BORON CARBIDE SINTERED BODY AND ETCHER INCLUDING THE SAME
A boron carbide sintered body includes necked boron carbide-containing particles. The thermal conductivity of the boron carbide sintered body at 400° C. is 27 W/m·K or less and the ratio of the thermal conductivity of the boron carbide sintered body at 25° C. to that of the boron carbide sintered body at 800° C. is 1:0.2 to 1:3.
1 . A boron carbide sintered body comprising necked boron carbide-containing particles wherein the thermal conductivity of the boron carbide sintered body at 400° C. is 27 W/m·K or less and the ratio of the thermal conductivity of the boron carbide sintered body at 25° C. to that of the boron carbide sintered body at 800° C. is 1:0.2 to 1:3.
2 . The boron carbide sintered body according to claim 1 , wherein the particles comprise a particle diameter (D 50 ) of 1.5 μm or less.
3 . The boron carbide sintered body according to claim 1 , wherein the boron carbide sintered body comprises a surface roughness (Ra) of 0.1 μm to 1.2 μm.
4 . The boron carbide sintered body according to claim 1 , wherein the boron carbide sintered body comprises a porosity of 3% or less.
5 . The boron carbide sintered body according to claim 1 , wherein the boron carbide sintered body comprises an average surface or cross-sectional pore diameter of 5 μm or less.
6 . The boron carbide sintered body according to claim 1 , wherein the area of pores comprising an average surface or cross-sectional diameter of 10 μm or more accounts for 5% or less of the area of all pores in the boron carbide sintered body.
7 . The boron carbide sintered body according to claim 1 , wherein the boron carbide sintered body does not form particles upon contact with fluorine ions or chlorine ions in a plasma etcher.
8 . The boron carbide sintered body according to claim 1 , wherein the etch rate of the boron carbide sintered body is 55% or less of that of silicon.
9 . The boron carbide sintered body according to claim 1 , wherein the etch rate of the boron carbide sintered body is 70% or less of that of CVD-SiC.
10 . An etcher comprising the boron carbide sintered body according to claim 1 .
11 . An etcher comprising a boron carbide sintered body comprising necked boron carbide-containing particles wherein the thermal conductivity of the boron carbide sintered body at 400° C. is 27 W/m·K or less and the ratio of the thermal conductivity of the boron carbide sintered body at 25° C. to that of the boron carbide sintered body at 800° C. is 1:0.2 to 1:3.
12 . The etcher according to claim 11 , wherein the etcher is a plasma etcher.
13 . A boron carbide sintered body comprising necked boron carbide-containing particles wherein the relative density of the boron carbide sintered body measured by the Archimedes method is 90% or greater.
14 . The boron carbide sintered body according to claim 13 , wherein the relative density of the boron carbide sintered body measured by the Archimedes method is 95% or greater.
15 . The boron carbide sintered body according to claim 13 , comprising 500 ppm or less of metallic by-products.
16 . The boron carbide sintered body according to claim 13 , wherein the boron carbide sintered body is relatively inert relative to iridium upon contact with fluorine ions or chlorine ions in a plasma etcher.
17 . The boron carbide sintered body according to claim 13 , wherein the thermal conductivity of the boron carbide sintered body at 400° C. is 27 W/m·K or less.
18 . An etcher comprising the boron carbide sintered body according to claim 13 .