1. A method of forming a fin-shaped structure, comprising:

providing a substrate having a first fin-shaped structure located in a first area and a second fin-shaped structure located in a second area;

forming a first gate across the first fin-shaped structure and a second gate across the second fin-shaped structure, wherein the first gate sequentially comprises a first dielectric layer and a first sacrificial gate covering the first fin-shaped structure, and the second gate sequentially comprises a second dielectric layer and a second sacrificial gate covering the second fin-shaped structure;

removing the first sacrificial gate and the second sacrificial gate, thereby exposing the first dielectric layer and the second dielectric layer;

covering a mask in the first area but exposing the second area;

performing a removing process to remove an external surface of a top part of the second fin-shaped structure; and

removing the mask.

2. The method of forming a fin-shaped structure according to claim 1 , further comprising:

forming a dielectric layer covering the first fin-shaped structure and the second fin-shaped structure after the mask is removed.

3. The method of forming a fin-shaped structure according to claim 1 , wherein the external surface of the top part of the second fin-shaped structure and the whole second dielectric layer are removed by the removing process.

4. The method of forming a fin-shaped structure according to claim 1 , further comprising:

removing the first dielectric layer completely after the mask is removed.

5. The method of forming a fin-shaped structure according to claim 1 , further comprising:

removing the first dielectric layer and the second dielectric layer completely before covering the mask.

6. The method of forming a fin-shaped structure according to claim 1 , further comprising:

forming an isolation structure beside the first fin-shaped structure of the first area and beside the second fin-shaped structure of the second area respectively after the substrate is provided, wherein a top part of the isolation structure of the second area is also removed while the removing process is performed.

7. The method of forming a fin-shaped structure according to claim 1 , wherein the removing process has no removing selectivity to the isolation structure and the second fin-shaped structure.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 26, 2021
From: UNITED MICROELECTRONICS CORPORATION
To: MARLIN SEMICONDUCTOR LIMITED
Reel/Frame 056991/0292 →