Three-dimensional measurement device

1. A three-dimensional measurement device, comprising:

a projector that comprises:

a light source that emits predetermined light; and

a reflective optical modulator that converts the predetermined light into a predetermined striped pattern, wherein the projector projects the predetermined striped pattern onto a measurement object at a predetermined number of frames per unit time;

an imaging device that takes an image of the measurement object projected with the predetermined striped pattern;

a processor that:

controls the projector and the imaging device to sequentially project a plurality of different ones of the predetermined striped pattern and take images of the plurality of different ones of the predetermined striped pattern to obtain a plurality of image data having different light intensity distributions; and

executes three-dimensional measurement of the measurement object based on the plurality of image data, wherein

the reflective optical modulator comprises a plurality of two-dimensionally arranged pixels that are alternatively changeable between a first state in which light entering the reflective optical modulator from the light source is reflected onto the measurement object and a second state different from the first state,

the reflective optical modulator changes a ratio of the two-dimensionally arranged pixels in the first state in one frame period to generate the predetermined striped pattern,

the processor obtains one image data out of the plurality of image data by executing an imaging process that sequentially takes images during a predetermined period that includes a striped pattern projection period, wherein

one of the plurality of different ones of the predetermined stripped pattern is projected for a predetermined number of frames within the striped pattern projection period, and

the processor further:

sets, before and after the striped pattern projection period, a full black pattern projection period for at least one frame during which a predetermined full black pattern is projected; and

starts the imaging process during the full black pattern projection period before the striped pattern projection period, and

terminates the imaging process during the full black pattern projection period after the striped pattern projection period.

2. A three-dimensional measurement device, comprising:

a projector that comprises:

a light source that emits predetermined light; and

a reflective optical modulator that converts the predetermined light into a predetermined striped pattern, wherein the projector projects the predetermined striped pattern onto a measurement object at a predetermined number of frames per unit time;

an imaging device that takes an image of the measurement object projected with the predetermined striped pattern;

a processor that:

controls the projector and the imaging device to sequentially project a plurality of different ones of the predetermined striped pattern and take images of the plurality of different ones of the predetermined striped pattern to obtain a plurality of image data having different light intensity distributions; and

executes three-dimensional measurement of the measurement object based on the plurality of image data, wherein

the reflective optical modulator comprises a plurality of two-dimensionally arranged pixels that are alternatively changeable between a first state in which light entering the reflective optical modulator from the light source is reflected onto the measurement object and a second state different from the first state,

the reflective optical modulator changes a ratio of the two-dimensionally arranged pixels in the first state in one frame period to generate the predetermined striped pattern,

the processor obtains one image data out of the plurality of image data by executing an imaging process that sequentially takes images during a predetermined period that includes a striped pattern projection period wherein

one of the plurality of different ones of the predetermined striped pattern is projected for two or more frames in the stripped pattern projection period, and

during the stripped pattern projection period, the processor further:

starts the imaging process synchronously with a start timing of a first frame, among the two or more frames;

terminates the imaging process synchronously with an end timing of a last frame, among the two or more frames; and

creates at least one unused frame between an end of projecting or imaging of one of the plurality of different ones of the predetermined striped pattern and a start of projecting or imaging of another of the plurality of different ones of the predetermined striped pattern.

3. A three-dimensional measurement device, comprising:

a projector that comprises:

a light source that emits predetermined light; and

a reflective optical modulator that converts the predetermined light into a predetermined striped pattern, wherein the projector projects the predetermined striped pattern onto a measurement object at a predetermined number of frames per unit time;

an imaging device that takes an image of the measurement object projected with the predetermined striped pattern;

a processor that:

controls the projector and the imaging device to sequentially project a plurality of different ones of the predetermined striped pattern and take images of the plurality of different ones of the predetermined striped pattern to obtain a plurality of image data having different light intensity distributions; and

executes three-dimensional measurement of the measurement object based on the plurality of image data, wherein

the reflective optical modulator comprises a plurality of two-dimensionally arranged pixels that are alternatively changeable between a first state in which light entering the reflective optical modulator from the light source is reflected onto the measurement object and a second state different from the first state, and

the reflective optical modulator changes a ratio of the two-dimensionally arranged pixels in the first state in one frame period to generate the predetermined striped pattern, and

the processor obtains one image data out of the plurality of image data by executing an imaging process that sequentially takes images during a predetermined period that includes a striped pattern projection period, wherein

one of the plurality of different ones of the predetermined striped pattern is projected for two or more frames in the stripped pattern projection period,

the processor further:

sets, before the striped pattern projection period, a full black pattern projection period for at least one frame during which a predetermined full black pattern is projected;

starts the imaging process during the full black pattern projection period before the striped pattern projection period; and

creates at least one unused frame between an end of projecting or imaging of one of the plurality of different ones of the predetermined striped pattern and a start of projecting or imaging of another of the plurality of different ones of the predetermined striped pattern.

4. A three-dimensional measurement device, comprising:

a projector that comprises:

a light source that emits predetermined light; and

a reflective optical modulator that converts the predetermined light into a predetermined striped pattern, wherein the projector projects the predetermined striped pattern onto a measurement object at a predetermined number of frames per unit time;

an imaging device that takes an image of the measurement object projected with the predetermined striped pattern;

a projector that:

controls the projector and the imaging device to sequentially project a plurality of different ones of the predetermined striped patterns and take images of the plurality of different ones of the predetermined striped pattern to obtain a plurality of image data having different light intensity distributions; and

executes three-dimensional measurement of the measurement object based on the plurality of image data, wherein

the reflective optical modulator comprises a plurality of pixels that are two-dimensionally arranged and are alternatively changeable between a first state in which light entering the reflective optical modulator from the light source is reflected onto the measurement object and a second state different from the first state,

the reflective optical modulator changes a ratio of the two-dimensionally arranged pixels in the first state in one frame period to generate the predetermined striped pattern,

the processor obtains one image data out of the plurality of image data by executing an imaging process that sequentially takes images during a predetermined period that includes a striped pattern projection period, wherein

one of the plurality of different ones of the predetermined striped pattern is projected for two or more frames in the stripped pattern projection period, and

the processor:

sets, after the striped pattern projection period, a full black pattern projection period for at least one frame during which a predetermined full black pattern is projected;

terminates the imaging process during the full black pattern projection period after the striped pattern projection period; and

creates at least one unused frame between an end of projecting or imaging of one of the plurality of different ones of the predetermined striped pattern and a start of projecting or imaging of another of the plurality of different ones of the predetermined striped pattern.

5. A three-dimensional measurement device, comprising:

a projector that comprises:

a light source that emits predetermined light; and

a reflective optical modulator that converts the predetermined light into a predetermined striped pattern, wherein the projector projects the predetermined striped pattern onto a measurement object at a predetermined number of frames per unit time;

an imaging device that takes an image of the measurement object projected with the striped pattern;

a processor that:

controls the projector and the imaging device to sequentially project a plurality of different ones of the predetermined striped patterns and take images of the plurality of different ones of the predetermined striped patterns to obtain a plurality of image data having different light intensity distributions; and

executes three-dimensional measurement of the measurement object based on the plurality of image data, wherein

the reflective optical modulator comprises a plurality of pixels that are two-dimensionally arranged and are alternatively changeable between a first state in which light entering the reflective optical modulator from the light source is reflected onto the measurement object and a second state different from the first state, and

the reflective optical modulator changes a ratio of the two-dimensionally arranged pixels in the first state in one frame period to generate the predetermined striped pattern, and

the processor obtains one image data out of the plurality of image data by executing an imaging process that sequentially takes images during a predetermined period that includes at least a striped pattern projection period, wherein

one of the plurality of different ones of the predetermined striped pattern is projected for two or more frames in the stripped pattern projection period, wherein

during the striped pattern projection period, the processor further:

starts a lighting process of the light source synchronously with a start timing of a first frame, among the two or more frames; and

terminates the lighting process synchronously with an end timing of a last frame, among the two or more frames.

6. The three-dimensional measurement device according to claim 1 , wherein

the reflective optical modulator is a digital micromirror device that comprises a plurality of movable mirrors that each correspond to one of the plurality of pixels,

the movable mirror swings and displaces about a predetermined axis, and

the movable mirror alternatively changes between a first inclination state in which the light entering the reflective optical modulator from the light source is reflected onto the measurement object and a second inclination state different from the first inclination state.

7. The three-dimensional measurement device according to claim 1 , wherein

the reflective optical modulator generates a light pattern with a light intensity distribution of a sinusoidal waveform as the predetermined striped pattern, and

the processor further:

sequentially projects the plurality of different ones of the predetermined striped pattern with different phases and takes images of the plurality of different ones of the striped pattern to obtain the plurality of image data; and

executes the three-dimensional measurement using a phase shift method.

8. The three-dimensional measurement device according to claim 1 , wherein the measurement object is a printed circuit board on which solder paste is printed or a printed circuit board on which an adhesive is applied.