Dielectric fins with different dielectric constants and sizes in different regions of a semiconductor device

1. A semiconductor device, comprising:

a first epi-layer and a second epi-layer that are each located over a substrate, wherein the first epi-layer and the second epi-layer are located in a memory device region of the semiconductor device, the memory device region including a plurality of Static Random Access Memory (SRAM) cells;

a first dielectric fin located over the substrate and between the first epi-layer and the second epi-layer, wherein the first dielectric fin has a first dielectric constant;

a third epi-layer and a fourth epi-layer that are each located over the substrate, wherein the third epi-layer and the fourth epi-layer are located in a non-memory device region of the semiconductor device, the non-memory device region including input/output devices; and

a second dielectric fin located over the substrate and between the third epi-layer and the fourth epi-layer, wherein the second dielectric fin has a second dielectric constant that is less than the first dielectric constant.

2. The semiconductor device of claim 1 , wherein:

the first dielectric fin has a first height;

the second dielectric fin has a second height; and

the first height is greater than the second height.

3. The semiconductor device of claim 2 , wherein:

the first epi-layer or the second epi-layer has a third height; and

the third height is greater than or equal to the first height.

4. The semiconductor device of claim 1 , wherein:

an upper surface of the first dielectric fin is disposed above an outermost lateral protrusion of the first epi-layer and the second epi-layer; and

an upper surface of the second dielectric fin is disposed below an outermost lateral protrusion of the third epi-layer and the fourth epi-layer.

5. The semiconductor device of claim 1 , wherein the second dielectric fin includes a greater number of dielectric materials than the first dielectric fin.

6. The semiconductor device of claim 5 , wherein:

the first dielectric fin is comprised of a first type of dielectric material having a first dielectric constant;

the second dielectric fin is comprised of a second type of dielectric material having a second dielectric constant and a third type of dielectric material having a third dielectric constant;

the first dielectric constant is greater than the second dielectric constant; and

the second dielectric constant is greater than the third dielectric constant.

7. The semiconductor device of claim 6 , wherein the third type of dielectric material is located over the second type of dielectric material in the second dielectric fin.

8. The semiconductor device of claim 6 , wherein:

the first dielectric constant is greater than about 10;

the second dielectric constant is less than about 10 but greater than about 4; and

the third dielectric constant is less than about 5.

9. The semiconductor device of claim 1 , the second dielectric fin is at least twice as wide as the first dielectric fin.

10. The semiconductor device of claim 1 , wherein: the third epi-layer is an epi-layer located closest to the fourth epi-layer on a first side of the fourth epi-layer, and wherein the fourth epi-layer is an epi-layer located closest to the third epi-layer on a second side of the third epi-layer, wherein the first side and the second side face toward each other.

11. The semiconductor device of claim 1 , wherein:

the memory device region has a first pattern density;

the non-memory device region has a second pattern density; and

the first pattern density is greater than the second pattern density.

12. The semiconductor device of claim 11 , wherein the first pattern density is at least twice as great as the second pattern density.

13. A semiconductor device, comprising:

a first source/drain and a second source/drain disposed over a substrate and in a memory device region of the semiconductor device, wherein the memory device region includes a plurality of Static Random Access Memory (SRAM) cells;

a high-k fin structure disposed over the substrate and between the first source/drain and the second source/drain;

a third source/drain and a fourth source/drain disposed over the substrate and in a logic device region of the semiconductor device, wherein the logic device region includes a plurality of input/output devices; and

a hybrid fin structure disposed over the substrate and between the third source/drain and the fourth source/drain;

wherein:

the first source/drain and the second source/drain are spaced apart by a first distance;

the third source/drain and the fourth source/drain are spaced apart by a second distance greater than the first distance;

no other source/drains are disposed between the third source/drain and the fourth source/drain;

the high-k fin structure has a greater dielectric constant than the hybrid fin structure;

an upper surface of the high-k fin structure is disposed above an upper surface of the hybrid fin structure; and

the hybrid fin structure comprises multiple types of different dielectric materials.

14. The semiconductor device of claim 13 , wherein:

the upper surface of the high-k fin structure is disposed above an outermost lateral protrusion of the first source/drain and the second source/drain; and

the upper surface of the hybrid fin structure is disposed below an outermost lateral protrusion of the third source/drain and the fourth source/drain.

15. A semiconductor device, comprising:

a first source/drain component and a second source/drain component that protrude vertically upwards out of a substrate, wherein the first source/drain component and the second source/drain component are each located in a first region of the semiconductor device, wherein the first region includes a plurality of Static Random Access Memory (SRAM) cells;

a first dielectric fin located over the substrate and between the first source/drain component and the second source/drain component, wherein the first dielectric fin has a first uppermost surface;

a third source/drain component and a fourth source/drain component that protrude vertically upwards out of the substrate, wherein the third source/drain component and the fourth source/drain component are each located in a second region of the semiconductor device, wherein the first region has a greater pattern density than the second region, and wherein the second region includes a plurality of input/output devices; and

a second dielectric fin located between the third source/drain component and the fourth source/drain component, wherein the second dielectric fin has a second uppermost surface that is less vertically elevated than the first uppermost surface.

16. The semiconductor device of claim 15 , wherein the first dielectric fin has a greater dielectric constant than the second dielectric fin.

17. The semiconductor device of claim 15 , wherein:

the first source/drain component or the second source/drain component has a third uppermost surface; and

the third uppermost surface is greater than or equal to the first uppermost surface.

18. The semiconductor device of claim 15 , wherein:

the first dielectric fin consists of a single type of dielectric material; and

the second dielectric fin includes multiple different types of dielectric materials.

19. The semiconductor device of claim 15 , wherein:

the first source/drain component and the second source/drain component are separated by a first distance;

the third source/drain component and the fourth source/drain component are separated by a second distance greater than the first distance;

the first dielectric fin has a first width; and

the second dielectric fin has a second width greater than the first width.

20. The semiconductor device of claim 15 , wherein:

the first source/drain component or the second source/drain component has a first outermost lateral protrusion;

the third source/drain component or the fourth source/drain component has a second outermost lateral protrusion;

an upper surface of the first dielectric fin is taller than the first outermost lateral protrusion; and

an upper surface of the second dielectric fin is shorter than the second outermost lateral protrusion.