Testing head with improved frequency property

1. A testing head comprising:

a plurality of vertical contact probes, each vertical contact probe comprising:

a first end region and a second end region; and

a body which extends between the first end region and the second end region;

a first guide including a plurality of first housing guide holes to house the plurality of vertical contact probes; and

a second guide including a plurality of second housing guide holes to house the plurality of vertical contact probes, the second guide being separated by an air zone from the first guide, and

wherein the first guide comprises at least one conductive portion at least partially lying on one face of the first guide,

wherein the at least one conductive portion extends to a respective rim of each of the plurality of first housing guide holes of the first guide, the at least one conductive portion electrically connects and directly contacts an outer metal periphery of vertical contact probes of a first group of the plurality of vertical contact probes at respective rims of respective ones of the plurality of first housing guide holes housing the first group of the plurality of vertical contact probes, the vertical contact probes of the first group sliding in respective ones of the plurality of first housing guide holes realized in the at least one conductive portion and being adapted to carry a same signal, and

wherein each vertical contact probe of a second group of the plurality of vertical contact probes is surrounded by a coating layer made of an insulating material, the coating layer covering less than half of each vertical contact probe of the second group, and the coating layer extending along the body of each vertical contact probe of the second group, the coating layer insulating the vertical contact probes of the second group from the at least one conductive portion at the respective rims of respective ones the plurality of first housing guide holes of the first guide, the coating layer forming outer periphery sections of the vertical contact probes of the second group and sized to fit through respective ones of the plurality of first housing guide holes.

2. The testing head of claim 1 , wherein the at least one conductive portion is configured to be connected to a common signal reference selected from a ground reference, a power reference, or an operating signal reference.

3. The testing head of claim 1 , wherein the at least one conductive portion comprises an orthogonal portion which extends at least partially within the plurality of first housing guide holes of the first guide, the orthogonal portion being electrically connected to the at least one conductive portion at respective rims at each of the plurality of first housing guide holes of the first guide.

4. The testing head of claim 1 , wherein the at least one conductive portion entirely covers the face of the first guide.

5. The testing head of claim 4 , wherein the face is an exterior face of the first guide that faces away from the second guide.

6. The testing head of claim 4 , wherein the face is an interior face of the first guide that faces towards the second guide.

7. The testing head of claim 1 , wherein the coating layer is a thin film having a thickness of less than 2 μm.

8. The testing head of claim 1 , wherein the coating layer is made by an insulating material selected from a polymeric or an organic insulating material.

9. The testing head of claim 1 , wherein the coating layer is made by an insulating material that has a high hardness and is selected from a nitride, aluminium oxide, alumina, and diamond-like carbon.

10. The testing head of claim 1 , wherein the conductive portion is only on the one face and the one face is an interior face of the first guide.

11. The testing head of claim 1 , wherein the coating layer covering less than half of each vertical contact probe of the second group extends only along a section of the body of each vertical contact probe of the second group, the section being one to be housed in a corresponding one of the plurality of first housing guide hole of the first guide during a normal working of the testing head.

12. The testing head of claim 1 , wherein the conductive portion is made of a metallic material selected from copper, gold, silver, palladium, rhodium and their alloys.

13. The testing head of claim 1 , wherein the first guide is in proximity to a device under test (DUT) and comprises circuital components electrically connected to the at least one conductive portion.

14. The testing head of claim 13 , wherein the circuital components are filtering elements.

15. The testing head of claim 1 , wherein the coating layer is a thin film having a thickness of less than 2 μm and made by an insulating material selected from a polymeric or an organic insulating material.

16. A testing head comprising:

a plurality of vertical contact probes, each vertical contact probe comprising:

a first end region and a second end region; and

a body which extends between the first end region and the second end region;

a first guide including a plurality of first housing guide holes to house the plurality of vertical contact probes; and

a second guide including a second plurality of guide housing holes to house the plurality of vertical contact probes, and

wherein the first guide comprises at least one conductive portion only on an exterior face of the first guide, the exterior face of the first guide faces away from the second guide,

wherein the at least one conductive portion extends to a respective rim of each of the plurality of first housing guide holes of the first guide, the at least one conductive portion electrically connects and directly contacts an outer metal periphery of vertical contact probes of a first group of the plurality of vertical contact probes at the respective rims of respective ones of the plurality of first housing guide holes of the first guide, the vertical contact probes of the first group sliding in respective ones of the plurality of first housing guide holes realized in the at least one conductive portion and being adapted to carry a same signal,

wherein each vertical contact probes of a second group of the plurality of vertical contact probes is at least partially surrounded by a coating layer made of an insulating material and extending along the body of each vertical contact probe of the second group, the coating layer insulating the vertical contact probes of the second group from the at least one conductive portion at respective rims of the plurality of first housing guide holes of the first guide, the coating layer forming an outer periphery of the vertical contact probes of the second group and sized to fit through respective ones of the plurality of first housing guide holes.

17. The testing head of claim 16 , wherein the at least one conductive portion entirely covers the exterior face of the first guide.

18. The testing head of claim 16 , wherein the coating layer extends along the whole body of each vertical contact probe of the plurality of vertical contact probes of the second group.

19. The testing head of claim 16 , wherein the coating layer extends only in a section of said body of each vertical contact probe of the second group, the section being one to be housed in a corresponding one of the plurality of first housing guide holes or the plurality of second guide holes of the first guide or the second guide during a normal working of the testing head.

20. The testing head of claim 16 , wherein the conductive portion is made of a metallic material selected from copper, gold, silver, palladium, rhodium and their alloys.

21. The testing head of claim 16 , wherein the first guide is in proximity to a device under test (DUT) and comprises circuital components electrically connected to the at least one conductive portion.

22. The testing head of claim 21 , wherein the circuital components are filtering elements.

23. A testing head comprising:

a plurality of vertical contact probes, each vertical contact probe comprising:

a first end region and a second end region; and

a body which extends between the first end region and the second end region; and

a first guide including a plurality of first housing guide holes in which the plurality of vertical contact probes are housed;

a second guide including a plurality of second housing guide holes in which the plurality of vertical contact probes are housed, the second guide is separated from the first guide by an air zone between the first and second guides;

a conductive guide between the first guide and the second guide, the conductive guide including a plurality of third housing guide holes in which the plurality of vertical contact probes are housed; and

wherein the conductive guide electrically connects and directly contacts an outer metal periphery of vertical contact probes of a first group of the plurality of vertical contact probes at respective rims of respective ones of the plurality of third housing guide holes, the vertical contact probes of the first group sliding in respective ones of the plurality of third housing guide holes realized in the conductive guide and being adapted to carry a same signal, and

wherein each vertical contact probe of a second group of the plurality of vertical contact probes is surrounded by a coating layer made of an insulating material and extending along the body of each vertical contact probe of the second group, the coating layer insulating the vertical contact probes of the second group from the conductive guide at respective rims of respective ones of the plurality of third housing guide holes, the coating layer forming an outer periphery of the vertical contact probes of the second group and sized to fit through respective ones of the plurality of third housing guide holes.

24. The device of claim 23 , wherein the coating layer is a thin film having a thickness of less than 2 μm.

25. The device of claim 23 , wherein the coating layer is made of an insulating material selected from a polymeric or an organic insulating material.