IP Library › Granted Patent US 10,964,565
Granted Patent B2
US 10,964,565 · App. 16/557,707 · Granted Mar 30, 2021

Substrate processing apparatus and method

Inventors: Je Hyeok Ryu (Gyeonggi-do, KR); Jae Kyeong Yoo (Gyeonggi-do, KR); Jung-Hyun Kang (Gyeonggi-do, KR)
Assignees: PSK INC.; PSK HOLDINGS INC.
H01L21/67196H01L21/67017H01L21/68707
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Quick Facts
Patent No.
US 10,964,565
App. No.
16/557,707
Granted
Mar 30, 2021
Kind
B2
Abstract

Disclosed is a substrate processing apparatus that includes an interference member for minimizing a collision between a descending flow of gas supplied by a fan unit and a gas flow directed toward a transfer space from the inside of a container.

Claims (76)

1. An apparatus for processing a substrate, the apparatus comprising:

an index module; and

a process module configured to process the substrate,

wherein the index module includes:

a load port on which a container having the substrate received therein is placed; and

a transfer frame disposed between the load port and the process module, the transfer frame having a transfer space therein,

wherein the transfer frame includes:

a fan unit provided above the transfer space and configured to supply a descending flow of gas into the transfer space;

a transfer robot disposed in the transfer space and configured to transfer the substrate between the container placed on the load port and the process module; and

an interference member configured to minimize a collision between the descending gas flow and a gas flow directed toward the transfer space from the inside of the container,

wherein the transfer frame has an opening formed therein, through which the substrate is transferred between the container and the transfer frame,

wherein the interference member includes an upper interference member installed at an upper end of the opening so as to be adjacent to the opening, and

wherein the upper interference member is upwardly inclined in a direction away from the opening.

2. The apparatus of claim 1 , wherein the upper interference member is provided in a mesh form.

3. The apparatus of claim 1 , wherein the interference member further includes a lower interference member installed at a lower end of the opening so as to be adjacent to the opening.

4. The apparatus of claim 3 , wherein the lower interference member is provided in a mesh form.

5. The apparatus of claim 3 , wherein the lower interference member is downwardly inclined in a direction away from the opening.

6. The apparatus of claim 1 , wherein the fan unit includes:

a housing having an inner space; and

a fan disposed in the inner space and configured to cause the gas to flow into or out of the inner space, and

wherein the transfer frame further includes a circulation duct configured to circulate the gas in the transfer space into the inner space.

7. The apparatus of claim 6 , wherein the transfer frame has a rectangular parallelepiped shape, and

wherein a plurality of circulation ducts are installed in corners of the transfer frame when viewed from above.

8. The apparatus of claim 7 , wherein the transfer frame further includes:

a plurality of panels;

a coupling frame configured to combine the plurality of panels; and

gaskets provided between the panels and the coupling frame, and

wherein the transfer frame has the transfer space formed by combining the plurality of panels together.

9. The apparatus of claim 8 , wherein the gaskets are rubber gaskets or liquid gaskets.

10. The apparatus of claim 6 , wherein a circulation fan is installed in the circulation duct to cause the gas to flow into or out of the circulation duct.

11. The apparatus of claim 1 , further comprising:

an actuator configured to drive the transfer robot,

wherein the transfer frame further includes a base configured to isolate a space in which the actuator is provided from the transfer space.

12. The apparatus of claim 1 , wherein the index module further includes a gas supply member configured to supply the gas into the transfer space, and

wherein the gas supply member includes:

a first gas supply line configured to supply the gas into an inner space of a housing that the fan unit includes; and

a second gas supply line configured to directly supply the gas into the transfer space.

13. The apparatus of claim 12 , wherein the apparatus further comprises a controller configured to control the gas supply member, and

wherein the controller controls the gas supply member to:

supply the gas from the first gas supply line to the fan unit for a period of transfer during which the substrate is transferred; and

supply the gas through the second gas supply line or through the first gas supply line and the second gas supply line for a period of charging prior to the period of transfer.

14. The apparatus of claim 13 , wherein the index module further includes a load lock chamber disposed between the transfer frame and the process module,

wherein the gas supply member further includes a third gas supply line connected to the load lock chamber and configured to supply gas into the load lock chamber, and

wherein the controller additionally controls the load lock chamber and, for the period of charging, controls the load lock chamber and the third gas supply line to open a door configured to open or close an entrance through which the substrate is transferred between the load lock chamber and the transfer frame and cause the gas supplied into the load lock chamber from the third gas supply line to flow into the transfer space.

15. A method for processing a substrate by using the substrate processing apparatus of claim 12 , the method comprising:

supplying the gas from the first gas supply line to the fan unit for a period of transfer during which the substrate is transferred; and

supplying the gas through the second gas supply line or through the first gas supply line and the second gas supply line for a period of charging prior to the period of transfer.

16. An apparatus for processing a substrate, the apparatus comprising:

an index module; and

a process module configured to process the substrate,

wherein the index module includes:

a load port on which a container having the substrate received therein is placed;

a transfer frame disposed between the load port and the process module, the transfer frame having a transfer space therein;

an exhaust unit configured to discharge the gas in the transfer space to the outside; and

a controller configured to control a fan unit and the exhaust unit,

wherein the transfer frame includes:

the fan unit provided above the transfer space and configured to supply a descending flow of gas into the transfer space, wherein the controller controls the fan unit and the exhaust unit to maintain a pressure difference of 50 Pa to 1000 Pa between the transfer space and the outside of the index module;

a transfer robot disposed in the transfer space and configured to transfer the substrate between the container placed on the load port and the process module; and

an interference member configured to minimize a collision between the descending gas flow and a gas flow directed toward the transfer space from the inside of the container,

wherein the transfer frame has an opening formed therein, through which the substrate is transferred between the container and the transfer frame,

wherein the interference member includes an upper interference member installed at an upper end of the opening so as to be adjacent to the opening.

17. An apparatus for processing a substrate, the apparatus comprising:

an index module; and

a process module configured to process the substrate,

wherein the index module includes:

a load port on which a container having the substrate received therein is placed; and

a transfer frame disposed between the load port and the process module, the transfer frame having a transfer space therein,

wherein the transfer frame includes:

a fan unit provided above the transfer space and configured to supply a descending flow of gas into the transfer space;

a transfer robot disposed in the transfer space and configured to transfer the substrate between the container placed on the load port and the process module; and

at least one interference member configured to minimize a collision between the descending gas flow and a gas flow directed toward the transfer space from the inside of the container,

wherein the transfer frame has an opening formed therein, through which the substrate is transferred between the container and the transfer frame,

wherein the at least one interference member includes a mesh form installed adjacent to the opening, and

wherein the at least one interference member is at least one of:

installed at an upper end of the opening so as to be adjacent to the opening and upwardly inclined in a direction away from the opening, and

installed at a lower end of the opening so as to be adjacent to the opening.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 26, 2019
From: RYU, JE HYEOK; YOO, JAE KYEONG; KANG, JUNG-HYUN
To: PSK INC.; PSK HOLDINGS INC.
Reel/Frame 051120/0203 →
Priority Claims (1)
KR 10-2019-0000254 · Jan 2, 2019 · national
Continuity (1)
Related Publication 20200211871A1 · Jul 2, 2020